Reflection
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Multi Channel Optical Fibre Verification
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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Polarizing Beamsplitter (PBS)
Polarizing beamssplitters split randomly polarized beams into two orthogonal, linearly polarized components. S-polarized light is reflected at a 90 degree angle while P-polarized light is transmitted. Polarizing beamsplitters come in cube form, but custom geometries are available.
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2x2 Interferometric Couplers
Feasa manufactures a series of couplers, which are optimised for use in fiber interferometers. The couplers have a highly reflective end on one or more output ports and can be configures as 1x2 or 2x2.
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Handheld Tachometers
The handheld tachometer is a means of measuring revolutions within the industrial sector, either optically or mechanically. The handheld tachometer can be used for maintenance and calibration of machines that have moving parts. The principle is similar to a bicycle speedometer, where time will be measured until a wheel has completely turned. The handheld tachometer has two different measurement methods.The handheld tachometer may have a contact connection to the moving parts. Alternatively, the handheld tachometer works with reflecting marks. This will be secured on the moving part. As the laser strikes the reflecting mark during rotation, it will be reflected and detected in the handheld tachometer via a sensor. Rotation speed and speed can be seen on the handheld tachometer. The handheld tachometer may combine both possibilities (contact and non-contact connection). Next to the handheld tachometer you find other devices for measuring revolutions at PCE Instruments.
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TDR Structural Health Monitoring
Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
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Loudspeaker-Microphone Probe
Zircon
The Zircon is a loudspeaker-microphone probe for measuring in situ the absorption and reflection properties of surfaces. These may be indoor surfaces, such as in concert halls and gyms, or outdoor surfaces, such as road surfaces (ISO 13472-1), sound barriers installed in a free field (NF S 31-089) and traffic noise reducing devices (CEN/TS 1793-5)
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DNI Sensors
A revolutionary design with proven reliability, the MS-90 is made to measure Direct Normal Irradiance (DNI) without a sun tracker based on a unique rotating mirror design that reflects the sunbeam onto a thermal detector.
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RF Bridge, 50 Ohm, 300 kHz to 3 GHz
86205B
The Keysight 86205B high directivity 50 ohm RF bridge offers unparalleled performance in a variety of general-purpose applications. It is ideal for accurate reflection measurements and signal leveling applications.
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Power Dividers
Powers plitters can divide one signal into two or N way equal or non-equal energy, in reverse,they are also used as combiners by combining multiple signal into one. They are mainly used in feed network in antenna array, mixer and balanced amplifier, finish the work of distributing, combining and measuring power, isolating signal sources and measuring swept reflected coefficient etc.
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10 MHz to 55 GHz Noise Sources
CNS346 Series
The Spanawave CNS346 Series is designed for precision noise figure measurement applications. The superior VSWR characteristics reduce multiple reflections of the test signals and significantly increase the measurement accuracy of most noise figure set-ups. The CNS346 Series noise sources have broadband coverage and extremely good temperature and voltage stability, for the finest noise figure meter-compatible laboratory standards. Outputs of 6, 15.5 and 22 dB ENR are available, allowing the units to accurately measure noise figures up to 20 ,30 and 36 dB respectively.
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SINE (Sinusoidal) Targets & Arrays
Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm, while the transmission film arrays are offered in various sizes up to 256 cycles per mm. In addition, the sinusoidal arrays are available in a Single Frequency Grating or with Multi-Frequency Gratings. If instead of continuous sinusoidal frequency, you are looking for a square wave frequency design, then look to the Ronchi Gratings page. Should you need to alter the size of the pattern or the substrate, fill out our Custom Test Targets and Charts form and start the conversation.
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RF Bridge, 50 Ohm, 300 kHz to 6 GHz
86205A
The Keysight 86205A high directivity 50 ohm RF bridge offers unparalleled performance in a variety of general-purpose applications. It is ideal for accurate reflection measurements and signal leveling applications.
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Laser Flash Photolysis
This system that makes complex electronics, cumbersome software and large optical benches a thing of the past. The LFP system incorporates everything needed except the excitation laser. This is a simple, yet powerful instrument, ready to perform a wide range of time resolved kinetic and spectroscopic measurements involving transient absorption or diffuse reflectance. The LFP system, including the monochromator and digitizer is completely computer controlled, making it easy to obtain
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Spatial Light Modulators
Spatial Light Modulators (SLM) are used as adaptive optical elements that modulates light spatially in amplitude or phase. We offer devices that are based on either reflective (LCOS) or translucent (LCD) liquid crystal microdisplays.
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Verifier Computer Interface Report
VCIR
The Verifier Computer Interface Report (VCIR) is a Windows software package that allows for transferring inspection report from your Inspector series bar code verifier to a computer. Once transferred you can review the ISO/ANSI inspection results or view the scan reflectance profile for detailed troubleshooting. The inspection results can be saved by job for later retrieval or to append new inspection results to the existing job. As each job is saved an Excel spreadsheet (CSV file) is generated. You can customize which parameters should be saved in the spreadsheet. The spreadsheet provides a simple report that will have a line for each bar code inspected.
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Contactless Laser Extensometers
Jinan Testing Equipment IE Corporation
Model LE-05 and LE-15 extensometers measure strain optically, without contacting the specimen, using laser diode technology. The extensometers are self-contained and portable. They may be interfaced with a variety of testing machines and data acquisition systems using the ±10V analog output or bi-directional RS-232 serial port. Operation may be local or remote. A digital display is included. The scanning beam is always perpendicular to the specimen, unlike most laser extensometers. This eliminates errors when viewing through windows in chambers. It also minimizes sensitivity to the distance between the extensometer and the sample. Because the unit measures reflected light, no receiver is required behind the sample.
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Photoelectric Switch
PE3
● Compact size for 13.5(W)*25.5(H)*32.0(L)● A wealth of models ideal for limit control, counting control, and other applications.● Sensing distance of 5~60cm for Diffuse reflective models, 1M~2M for Retro reflective models and 1M~5M for Through beam models.
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Pre- Locator
CFL PL4
CFL PL4 Power Cable Fault Locator is a portable, easy to use cable fault pre-location instrument. It uses the Time Domain Reflection (TDR), Secondary Impulse Method / Multiple Impulse method (MIM) and Impulse Current Method (ICM) on low, medium and high voltage cables. Its measuring ranges enable pre-location on cable lengths from 500 m to 64km.
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Reflective Memory Analyzer
PEAZ-5565
Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Spectroscopic Ellipsometry
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Coaxial Open, 2.4 mm (m)
85141A
The Keysight 85141A coaxial open is used for establishing measurement planes for known reflection phase and magnitude in 50-ohm coaxial systems. It has a 2.4 mm male connector.
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Minority Carrier Life Time System
MWR-SIM
MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
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SINE FBI Charts
There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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PHOTOELECTRIC Sensor
PE2
● Wide range power supply for AC24~260V and DC12~260V● A wealth of models ideal for limit control, counting control, and other applications.● Sensing distance of 30~300cm for Diffuse reflective models, 3M~8M for Retro reflective models and 10M~20M for Through beam models.● Housing by PBT with strong structure and acid resisting.
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Power Supplies
CUL-750B
The CUL-series is a semi-modular power supply that lets you select the cables you need while powering your gaming system with a 140mm Blue LED cooling fan and 6 pin PCI-E ready. **850W & 950W is offering 140mm Blue LED cooling fan & Dual 6+2 PCI-E ready. Everyone likes a clean and easy installation. This power supply allows you to keep what you want and remove what you don't. While necessary connectors, like the 20+4 pin power & 4+4 pin CPU connector are attached to the unit, you decide which of the others should stay. Customize your power supply to reflect your system.
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Optoelectronic Sensors
BERNSTEIN optoelectronic sensors can be divided into three basic types: * Through-beam, * Retro-reflective, and * Diffuse reflective. The specifications of the above mentioned sensors are defined in the standard IEC 60947-5-2 and are in conformity with the CE.
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6x (1 to 4) 50 Ohm 2.5 GHz MCX Multiplexer
YAVAL034
6x (1 to 4) MMCX connectors CAN Control (or Ethernet with Ethernet to CAN Gateway) Reflective
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DOI / Haze Meter
807
TRICOR’s Hazer Meter and DOI is ideally suited for measuring flat, non-textured high reflectance surfaces. The Model 807A Haze Meter design is in accordance with ASTM E430 and ASTM D5767 (method A) and is used to measure ±3 degrees around the specular lobe centered at 30 degrees in approximately 220 increments. That’s an angular sample size of 1 sample per 1.6 minutes of arc! This allows differentiation between samples with very small differences in reflectance characteristics. Verified replacement for the older Hunter Dorigon II haze meter unit.
