Showing results: 646 - 660 of 724 items found.
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Data Patterns Pvt. Ltd.
The FPGA Mezzanine Card is used by Data Patterns to implement signal interface with external world compatible FPGAs mounted on the FMC carrier there are primarily used for high speed analog interface for digitization (ADCs) and waveform generation (DACs). This form factor is also utilized for special I/O Interfaces such as various avionic protocols and buses. FMC I/O signals may be routed via front panel connectors or through Mezzanine connectors that route the signal back to the carrier board for routing through rear I/O of the Chassis. The system interface is designed for routing to FPGAs using a VITA 57 0.05 Pitch Terminal Array Assembly.
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MANAGER -
Beijert Engineering BV
Today more complex probe cards are being used. More pins,higher density and larger array requires a new approach inprobe card analysis. With the soaring cost of new generationprobe cards, repair of defective cards becomes an necessity.BE Precision Technology offers all capabilities with the newMANAGER V. Future proof, up to 450 mm full wafer contactprobe cards can be analyzed with up to 88.000 test channels.High-end materials are used to stand extra tough requirements—such as 500 mm diameter diamante viewing window,ultra stiff carbon flip-table, high power Z–stage to generate 600Kg of contact force
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ScanExpress JTAG Debugger -
Corelis, Inc.
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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778975-01 -
NI
Isolated 48 VDC, 8-Channel PXI Counter/Timer Module—The PXI‑6624 performs a wide variety of counter/timer tasks, including event counting, time period/frequency measurement, quadrature encoder position measurement, pulse-width measurement, pulse generation, and pulse-train generation. It features 48 VDC channel‑to‑channel isolated I/O with eight counter/timers, 26 digital inputs, and eight digital outputs. Example applications also include the generation of retriggerable pulses, two-signal edge separation measurements, continuous buffered event counting, and continuous buffered pulse-train measurements. The PXI‑6624 offers superior industrially rugged features for a wide array of applications such as automotive/aerospace, industrial/motion control, and manufacturing test.
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781212-01 -
NI
Non-Enclosed, 24 V, 32-Channel (Sinking Input, Sourcing Output), 7 µs (Input)/500 µs (Output) C Series Digital Module - The sbRIO‑9375 is a digital I/O interface that works with industrial logic levels and signals for direct connection to a wide array of industrial switches, transducers, and other devices. Each digital input line is compatible with 24 V logic levels, and all the output lines are compatible with 6 V to 30 V signals, based on the external power supply. The sbRIO‑9375 offers isolation between the input and output banks from channel‑to‑earth ground. Non-enclosed modules are designed for OEM applications.
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785672-01 -
NI
2.1 GHz, 1U Rugged Rack-Mount External Controller for PXI—The RMC‑8357 is a rugged 1U rack-mount controller for PXI- or PXI Express-based systems intended for test and measurement applications requiring rack-mount controllers. It features up to two Intel Xeon eight‐core processors that support up to 32 GB of RAM. The RMC‑8357 offers hot-swappable fans, options for redundant power supplies, and support for RAID arrays, which allows multiple hard drives to be configured for high performance for mission‐critical, physically demanding applications. The RMC‑8357 meets the PXI standard’s mechanical shock and vibration specifications and functions over wide operating ranges.
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785673-01 -
NI
2.1 GHz, 1U Rugged Rack-Mount External Controller for PXI—The RMC‑8357 is a rugged 1U rack-mount controller for PXI- or PXI Express-based systems intended for test and measurement applications requiring rack-mount controllers. It features up to two Intel Xeon eight‐core processors that support up to 32 GB of RAM. The RMC‑8357 offers hot-swappable fans, options for redundant power supplies, and support for RAID arrays, which allows multiple hard drives to be configured for high performance for mission‐critical, physically demanding applications. The RMC‑8357 meets the PXI standard’s mechanical shock and vibration specifications and functions over wide operating ranges.
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RevospECT Pro -
Zetec, Inc.
RevospECT Pro is the industry’s first commercially available high-powered, adaptable and scalable automated analysis system. It provides end users the power and control to perform comprehensive automated analysis of eddy current data. RevospECT has a proven track record in the field and meets rigorous industry standards for flaw analysis from bobbin, rotating and array inspection techniques. Once configured for an inspection, RevospECT Pro will process and analyze data at an extremely fast rate utilizing its robust distributed processing power, often outpacing data acquisition rates and generating results that can be verified immediately by the reviewing data analyst. More importantly than system speed is the consistency of the results that are delivered using computer-aided analysis.
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Pulse Instruments
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
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781490-01 -
NI
204.8 kS/s, 113 dB, 2 Gains, 0.5 Hz AC/DC-Coupled, 8-Input PXI Sound and Vibration Module - The PXIe‑4492 is designed for sound and vibration applications. With 24-bit analog inputs and IEPE constant current signal conditioning, the module is ideal for making precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. The PXIe‑4492 delivers simultaneous sample on all channels. In addition, it includes built-in antialiasing filters that automatically adjust to your sample rate, software-selectable input gains, and TEDS smart sensor support for error-free setup. Common applications include noise, vibration, and harshness (NVH) analysis; large microphone arrays; and dynamic structural test.
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783338-01 -
NI
1.33 GHz Dual-Core Atom, 4-Slot, CompactDAQ Controller - The cDAQ‑9132 controls the timing, synchronization, and data transfer between C Series I/O modules and an integrated computer. It includes Intel Atom dual-core processing and 16 GB nonvolatile storage for data-logging and embedded monitoring. You can choose between running Windows or NI Linux® Real‑Time. The cDAQ‑9132 offers an array of standard connectivity and expansion options, including SD storage, USB, Ethernet, RS232 serial, and trigger input. You can combine the cDAQ‑9132 with up to four C Series I/O modules for a custom analog I/O, digital I/O, counter/timer, and controller area network (CAN) measurement and logging system.
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782568-01 -
NI
2.4 GHz, 1U Rugged Rack-Mount External Controller for PXI - The RMC‑8355 is a rugged 1U rack-mount controller for PXI- or PXI Express-based systems intended for test and measurement applications requiring rack-mount controllers. It features up to two Intel Xeon E5620 quad‐core processors that support up to 96 GB of DDR3 RDIMM ECC RAM. The RMC‑8355 offers hot-swappable fans, options for redundant power supplies, and support for RAID arrays, which allows multiple hard drives to be configured for high performance for mission‐critical, physically demanding applications. The RMC‑8355 meets the PXI standard’s mechanical shock and vibration specifications and functions over wide operating ranges.
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783339-01 -
NI
1.33 GHz Dual-Core Atom, 4-Slot, CompactDAQ Controller - The cDAQ‑9132 controls the timing, synchronization, and data transfer between C Series I/O modules and an integrated computer. It includes Intel Atom dual-core processing and 16 GB nonvolatile storage for data-logging and embedded monitoring. You can choose between running Windows or NI Linux® Real‑Time. The cDAQ‑9132 offers an array of standard connectivity and expansion options, including SD storage, USB, Ethernet, RS232 serial, and trigger input. You can combine the cDAQ‑9132 with up to four C Series I/O modules for a custom analog I/O, digital I/O, counter/timer, and controller area network (CAN) measurement and logging system.
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EPC-R5710 -
Advantech Co. Ltd.
Advantech EPC-R5710 is an AI edge intelligent industrial gateway integrating NXP's high performance of video coding/decoding and AI function. It can provide 2.3-28.3 TOPS NPU AIcomputing power, and support multiple network ports, a variety of industrial interfaces and storage, as well as wireless technologies including 5G/4G,Wi-Fi5/6. It also supports 8-wayMIC array to realize audio and video AI analysis. Integrated cloud collaboration functions.EPC-R5710 supports a variety of PLC data acquisition and industrial protocol conversion. With its high performance and high quality, it is widely used in AI video surveillance, machine vision and industrial data acquisition applications in the fields of security, smart city, smart transportation, smart factory, energy and power.
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KLA-Tencor Corp
KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
