Transistor
damage check for polarity, gain (5-1000 volts), and shorts.
See Also: Field Effect Transistor, NPN Transistor, GaN
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Transistor Testing
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Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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Transistor Arrays
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Renesas' portfolio of transister arrays include NPN, PNP, NPN-PNP combination transistor arrays based on our complementary UHF-1 SOI process. This portfolio also includes ultra high frequency transistor arrays for VHF/UHF amplifiers, VHF/UHF mixers, IF converters, synchronous detectors. Dual long-tailed pair transistor arrays and Gilbert Cell UHF transistor arrays are also available for wireless communication systems, radio and satellite communications and high performance instrumentation.
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Transistor Tester
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*Measure rich DC parameters of maniford semiconductors, e.g. diode, transistor, controlled silicon, FET.*Measure capacitor, varistor, DC voltage signal source*Measure 78 and 79 three terminal voltage regulator*Data hold, low battery warning*Complete with carry case and six 1.5V AA batteries
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Photocouplers/Optocouplers Transistor Output
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The PS2xxx series, a range of transistor output type general-purpose photocouplers (optocouplers), feature a high isolation voltage, high temperature operation and compliance with various international safety standards.
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VCOs with Output Dividers
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Analog Devices offers a range of GaAs inGaP heterojunction bipolar transistor (HBT) MMIC VCOs with output divider options to meet your application and design needs. Members of this product line integrate resonators, negative resistance devices, and varactor diodes, while featuring excellent phase noise performance.
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PXIe-6545, 200 MHz, 32-Channel PXI Digital Waveform Instrument
780993-02
Digital Waveform
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Bench Digital Multimeter, Calibrated, 1 kV, 10 A, 3.8 Digit
72-1015 CAL
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The 72-1015 CAL from Tenma is a digital bench type true RMS multimeter. It has auto and manual range options with maximum reading of 5999 counts and 3-5/6 digits which has a unique outlook design. In addition to all the conventional features including DC/AC voltage, current, resistance, diode, continuity test, diode test capacitance, temperature, transistor, max/min, there is a data hold, low battery display, sleep mode, RS232C serial port for easy connection with computer to realize macro recording, monitoring and capture of transient dynamic data, displaying change of waveform during the measurement, providing data and evidence to engineering technicians for scientific research. This meter complies with the standards IEC61010, pollution degree 2, overvoltage category (CAT I 1000V, CAT II 600V) double insulation and CE marked.
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Failure Analysis
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Failure analysis on electronic components is a continuous challenging task. The smaller transistor dimensions, increasing functional complexity and changing device packaging styles requires new tools and skills for sample preparation, fault localization techniques, high resolution imaging and analysis.
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Process Counter
CT6000
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Full-logic control process counter. • Displays process, batch, total, and rate • Optional relay outputs and/or 4-20 mA analog output • Completely field adjustable • Full diagnostic functions • 3 programmable transistor setpoint outputs and inputs • Bi-directional counting • 115, 230 VAC (50-60 Hz) and 10-30 VDC power options
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Optoelectronics
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Renesas provides a wide range of optoelectronic devices, including IC output photocouplers (optocouplers) featuring a high response from 1Mbps to 15Mbps, as well as general purpose transistor output devices featuring high isolation voltage, high temperature operation and compliance with various international safety standards. For motor drive applications, dedicated photocouplers provide high isolation voltage, high temperature operation, high output current, and high-speed switching. These are complemented by a diverse range of ultra-high speed devices for fiber-optic applications, as well as solid state relays (OCMOS FETs).
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MOS Transistor Selector
UI9610
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MOS with superior performance has now been widely used in electronic ballasts, energy-saving lamps were. But power MOS test screening, matching problem. It is difficult due to a lack of corresponding inspection means that many enterprises do not have to engage seriously in quality control as well as the effect of product consistence and reliability. The equipment in a unique program designed to solve the power MOS test problem containing micro-processing, intelligent a few significant simple application.
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High Collector To Emitter Voltage
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High collector-to-emitter voltage photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon Darlington connected phototransistor. The isolation voltage during input and output and the voltage between the collector and the emitter of the transistor are both high.
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ATX Industrial Motherboard With LGA1150 Socket Intel® Xeon® E3-v3 Processor, Intel® C226, ECC DDR3, USB 3.0, SATA 3.0, Dual LANs, DisplayPort/DVI-I/HDMI And CFast™
IMB210
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The IMB210 is an advanced ATX industrial motherboard based on the 4th Generation Intel® Xeon® E3/ Core™ i7/i5/ i3/ Pentium®/ Celeron® processors (codename: Haswell) in LGA1150 socket with Intel® C226 PCH. The optimized IMB210 is specially designed for workstations through better computing and visual performance ideally used in every major industry for tasks ranging from financial modeling to designing complex buildings and vehicles. With its built-in Intel® HD Graphics P4000, this industrial grade motherboard delivers great 3D visual performance with triple display capability through DisplayPort, HDMI and DVI-I ports demanded by professional-grade CAD and media/entertainment fields. In addition, the IMB210 supports Intel® Turbo Boost 2.0 technology, Intel® Hyper-Threading technology, Intel® HD Graphics with DX11 support, 3-D Tri-Gate transistors, 32 GB ECC DDR3 1600/1333 memory, and PCI Express 3.0 x16 slot. It also features Intel® Active Management Technology 9.0 (iAMT), Trusted Platform Module 1.2 (TPM), SATA RAID, as well as PCIe x4 expansion making it ideal for applications with added security features.
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High Impedance Preamplifier
1671
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The Model 1671 is a single ended low noise field effect transistor
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Insulated Gate Bipolar Transistors
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The Bourns® IGBT discrete BID series combines technology from a MOS gate and a bipolar transistor, creating the right component for high voltage and high current applications. This device uses advanced Trench-Gate Field-Stop technology providing greater control of the dynamic characteristics while resulting in a lower Collector-Emitter Saturation Voltage (VCE(sat)) and fewer switching losses.
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Single Head Component Testers
34XX
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Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Heavy Duty Digital Multimeter
DMM 8007
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1.999 count LCD display. Resistance to 2000 M£[. Frequency to 20MHz. Capacitance measurement. Inductance measurement. Logic Test. Transistor hFE test. Audible continuity test
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Charge Integrator Amplifiers
AD8488
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Analog Devices’ charge integrator amplifiers convert the charge acquired by X-ray or photodiode detectors to a voltage. The channels are composed of CMOS transistors, using typical high input impedance CMOS gates. The integrators generate charge dependent voltages using a range of selectable capacitance values that accommodate a broad range of input charge values. The integrators are followed by single-ended input to differential output voltage amplifiers where offset and low frequency noise voltages are subtracted from the input voltages.
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DC Input Single
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DC input/single transistor output photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon phototransistor. This type is suitable for applications such as I/O interfaces and signal transmission circuits.
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Voltage Controlled Oscillators
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Teledyne RF & Microwave offers Voltage Controlled Oscillators (VCOs) utilizing bipolar transistors & silicon varactors over the frequency range of 40 MHz to 18GHz. Many of the VCO designs incorporate internal filtering, regulation & amplifiers to meet total system requirements in a small integrated package. Additionally, our hermetic hybrid designs can be screened to the most demanding military and space applications.
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Multi-Functional Selector
UI9600A
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How to test a transistor with digital transistor selection tool? Please check the belowing Transistor’s Multi-Functional Selector measurement.
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ETX Module with Intel Atom® Processor E3800 Series SoC (formerly codename: Bay Trail)
ETX-BT
Computer on Module
The ETX-BT is based on the latest Intel Atom® processor E3800 SoC series, adopting the latest 22nm process technology with 3-D Tri-Gate transistors featuring significant improvements in computational performance and energy efficiency. The E3800 SOC series integrates processor and GPU cores and all I/O on a single chip. Processor performance is scalable from a single-core Intel Atom® processor E3815 at 1.4GHz to a quad-core Intel Atom® processor E3845 at 1.9GHz. Two quad-core Intel® Celeron® processors, based on the same microarchitecture, are also available.
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Product
Compact Semiconductor ATE
QST286
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Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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Frequency to Current Converter
DAT4540R
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The Frequency to Current converter DAT4540R is a signal conditioning din rail mount converter which converts a pulse input to an analog output equal to the set range which is selectable from 0.1 Hz up to 20 KHz. The DAT4540R also provides 2 relay outputs and a transistor output. The input can be from a Tacho, TTL, PNP transistor or from any Namur standard. The DAT4540R provides a Voltage or Current output that is isolated from the power supply and input.
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MOS Transistor Selector
UI9611
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Measure parameters: Open voltage UGS (th), internal resistance RDS, Transconductance gm, Withstand voltage V (BR) DS• Test range: UGS (th) 0.1-9.9V; RDS 0.001-9.999Ω gm; 0.10-10.00s; V (BR) DS 50-650V• Test current range: 0.1A-5A adjustable, comply with different working situation• Automatic selecting, out of limit alarming, advance the work efficiency• The technique of testing RDS under the big-current, is advanced technique
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
Programmable Power Supply
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Electronic Load System
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Electronic loads are required for testing fuel cells such as PEMFC, AFC, PAFC, MCFC, SOFC. These electronic loads are designed either in IGBT technology with power, current and voltage ranges according to specific requirements or in transistor technology. Electronic loads in IGBT technology are designed for high voltage ranges up to 900 V, current ranges up to 1000 A, and power ranges up to 480 kW.
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Simulation Models for Passive Components, Transistors, Diodes, etc.
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An indispensable collection of the industry''s most advanced simulation models for passive components, transistors, diodes and more. These reliable, measurement-based models maximize the RF/MW electronic design automation (EDA) process, reduce design cycle times, and lower product development cost. With a few EASY steps, the Modelithics Model Libraries are ready to use in EDA tools.
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Rebuilt Testers
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Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
