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Electromagnetic Force Fatigue And Endurance Testing System
EMT Series
High-speed repeated load tests can be carried out with a maximum velocity of 2 m/s, and maximum stroke of ±50 mm, using clean and quiet electromagnetic force as the driving power, without the use of oil. The test space is large so environmental tests can also be carried out using the constant temperature tank (option).
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Test Switches
Series FT
An industry standard for CT & VT isolationfor instrument transformer and connected device testing.Up to 10 poles; Numerous configurations availableTypically mounted on switchgear and relay panels10 pole test plug available; UL and cUL recognized.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Bus Differential System
B90
The B90 Bus Differential System provides fast and secure low impedance bus protection for reconfigurable LV, HV, and EHV busbars. Use one B90 to protect up to 8 feeders and use three or more B90s together in a centralized phase segregated architecture to protect up to 24 feeders.
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Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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Tracking Systems
Portable wand based systems are utilized to walk a pipeline to precisely locate a stuck pig. These systems allow for visual and audible indication of pig location.
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Lamp Cap Temperature Rise Test System
TMP-L
TMP-L is according to IEC60360-1998 and GB2512-2001 (Standard method of measurement of lamp cap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards.
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HPLC/UHPLC/SFC Systems
Nexera series
Shimadzu has long been advancing the analytical performance of HPLC systems. At the same time, we recognize that overall efficiency depends not only on the performance of one instrument, but on the management of all devices within a lab. This realization leads us to now, a time in which AI capabilities have been incorporated to allow devices to detect and resolve issues automatically. In addition, lab management has been integrated using the Internet of Things (IoT) and device networking, making it simple to review the status of instruments and optimize resource allocation.
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PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Testing Services
We are professionals who deliver software testing services. We are able to boost your software testing, increase product quality and reduce costs.
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Passenger Occupant Detection Systems (PODS) Testing
As an industry-leading partner, Trialon provides the expertise, experience, and equipment to conduct Passenger Occupant Detection System (PODS) testing for OEMS and Tier Suppliers in the Automotive Industry.
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Hi-Pot Testing
The CableEye HVX System combines our M3U tester with a high voltage module to provide Hi-Pot testing of insulation resistance and dielectric breakdown up to 1500Vdc and 1000Vac.
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Test Cells
Our test cells are built using a modular system. This means that the usable space size and shape can be specifically adapted to the required conditions.
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Test Block & Plug Systems
Test Block system is an evolution of the 14 test circuit versions widely employed in the power utility sector. The primary difference is the incorporation of ‘finger safe’ test sockets which allow the use of shrouded 4mm banana plugs.
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Scienlab Battery Test System – Pack Level
SL1700A Series
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increase the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 90 and 270 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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5G Carrier Acceptance Test System
NetOp
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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ATE System Power Supplies
N5700 Series
The Keysight N5700 Series delivers low noise power in a compact 1U package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. Select output voltages from 6 to 600 V. For low current applications, the 750 W models provide 1.3 to 100 A. For higher current needs the 1500 W models provide twice as much current.
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Switching System Test Tools
EBIRST™
Switching systems are an important part of many test systems, however, the switching system is in a vulnerable place. When accidents happen that can cause a faulty device, you need a way to get the system up and running again with a minimum of effort and operator skills.
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ATE System Power Supplies
For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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Motor Stator Test System
Chroma 1920
Chroma Systems Solutions, Inc.
For electrical safety and quality testing functions of motor stator coils
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Directed Energy Systems
Honeywell Aerospace Technologies
Reliable and Innovative Technology for Directed Energy Systems
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Integrated Bonding Systems
EVG offers fully integrated and highly automated production systems for wafer bonding processes. A maximum level of automation and process integration opens the door to large-scale manufacturing and guarantees a proven transition of processes from R&D stage to production.
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Terminal Blocks with System
The Phoenix Contact terminal blocks enable a high degree of flexibility in terminal strip design. Choose between various connection technologies and combine the terminal blocks by installing bridges in the double function shaft. The terminal block system features standardized bridging, marking, and test accessories.
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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12/24 CH Insertion Loss/Return Loss Automatic Testing System
CA3201
UC INSTRUMENTS CA3201 12/24 CH INSERTION LOSS/RETURN LOSS AUTOMATIC TESTING SYSTEM is special designed for MPO/MTP fiber cable and multi-channel fiber optical devices like PLC device. It also can be easy changed into AWG DWDM devices testing system ifwe change 1310 /1550 nm light source into UC INSTRUMENTS’ tunable laser source.
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Testing Services Test
Aero Nav Laboratories is uniquely positioned to provide testing services that promote safe and reliable products, which are in compliance with the government and industry standards.
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Hardware-in-the-Loop Test Systems
HIL
Our early development efforts and NI VeriStand expertise uniquely qualify us to maximize the benefits of and provide top-notch integration services for this software platform. Wineman Technology offers powerful and flexible MIL and HIL testing solutions, such as: Full range of MIL and HIL test systems. Software for testing. Software for simulating electronic control modules. Fault insertion unit (FIU)..
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Survey Systems
Pair the Smart Chamber with a gas analyzer of your choosing and connect using your mobile device or laptop via the built-in Wi-Fi web server. See live flux data with a LI-COR gas analyzer or connect to a third-party analyzer and the chamber will log GPS and ancillary data for your flux measurements.
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Environmental Testing
Environmental Testing is the evaluation of a product in conditions which simulate the physical environments that may harm or adversely affect the products performance. Environmental testing can play an important role throughout a product's development cycle to ensure that the materials and manufacturing processes can survive the stresses of the environment in which the product is likely to operate. These environments may include high and low temperatures as well as quickly changing temperatures. Also, temperature humidity environments may also be a factor. Environments with an added media such as dust, ice and freezing rain may also have an adverse effect on products. Listed below are some of Global Testing Services Environmental Testing capabilities
