Showing results: 436 - 450 of 643 items found.
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BVM-1010 -
BYC Industrial Ltd
M-LCD Video Microscope has renovated the traditional way of microscopic observation and adopted a modern way of electronic imaging. This patented microscope makes the observation more comfortable and thoroughly resolves the fatigue caused by using a traditional microscope at work for a long time. It features high performance of CCD image capturing, high resolution of LCD display and reverting genuine images. Based on 2D observation, 3D angle attachment is added to obtain 3D multi-angle observation. Laser locating function can easily identify the position of observation. This unit integrates magnification, imaging, display, LED illumination and laser locating functions. Compact design, light weight and low power consumption make the operation simple and convenient. M-LCD Video Microscope can be conveniently applied to testing and inspecting in product assembly, research and teaching fields.
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FilmTek 2000 PAR -
Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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Aprotec Instrumentation Ltd
From the innovative Z-Check 3D through to the entry level Z-Check 100 the entire range has been designed to provide accurate pad specific measurement of solder paste deposits, adhesives and component placement. Amongst its other features the Z check software comes with the convenience of a full SPC package as standard.
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Radiantech, Inc.
Smart-connected APP, Splicing record management, Intelligent burglary-resisting system 1 sec. topspeed boot time, 6 sec. splicing time, 12 secs. Heating time. 3D protection cover reduce risk and unpredictability Handy, lightweight, anti-dropping solid and durable. Hi-Speed USB connection internet remote control.
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I-Pi SMARC 1200 -
ADLINK Technology Inc.
The I-Pi SMARC 1200 is a SMARC-based, AI and graphics-centric solution development kit powered by MediaTek® Genio 1200 (Octa-core Arm Cortex-A78 x4 + A55 x4) processor with a 5-core Arm Mali-G57 GPU for advanced 3D graphics and an integrated APU (AI Processor Unit) system delivering up to 5 TOPS.
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Piranha4 Polarization -
Teledyne DALSA
The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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MEZ-E1553 -
Alta Data Technologies LLC
From our popular ENET product, the MEZ-E1553 is a small, rugged mezzanine product that can easily be integrated into your system design. Alta provides full reference schematics, design notes, STEP 3-D Files, and sample ESS test programs. Guaranteed 1553A/B/C compliant with AS4111 5.2 Protocol Test reports.
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FilmTek 2000 -
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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ROM-5420 B1 -
Advantech Co. Ltd.
ROM-5420 SAMRC v1.1 Module integrates ARM Cortex-A9 NXP i.MX6 series ultra low power SoC and I/O solution chips to be OS support ready. NXP i.MX6 supports 2D, 3D graphics acceleration, full HD 1080P video decoding and an HD 1080p video encoding hardware engine.
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Solid Edge -
Maya Heat Transfer Technologies Ltd.
Solid Edge® is an industry-leading mechanical design system with exceptional tools for creating and managing 3D digital prototypes. With superior core modeling and process workflows, a unique focus on the needs of specific industries, and fully integrated design management, Solid Edge® guides projects toward an error free, accurate design solution.
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Vishera -
ViTec Co. Ltd
Non-contact measurement of the geometry of objects using telecentric lenses Opto Engineering, illuminators of various modifications, 3D scanner Sick Ranger. The telecentric pair, in conjunction with modern digital cameras from Basler, ensures high accuracy in measuring the geometric parameters of objects, the principle of laser triangulation ensures high accuracy and scanning speed.
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Exact Metrology
Computed tomography (CT) is also referred to as industrial x ray and industrial imaging. It is an x-ray methodology yielding 3-dimensional (3D) results by placing an object on a rotational stage between an x-ray tube and x ray detector, rotating the object 360 degrees and capturing images at specific intervals—such as every degree or every half degree.
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KPM Analytics
Customizable 3D, full color, 360-degree Product Quality Inspection Solution that integrates seamlessly into existing production lines to measure multiple quality parameters at speeds of up to 100 objects per second. For advanced process control, each system is equipped with a conveyor, cameras selected for your specific application, and a choice of rejection options.
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SmartScan 350 -
Amber Precision Instruments
Reproducing similar soft or hard failure to the gun test - Flexible automatic failure detection module - Susceptibility map generation- Automatic report generation- Flexible scan area editor (SAE)- Flexible display (3D, histogram)- Matlab support- Expandability (EMI scan, phase measurement, NFFF transformation)- Custom design probes
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Boin GmbH
PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
