CV
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DC Electronic Load
3310G Series（75W~400W）
Each 3310G Series module has its own control and display panel, CC / CR / CV / CP / Dynamic modes, plug in 3302G / 3305G / 3300G mainframe with 150 sets Store / Recall memory which provides load set-up more efficiently, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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QS603 60V/3A Power Supply
*16 hours at full load*Low ripple and noise*Automatic switching CV / CC*Aluminum heat sink*Displays 3 or 4 digit depending on the model
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Electronic Loads
Flexible electronic DC loads for general purpose applications. Voltage up to 80V, current up to 80A and power up to 600 watts. CI, CR, CG, CV and CP modes, built-in transient generators. Models with USB, RS232, GPIB and LXI compliant LAN interfaces.
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PathWave IC-CAP BSIM3 Model Extraction Package
W7024E
The W8553EP IC-CAP BSIM3 Model Extraction Package provides complete measurement and extraction procedures for DC, CV and RF model parameters. The intuitive, Windows-style user interface enables engineers to quickly produce an accurate model.
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HEV & EV Power Tester
EVd-40
The EVd-40 Power Tester is a pre- and post-reconditioning tool for quality control of aftermarket HEV & EV battery production. The equipment integrates a “smart” charger (Sorensen XG 1700 or Kepco KLN 1500W) with NuVant Systems high power discharge electronics. The "power test" discharges battery packs at high power (10,000 watts), while tracking module voltages. The software monitors up to 40 module voltages at a time, identifying any weak modules. The "smart" charger performs charging constant current (CC), constant voltage (CV) and complex mixed mode constant current – constant voltage (CCCV) charging protocols at voltages up to 600 V. This enables recharge of any type of rechargeable battery.
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Software
Production C-V Measurement
Materials Development Corporation
The production software offers a streamlined C-V plotting and bias-temperature stress program with minimumoperator input. A single keystroke begins the measurement.
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Semiconductor Switching Systems
Keithley 700 Series
The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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High Power DC Electronic Load（1250V）
34300E Series（5KW~40KW）
34300E Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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High Speed-Large Current DC Electronic Load (CC/CV/CR/CP)
PLZ-4WL Series
While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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Software
Junction Measurement and Analysis
Materials Development Corporation
A comprehensive set of analyses for junction diode or Schottky barriers begins with C-V data gathering that adjusts the voltage step to the slope of the C-V characteristics. This assures an optimum set of C-Vdata whether the voltage range is small or large. Doping profile and resistivity profile are both available at the touch of a key. Plots of 1/C2 - V or Log(C) - Log (V+ phi) show doping uniformity and doping slope factor. Exclusive recalculation options allow adjustment of stray capacitance and area to facilitate calibration using a standard reference wafer of known doping or resistivity.
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Programable Power Supply & Programable Electronic Load
EL-820P
*Digital button control and easy operation*High resolution(20mV, 10mA, 0.1W, 0.1Ω)*Overload prevention function*9 sets programmable memory*4 sets real time display*Voltage range: 1V~63V*Current range: 10mA~15A*Maximum power: 200W*Operation mode: CV, CC, CP and CR*Built in USB interface
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Battery Pack/Module Test Solution
Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current Constant voltage Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration
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Cryogenic Probe Station
CPX-VF
The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it to perform Hall effect measurements and test magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.
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Programable DC Power Supply
ADG-L Series
14 models and three different output power, 4kW, 8 kW and 12 kW. Utilizing PWM technology, ADG-L delivers stable output and precise measurement. With CV, CC and CP mode, ADG-L series is ideal for Photovoltaic, Electric Vehicle, battery, fuse/capacitor and third party laboratory testing.
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Cryogenic Probe Station
EMPX-HF
The Lake Shore EMPX-H2 probe station enhances standard probe station capabilities with the addition of a ±0.6 T horizontal field electromagnet. All standard C-V, I-V, microwave, and electro-optical probing, plus in-plane horizontal field electromagnetic measurements can be performed on this versatile station. Researchers can use it for testing magneto-transport parameters. The EMPX‑H2 is Lake Shore’s premier probe station for vector-dependent magneto-transport measurements.
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Power Supplier QS305 30V / 5A
*16 hours at full load*Low ripple and noise*Automatic switching CV / CC*Aluminum heat sink*Displays 3 or 4 digit depending on the model
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High Performance High Power DC Electronic Load
IT8900 Series
IT8900 series of high performance high power dc electronic loads provide three voltage ranges 150V/600V/1200V. The power expands to 600kW by master-slave paralleling, and maintains stand-alone functions. 50kHz high speed measurement, six working modes, transient over-power loading capability, CV loop speed adjustment, Measurement function, 25kHz dynamic test and other multiple accurate testing functions make IT8900 series well-suited for types of high power applications.
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Mini Digital Clamp Tester (CE)
M-140HC
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Easy!:Measurale Load Current at high voltage CV/CVT cables with grounding lines for shield phase.*Epoch-Making!:Can measure phase current of CVT cable just by putting CT head on to the conductors as well as CV cable just by clamping CT to the conductors in a lump.*Low Cost!:Can measure line/leakage current in the same manner as ordinary clamp meters.
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Copper Diffusion TestSystems
Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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Controllable, Programmable Linear DC Source
LAB / S
*Linear laboratory power supply*High quality DC sources with the lowest residual ripple*CV / CC mode with LED display*Protection against short circuit, overload and overtemperature*Optional IEEE 488, RS232, analog interfaces*3-phase input optional
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LED Load Simulator
63110A/ 63113A/63115A
As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.
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C-V Plotters
Materials Development Corporation
MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.
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DC Electronic Load
3110 Series（250W~700W）
Each 3110 Series stand-alone load has its own control and display panel, CC / CR / CV / CP/ Dynamic modes, also can be controlled intranet via RS232 and USB interface.
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Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Vacuum Chambers
CV 400/CV 250
The CV 250 and CV 400 are vacuum chambers for altitude flight simulation for avionics instruments such as altimeters, rate of climb indicators and all non pressurised equipment. They are fitted with pneumatic and electric connectors and a quick locking door.
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High Power DC Electronic Load
3350G Series（4KW~6KW）
Each 3350G Series module has its own control and display panel, CC / CR / CV / CP /Dynamic modes, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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Single Channel Linear DC Power Supply
MPS-D+ series
Voltage stabilitySource effect CV≤0.01%+2mVLoad effect CV≤0.01%+2mVRipple and noise CV≤1mV(rms）CC≤5mA(rms）Voltage temperature coefficient 150ppm/°CCurrent stabilitySource effect CC≤0.2%+2mALoad effect CC≤0.2%+5mACurrent temperature coefficient 500ppm/°C
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High Power DC Electronic Load
36000A Series（50KW / 60KW）
36000A Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
