Metrology
field of measurement.
See Also: Measurement, Instrumentation, Coordinate Measuring Machines
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Thermal Warpage Measurement Tool
PS600S
The TherMoir PS600S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoir PS600S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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Non-Contact Sensors
IRIX
Sciences et Techniques Industrielles de la Lumière
IRIX™ is a family of non-contact sensors based on chromatic confocal technology capable of measuring distances and thicknesses on any material transparent to white light.IRIX™ is capable to measure simultaneously up to five layers of material. The controller can be used in combination with a large family of optical probes with different measurement ranges, mechanical dimensions and metrological specifications to best meet the most diverse application needs.
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Sphygmomanometer Calibrator
Huaxin Instrument (Beijing) Co., Ltd
Here at Huaxin, as an expert test equipment solution provider, we are proud to offer a selection of pressure calibrators for precise calibration of sphygmomanometer in laboratory and on site. Our sphygmomanometer calibrators find wide applications in metrology bodies, hospitals, university labs, etc.
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Roundness & Form Measuring Instruments
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Hi Rate Multi-Pixel Detection
Systems utilizing multiple electron beams are an emerging semiconductor metrology technology that aims to increase throughput. El-Mul is a pioneer in developing detection solutions for such metrology systems and has designed and manufactured prototype detectors that can simultaneously detect 144 beams at 35MHz.
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DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Data Analytics
KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
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3MS Automatic Measuring System
With the accelerating of modern meteorology, various ground automatic weather stations have been widely applied. As a result, the need for metrological verification is soaring. However, the existing metrological verification standards, equipment and methods are barely enough to meet the current growing requirements. So systemizing metrological verification management and automating the detection will be the vital factor to solve the problem.
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Metrology/SEM
Our SEM products use scanning electron microscope technology to measure and review tiny surface structures such as photomask etching and circuitry on wafers with high precision and stability.
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330 System
NSX
With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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In-Line Metrology
For industrial applications, k-Space is known for its ability to provide robust data and analysis for in-line solutions in production environments. k-Space works side by side with the customer to understand their specific measurement and inspection needs, and then develops a custom solution to meet the identified requirements. Our solution includes custom measurement technology, software, database generation and integration, go/no go determination, pick and place, alarm status, and PLC communication.
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Optical Filter Sets
Our filter sets support a great range of fluorophores for microscopes and imaging systems. Patented design techniques drive some of the most spectrally sophisticated optical filters on the market. High transmission, steep edges, precise spectral edge placement, and optimized blocking combine for more reliable measurements. A wide selection of individual bandpass filters and dichroic beam-splitters support unique applications, and world-class manufacturing and cutting-edge metrology ensure consistent performance that always meets specifications.
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Calibration Baths
Fluke Calibration temperature baths provide optimal temperature environments for “secondary” or “comparison” temperature calibrations. They offer unsurpassed stability and uniformity, a large working volume, and flexibility for performing thermometer calibration on calibrating a variety of temperature sensors. A world-class temperature controller and 30+ years of experience make these the choice of National Metrology Institutes and calibration laboratories worldwide. Fluke Calibration temperature baths include: compact temperature baths; deep-well temperature baths; standard calibration baths; resistor maintenance baths; ice-point baths; bath / temperature controllers.
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100-Amp Current Calibrator And AC/DC Transconductance Amplifier
2555A
World’s Leading Precision 100-Amp AC/DC Current Standard - For 30 years Valhalla Scientific’s design has proven rock-solid reliability in metrology labs worldwide. The 2555A is a calibration powerhouse with wide-ranging applications and unsurpassed quality.
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Robotic Inspection Made Easy
i-Robot
The i-Robot technology is suitable for all industrial robots; it provides a production-ready metrology solution that is accurate, reliable and flexible. i-Robot is perfectly suited for all applications requiring flexibility and productivity while providing high metrological accuracy.
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Electrodeless Z-Pinch™10 Watt EUV Source
EQ-10
The EQ-10 is a compact, easy-to-use, reliable, and cost-effective EUV light source, based on Energetiq's proven Electrodeless Z-pinch™ technology using Xenon gas. The EQ-10 EUV source is uniquely suited for metrology and research applications.
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Hydrogen Frequency & Time Standard
CH1-1007
Hydrogen frequency and time standard Ch1-1007 is designed to generate and reproduce precision, highly stable, spectrally pure frequency and time signals. Main areas of application: – in metrology when transferring the sizes of units of frequency and time, including as part of mobile measuring complexes; – in radio astronomy when conducting scientific research; - in radio navigation when working as part of automated measuring systems and complexes.
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kSA SpectR
The kSA SpectR is a complete metrology solution for measurement of absolute spectral reflectance, growth rate and end point detection. Custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level, over a user defined wavelength range of interest, are easily measured.
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High Precision Angular Positioning, Calibration and Geometry Inspection
LabStandard COMPACT
Rotary Precision Instruments UK Ltd
Designed for horizontal or vertical applications with a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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Semi-automated Metrology System
Full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness
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RF Calibration Kit
SMK-3000
The SMK calibration kits are precision, high power calibration standards that are used to calibrate RF radios, wattmeters, directional couplers and other high-power RF test equipment in the field or metrology lab. Unlike other calibration solutions, the SMK-3000 calibration kits reduce the cost of ownership and provide a much faster time-to-calibration with lab precision and accuracy you’ve come to expect from Bird.
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PHOTO-2000μ Μ-LUX Meter
Hangzhou Everfine Photo-E-Info Co., LTD
The PHOTO-2000μ is designed for low illuminance testing above 10-6lx. Using the international leading low-lux detection technology, the measurement accuracy is high, good stability, often used in metering laboratory, physics laboratory, metrology laboratory and other related scientific research, engineering, product inspection and other occasions.
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Add-ons For Metrology
We offer add-on products for Optical Frequency Combs and metrology applications. These include heterodyne photodetectors (BDU), and highly stable RF oscillators, just to name a few.
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Full Range Photodiode Array UV-VIS-NIR-SWIRLaboratory Spectroradiometers
The SR-Series of full range laboratory spectroradiometers is ideal for a wide range of applications, including:*Solar radiance and irradiance measurements*Solar simulator test and classification*LED, laser, light source metrology*Radiometric calibration transfer*Remote sensing applications
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Interferometer
S100|HR
CNC polishing puts new demands on metrology tools. Many of these optics are aspheric with tight tolerances. The new machines can produce almost any surface and require a new level of metrology to provide feedback to the polishing process. This just cannot be done with outdated interferometers designed over 30 years ago. The S100|HR has the performance it takes, without breaking the bank. Measure 10X higher fringe densities to enable final figuring to begin sooner, saving you time and money. Plus measure these high density fringes 5X more accurately to enable large polishing corrections that converge quickly to final figure, including aspheres.
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Failure Analysis And Magnetic Imaging Services
Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Production Camera Test System
Meridian
Designed for rapid customization, the Meridian product line offers a revolutionary hardware and software approach to production camera testing. It's a flexible test tool kit that's compact, cost-effective and easy to incorporate in your production line: the graphical user interface facilitates setup and selection of metrology parameters; and a library of functions integrates easily into your testing software.
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QE Systems
Abet Technologies offers a range of standard EQE and IQE measurement systems. Model QE-1100 is configured with the most useful components for single junction devices. It has a 350 – 1100 nm range. The QE-1800 is configured with components most useful for components for triple junction cells. Beyond the standard systems offered systems can be custom configured to meet a customer’s metrology needs.
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Portable optical DO meter
ARO-PR
The Portable optical DO meter makes use of the fast-response optical DO sensor RINKO, maintaining its high-speed response performance (99% response < 7sec). The meter probe is equipped with a temperature sensor close to the sensing foil, and the measurements are made by simply inserting the probe into a DO sample bottle (the calibration is carried out using the National Metrology Institute of Japan (NMIJ) certified traceable gases standards). Differently from galvanic electrode sensors, the instrument does not require water sample stirring or fixing reagents, since there is no oxygen consumption. Thus, the required time to estimate dissolved oxygen is considerably reduced. The display unit shows the output instantaneously, and you can check the measured values in real time.
