Systems
are interconnected groups of purpose.
See Also: Equipment, Test Systems, System Integrators, System Test
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Product
Shaker Systems
C-Series
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The MB Dynamics C10E, C40HP, C90HP and C150HP Electrodynamic Shakers comprise current deliverables in a long history of reliable and rugged shakers earning a well-deserved reputation for high performance, longevity, and dependability. They build upon MB’s family of CSeries products (C10, C25, C40, C50, C60, C90, C125, C126, C150, C200, C210, C220) with a heritage spanning 50 years.
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Product
Collaboration Systems
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Solutions for small meeting, huddle, or collaboration spaces that foster group sharing using technology.
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Product
Scientific Systems
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Teledyne e2v has been producing turnkey focal plane arrays, camera systems, electronics and astronomical cameras for over 15 years. As part of our advanced system and instrument group we act as your partner to collaborate and develop the next generation of scientific products and technologies.
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Various Systems
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Our experienced and highly qualified engineering team enables Innco systems to offer a wide range of possibilities to design positioning systems according to your specifications or measurement applications.The control of the system, singular or complex can be realized with our standard CO3000 controller, which allows connections to your measurement systems by GPIB or LAN.
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Product
Profiling Systems
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ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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XTP Systems
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Flexible, reliable systems that support multi-format switching and management of local and remote AV devices.
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Product
Criticality Systems
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The CAAS-3S is a next generation system based on operational excellence established over forty years. The new design is based on the highly reliable analog signal chain used in the probe design for the previous EDAC-2 and later EDAC-21 products which have had successful safety records and very low false alarm rates. This new system addresses the next several decades of facility operation.
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Cooling Systems
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Aerodyn Engineering designs and manufactures its own line of cooling carts. Our cooling carts will supply filtered coolant to the slip ring while in operation. Aerodyn Engineering’s cooling units are extremely reliable and are designed and manufactured with the highest quality components and craftsmanship available in the industry today. Magnetically coupled pumps are employed within our system to deliver the cooling fluid, with full user instruments showing flow rate and system pressures.
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Product
Inclinometer Systems
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Columbia Research Laboratories
Columbia Research Labs offers our standard Inclinometer System and our Differential Inclinometer System. The standard system includes a temperature compensated force balance inclinometer in conjunction with a power module and convenient digital display. It is available with either AC or DC Power supply input. The Differential System allows the customer to match the slope of two remotely located surfaces. The readout can be set to indicate the absolute tilt of either sensor or the differential angle between them.
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Communication Systems
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Communications systems provide ultimate convenience for all tactical and administrative communication tasks, custom-made for naval vessels of any size – from submarine to destroyer.
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Product
FPGA Systems
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Leverage our development platforms and rugged FPGA based systems that provide a rapid migration path from the lab to the field - without having to re-architect an entire system.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Automation Systems
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Omron's extensive portfolio of PLC and MAC controllers, networking solutions, remote IO, IPC and HMI technology support a fully integrated application
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Control Systems
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GCA leverages decades of electronics and software experience as we build control panels and PLC software that bring machines to life and orchestrate how the machine's various components work together.
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Shock Test Systems
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Accurately measure the fragility of products and evaluate how they respond to specific shock inputs.
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Product
Metrology Systems
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VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Product
Communication Systems
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Tactical networking radio system comprising of transmit/receive modules, converters, synthesizer, RF switching, power supplies, controllers and an antenna array. The radio automatically selects the best communications path to create a self-forming, self-healing network.
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Mini-MRI Systems
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Magnets for Magnetic Resonance Imaging (MRI) are required to generate a high homogeneity field over the imaging volume which remains stable in time.
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Product
Automated Potentiometer Systems
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Measurements International Ltd.
Intrinsically Accurate Self-Calibrating Ratio Divider, Best Accuracy < 0.05 ppm, Built-in 20-Channel Scanner, Arbitrary Voltages from 1 mV to 1200 V, Bipolar Voltage Measurements, Calibration of Fluke 5700A/5720A, Calibration of 3458A and 8508A, Calibration of Voltage Ratio Dividers (F752A, MI 1340A, G7520), Linearity Calibration of Digital Volt Meters (DVM), Traceability to 10 V Zener Reference.
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Product
HDT & Vicat Systems
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The Instron line of CEAST Thermo-mechanical systems are used to characterize the behavior of plastic materials at high temperatures, measuring the heat deflection temperature (HDT) and the Vicat softening temperature (Vicat). These HDT and VICAT testers range from very simple units for quality control labs to more advanced and automated systems.
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Low-Tc Systems
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With our long year experiences in SQUID electronics, SQUID sensors, and SQUID systems, we can offer exactly the system you need. No matter if you need a small 5 litres LHe dewar with just a single channel or a 100 litres multichannel system, we cooperate with excellent dewar manufacturers to guarantee the best possible performance for the overall system.
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Product
Power Supply Systems
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The Auxiliary Power Unit (APU) serves as a cost effective solution for a variety of military vehicle platforms including main battle tanks, self-propelled howitzers, tactical vehicles, and other special purpose armored fighting vehicles. Our family of heavy-duty, automotive APUs for military applications are packaged to meet specific installation requirements and are available as stand-alone units or may be integrated with any combination of life support systems. Each system provides the following capabilities:
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Deposition Systems
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When a thin film requires the most stringent structural or compositional properties consistently across every layer, Veeco’s Ion Beam Deposition (IBD) technology is often the answer. Using a focused beam of ions to sputter material from a target, this physical vapor deposition technique builds dense, uniform films with standout adhesion and stability.
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Custom Systems
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No two products or processing challenges are exactly alike. That’s why a specially-configured MAC® Custom System can help you address unique testing requirements…as well as the demands of your own internal standards
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Product
Electroluminescence Test Systems
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The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Product
Optics Test Systems
IR Autocollimator
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Optik Elektronik Gerätetechnik GmbH
The infrared autocollimator was specially designed for the 1550 nm wavelength range. In conjunction with the CROSDETECT evaluation software, it achieves a measuring accuracy of 1 arcsec with a resolution of 0.1 arcsec. The camera used is suitable for the wavelength range from 900 nm to 1700 nm.
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Shaker Systems
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Vibration Research Corporation
Small force vibration testing equipment and shakers for product and modal analysis testing. Each system consists of a shaker and a matching linear direct-coupled power amplifier. Additional components may be added to the basic system to tailor it to your specific needs.
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Product
LabVIEW Development Systems
System
Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
