Wafer Resistivity
See Also: Wafer, Wafer Thickness, Wafer Failure Analysis, Wafer Edge, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Digital Earth Resistance Tester
8PK-ST1520
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Capable of measuring earth voltage (Vac.) 2mA measuring current permits earth resistance to test without tripping earth leakage current breakers in the circuit. Battery operated. Auto power off function. Data hold function. Small and light weight.
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Product
Solar Wafer Transfer Tool
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Solar Wafer Transfer Tool
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Product
Transformer Winding Resistance Meters
TWA Advanced Series
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The TWA advanced series instruments are designed for six-winding resistance measurement and simultaneous three phase on-load tap changer analysis of both the primary and the secondary transformer windings. This is performed with a one singlestep cable setup, with test currents of up to 40A. Each transformer configuration has a special measurement algorithm which is optimized for the fast stabilization of test results. The TWA instruments generate a true DC ripple-free current. Both the injection of the current and the discharge of energy from the magnetic circuit are automatically regulated.
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Product
Resistivity and IP Imaging System
ARES
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ARES represents a well equipped resistivity and IP imaging system. Groundwater explorations, geotechnical investigations, monitoring of dams and dikes, environmental studies, pollution plumes mapping, geological surveys, mineral prospecting, archaeology, detecting of cavities, underwater, marine, borehole and cross-hole measurements.
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Product
Earth Resistance Testers
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Earth Resistance Tester is widely applied in ground resistance measurement, loop resistance measurement in fields such as electric power, telecommunications, meteorology, oil field, architecture and industrial electrical equipment, etc. When measuring ground system with loop, there is no need to disconnect the ground wire without auxiliary electrode, which means safer and faster.
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Product
Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Product
Temperature Stabilized Resistance Standards
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Measurements International Ltd.
The temperature stabilized resistance standards offer customers the very best in accuracy, and stability. With 3 different models to choose from, covering the full range of resistance values.
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Product
Insulation Resistance Tester
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Aarohi Embedded Systems Pvt. Ltd
Aarohi make device enable us to measure electrical leakage in wire, results are very reliable as we shall be passing electric current through device while we are testing. The equipment basically uses for verifying the electrical insulation level of any device such as motors, cables, generators, windings, etc.
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Product
Loading Rheostats (Resistive Load)
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Supreme Instrument Laboratories
Loading Rheostat is a device specially designed to meet the requirements of Engineering Laboratories, Electrical Test Rooms and Industries. It is used for loading transformers, power generators, supply mains etc. neatly and efficiently. It can also be used advantageously for regulating current and adjusting voltage besides its application for calibrating meters and thus eliminating the need for graded rheostats.
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Product
Earth Resistance & Resistivity Meter
MRU-200
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MRU-200 is the only meter in the market which uses all measurement methods.Possible measurements:- earth resistance measurment with 2-pole, 3-pole,4-pole method,- impulse earth resistance measurement, two kinds of measuring impulse 4/10s, 10/350s,- earth resistance measurement without disconnecting measured earths (using clamp),
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Product
Contactless One-Point Wafer Thickness Gauge
MX 30x
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The MX30x series are manual one-point Thickness gauges for silicon wafers.
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Product
Earth Contact Resistance Tester
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SCR ELEKTRONIKS have developed an equipment namely Earth Contact Resistance Tester to test the appliance. To ensure the safety of operator it is essential that the Earth path (connection) should offer minimum impedance to by pass short circuit Current to Earth. This is ensured by measuring Resistance of the Earth path by passing heavy Current say 25 A. The Earth Contact Resistance Tester essentially comprises of a Variable Current source with digital Ammeter to measure the Current supplied. The Voltage drop across the Earth path is measured with a digital Voltmeter. Optionally for a particular Current (25 A) the meter can be calibrated in terms of Resistance. A timer is provided to switch off the Current after the Set Time.
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Product
DUT Resistance Tester
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AllWin Instrument Science and Technology Co., Ltd.
1. This test verfies the integrity of DUT2. The resistance is measured by measuring voltage3. Current is made by distribution
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Transformer Winding Resistance Meters
RMO TW Series
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The RMO-TW instrument can perform a simple, fast and reliable verification of a transformer on-load tap changer. This instrument allows measurements of a winding resistance at each tapping position of an on-load tap changer without discharging between tests. Problems with OLTC switching, such as interruption, can be detected with these measurements. The results are displayed on a backlit LCD screen.
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Product
Winding Resistance Tester
JYR20S/10S
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DC winding resistance testing is regarded as another essential routine screening tool. It indicates problems such as loose, defective or incorrect connections, which cause enough transformer failures each year to be regarded as a failure category of its own.
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Product
Insulation Resistance Measurement
MD 5060x
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The Megabras MD-5060x is a smart, microprocessor-controlled, 5kV insulation tester and analyzer. Besides the conventional measurement of insulation resistances up to 5 TW, its advanced features allow to automatically measure both the Polarization Index and Dielectric Absorption Index, thus significantly simplifying testing of transformers.
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Product
LED Type Wafer Alignment Sensor Controller
HD-T1
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Panasonic Industrial Devices Sales Company of America
The HD-T1 Series is a new Wafer Alignment Sensor that uses a safe red LED light beam, with a resolution of 30µm, to achieve the same high level performance as Laser Sensors. The HD-T1 Sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image Sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style Sensor is developed for use in almost all fields of industry, e.g. tire manufacturing or Semiconductor production (Wafer Printed Circuit Boards).
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Product
Resistance Calibration
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Process Instruments maintains fractional part-per-million accuracy with a state of the art resistance calibration facility. Specialized services include precision resistor manufacture, resistor and shunt repair, characterization of alpha and beta temperature coefficients and the determination of barometric effects on resistance values.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
Resistance Meter
MT16-4L
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М-module МТ16-4Л is a mezzanine module (hereinafter referred to as a mezzanine), designed to measure the resistance of resistive sensors using a four-wire measurement circuit in sixteen channels (sixteen-channel digitizer). М-module МТ16-4Л is installed on the mezzanine carrier - module НМ-М and is connected to it via a local information highway. Up to four mezzanines of various types can be installed on the NM-M module. The NM-M module, together with the mezzanines installed on it, forms a VXI module of the C-1 size and is used to create information measuring VXI systems.
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Product
Battery Resistance Tester
BT-3915
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Kongter Test & Measurement Co., Limited
Regular test of battery internal resistance or battery conductance is essential for stationary batteries. It is also recommended by latest regulation of IEEE 450, IEEE 1188 and IEEE 1106. The excellent performance of BT-3915 for testing battery internal resistance and voltage will help you pick out the weak batteries and ensure their performance in short time measurement.
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Product
DC Resistance Tester
GDZRS-20A
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GDZRS series Winding DC resistance tester is optimal designed for measuring three phase winding DC resistance of big capacity transformer. It can test three phase winding DC resistances at the same time
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Product
Wafer Test
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Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Shoe Heat Resistance Tester
UI-FT28
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Shoe Heat Resistance Tester is to test shoe outsole and upper hot contact resistance ability especially for safety shoe. Heat Resistance Test Method includes ISO 20344, SATRA TM49, EN 344 and etc.
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Product
Large Range Resistivity Tester
HS-SFRT
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HS-SFRT silicon filament resistivity tester is an advanced silicon cylinder resistivity tester, which can measure silicon filament, silicon phosphorus ingot, silicon boron ingot, seed crystal and so on. As it eliminates Peltier effect, Seebeck effect, minority carrier inject effect and so on, So it improve the accuracy greatly. The testing resistivity ranges from 0.0005Ω·cm to 50000Ω·cm. It is accurate, stable and convenient and a good friend to Siemens polysilicon material producer, SH4 polysilicon material producer, UMG polysilicon material producer and so on.
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Product
High Resistance Neutral Grounding Devices
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HRG systems limit the fault current by placing high resistance between neutral point of transformer (or generator) and ground. As it is not possible to locate the fault point in delta connected systems, an artificial neutral point is created and delta connected system can be grounded. This allows a fault current of a few amperes thus locating the fault point gets easy. When the neutral point is grounded thru high resistance, both continuity of operation is provided during fault condition and sufficient current (typically between 2 A and 10 A) flow is provided for ease of locating the fault point.
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Product
Wafer Inspection Products
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Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
