Wafer Resistivity
See Also: Wafer, Wafer Thickness, Wafer Failure Analysis, Wafer Edge, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Product
Resistance Decade Box
HARS Series
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The HARS Series is the best choice when you need a laboratory grade, tight tolerance, high performance resistance decade box that is also cost effective.
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
Wafer Back Side Cooling System
GR-300 Series
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The GR-300 Series can control gases used to cool the back side of wafers that are fixed in position by an electrostatic chuck system.The stability and accuracy of the GR-300 makes it ideal for controlling the flow of Helium and Argon in wafer cooling systems.
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Product
Inline Wafer Testing
IL-800
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
Ground Resistance Testers
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IP67 protected top in the industry Test all ground types from Class A to Class D with a single meter Wide 0 to 2000 measurement range Minimize cabling time with innovative earthing rods and cable winder
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Product
Air Based Resistance
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Air Based Resistance Standards are designed for high accuracy resistance calibration in air.
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Product
Wafer Inspection Machine
IV-W2000
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The IV-W2000 is a wafer inspection machine that features on-the-fly scanning and inspection as well as automatic handling of 6/8/12-inch wafers. With the option to have a Chinese language UI, this machine is also known for being intuitive and user-friendly.
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Product
Electronic Store Of Resistances
PS8
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The module is intended for use as part of information measuring systems based on the VXI bus for software setting of resistance values with a given step along three independent channels.
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Product
Ground Resistance Tester
2521
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Shenzhen Chuangxin Instruments Co., Ltd.
High measuring accuracy, high speed, easy to use, especially suitable for using in laboratory and automatic testing line. Test current AC / 5 ~ 30 (a), resistance Ω (0 ~ 600 m), time (1 ~ 99 s) shows at the same time. Test time can be arbitrary setted. Test alarm value can be arbitrary set up. Pass/fail sound and light alarm.
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Product
Contact Resistance Meter
CRM 200B+
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CRM directly measures micro-ohm values at 200A DC under live EHV switchyard conditions quickly & accurately. It is specially designed to reliably measure micro-ohm contact resistances of Circuit Breakers, Isolators, Busbar joints, earth switch joints, welded joints etc., under the hostile electrostatic noise found in live EHV switchyards up-to 765 kV. SCOPE’s ability to make electronics work in such environment enables CRM to measure mili-volts signal in the presence of kilo-volts noise.
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Product
2-Channel Resistivity Meter
HE-960RW-GC(W)
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The HE-960RW-GC(W) is a 2-channel simultaneous-measurement carbon sensor, resistivity meter that can be connected with two sensors. The measurement range is: 0 - 100.0 MΩ・cm.The high performance and high precision is maintained while simultaneously measuring the output of the resistivity of different two locations. This is carried out in a single converter for overall cost efficient performance.
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Product
Resistance Measurement
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Precision resistance measurement equipment for a range of applications. Specialist units measure down to fractions of a micro-ohm with high accuracy.
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Product
Ultrasonic Wafer Scanner
AutoWafer
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Installed in more wafer applications than all other automatic ultrasonic testing tools combined, AutoWafer provides a complete, production-ready wafer scanner for wafers from 100mm to 200mm, including multiple sizes in a single batch.
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Product
Earth Resistance & Resistivity Meter (for 50Hz mains)
MRU-120
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* earth resistance measurment with 3-pole,4-pole method, * earth resistance measurement without disconnecting measured earths (using clamp), * continuity of equipotential bondings and protecting conductors * two clamps earth resistance measurement without auxiliary test probs, * earth resistivity measurement,
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Product
Contact Resistance Tester
JYL
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As a high current passes through a pair of mechanically independent metallic contacts, the contact resistance must be as low as possible. Increasing the contact resistance of the contact often causes a large voltage drop on the contact, which reduces the input power of the load equipment. If the contact resistance of one or two contacts becomes large, the three-phase voltage of the load equipment will be unbalanced, causing phase loss operation.
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Product
Insulation Resistance Tester
UDH-50-1-T
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UDEYRAJ ELECTRICALS PRIVATE LIMITED
utomatic-microcontroller operated• Standard test voltages-0.5kV, 1kV, 2.5kV, 5kV • Resistance range to 1TΩ • Continuous digital display on LCM• Test modes: Insulation resistance,PI (Polarization Index)AR (Dielectric Absorption Ratio)(PI and AR automatically calculated)
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Product
Ground Resistivity and EarthService Tester
AD-510
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Large, readable LCD display (2000 counts), Instant battery life indicator, Test frequency: 128 Hz (quartz generator), Test Voltage: max 30 V peak-to-peak, Range: 0,01 W ? 2 k W. Accuracy resistance measurement: 1 % 2 digits,
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Product
Battery Resistance Tester
FBR-6100NT
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Fuzhou Fuguang Electronics Co., Ltd.
FBR-6100NT Battery Resistance Tester is a new generation handheld battery tester of FUGUANG™, which can quickly,intuitively and conveniently judge the deterioration of batteries (lead-acid batteries, lithium iron phosphate batteries and nickel-cadmium batteries, etc.). It has the characteristics of high accuracy, repeat consistency and anti-interference. It is an ideal tool for rapid battery daily check.
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Product
Insulation Resistance Meter
AMIC-15k1
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The partial discharge indicator PDI. Diagnosis of insulation systems based on standard measurements of IR, DAR, PI, SV, RT, DD. Allows to test the electrical durability of the tested object - indication of breaking voltage. The high resistance to electromagnetic interference ensures uninterrupted operation in power plants and near high-voltage transmission lines up to 1200 kV AC and 500 kV DC.
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Product
Electrical Resistance (ER) Monitoring
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The electrical resistance (ER) technique is an "on-line" method of monitoring the rate of corrosion and the extent of total metal loss for any metallic equipment or structure. The ER technique measures the effects of both the electrochemical and the mechanical components of corrosion such as erosion or cavitation. It is the only on-line, instrumented technique applicable to virtually all types of corrosive environments.
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Product
Moisture Resistance/ Humidity Test
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This test is performed for evaluating the resistance of component parts and constituent materials to the deteriorative effects of the high-humidity and heat conditions typical of tropical environments. Most tropical degradation results directly or indirectly from absorption of moisture vapor, and from surface wetting. These phenomena produce many types of deterioration, including corrosion of metals; physical distortion and decomposition of organic materials; leaching out of constituent components of materials, and detrimental changes in electrical properties.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
Insulation Resistance Testers
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Are designed to help prevent hazards such as electric shock and short-circuits caused when the insulation in electrical devices, parts, and equipment used in industrial plants, buildings, and other settings degrades over long periods of use.
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Product
Insulation Resistance Meter
AMIC-2505
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Measurement of insulation resistance: 500,1000 and 2500V (2TΩ) ; 2 and 3 wire method ; Measurement of DC and AC voltages at 0...600V ; Measurement of leakage currents
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Product
Wafer Internal Inspection System
INSPECTRA® IR Series
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An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Product
Micro-Ohmmeter and Loop Resistance Tester
LRT 6000
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LRT 6000: The right solution for impedance resistance measurement in compliance with all aircraft specifications on plane, helicopter, rocket, army vehicles for both production andmaintenance. It is a very easy-to-use and versatile instrument. Its ergonomics allow the user to use it either placed on the ground or across one's shoulder or chest. Awide back-lit LCDdisplay combinedwith an intuitive keyboard ensures simple and easy operation.
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Product
Manual Contactless Wafer Detector
HS-NCS-300
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Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
