Showing results: 1 - 15 of 77 items found.
-
FilmTek CD -
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
-
Envision X84 -
Teledyne LeCroy
is the first combination C-PHY/D-PHY analyzer in single platform. The Envision X84 supports C-PHY/D-PHY and Cameral Serial Interface (CSI-2) and Display Serial Interface (DSI/DSI-2) on a single hardware platform. Envision X84 supports C-PHY version 1.1 and D-PHY 2.1 as well as CSI-2 version 2.1 and DSI version 1.3 and DSI-2 version 1.1. The Envision X84 offers Silicon ad device designers, integrators and validation engineers a complete, robust yet flexible tool to ensure the correct and efficient operation of Camera and Display over C-PHY and D-PHY implementations.
-
Dayton Audio
Designed for use with the Omnimic but is also useful as a standalone test CDGreat for setting amplifier gain levels19 test tracks
-
Protocol Manager™ Software -
Teledyne LABS
Teledyne LABS helps ensure the world’s pharmaceuticals are pure, safe, and effective by manufacturing instruments that set the global standard for quality, innovation, and long-term value. Software and software management play a large role in making sure those systems run as they should, and providing results that can be quickly analyzed and acted upon. Hanson software does so effectively and intuitively.Pharmaceutical research, manufacturing, and QC labs running Teledyne LABS Vision and/or CD14 dissolution testers can now manage users, methods, and instruments more efficiently than ever before. Our Protocol Manager software eliminates all instrument-based connectivity and storage limits by connecting your Hanson systems to a centralized protocol database on a Windows® client/server operating system. The spacious, easy-to-use, desktop interface provides drag-and-drop simplicity and increased support for 21 CFR Part 11 compliance.
-
CD series -
NF Corp.
The CD series is a phase detector module. It is possible to detect small level signal and signal buried in noise.
-
CD AutoPlus & CD AutoFill -
Teledyne LABS
The CD AutoPlus™ is a precision autosampling system with all-inert syringes, valves, tubing, and fluidics, designed for plug-and-play integration with CD14 Comparative Dissolution Testers. With 6 syringes (10 mL capacity) and a volume accuracy of ± 1% (0.1 mL), the CD AutoPlus easily accommodates sampling intervals under 5 minutes.The CD AutoPlus comes in two configurations, DissoScan™ and Maximizer™. Use the DissoScan with optional return-to-vessel (RTV) probes to recirculate rinse volumes, or the Maximizer™ for automated addition of dilutions or stabilizers, and its included media-replacement kit with low-evaporation vessel covers, 6 fixed probes (PEEK), and a 6-channel tubing harness.The AutoFill™ collector is a precision fraction collector built to seamlessly integrate with the AutoPlus™ to save space and to provide a 360 degree view for visual monitoring of the collection process.The CD AutoPlus (38 cm W x 66 cm D) when combined with the CD14 dissolution tester provides the smallest 14-vessel footprint in its class.
-
CS & CD -
Dwyer Instruments Inc.
Series CS and CD combine advanced design and precision construction in a small size. Unit is ideal for instrument panels, small compressors and general industrial applications. Visible set point and easy to wire SPDT snap switch reduce installation time. Operates in any position and is vibration resistant.
-
6360-HR-CD -
MicroSense, LLC
The Model 6360-HR-CD Stamper Thickness Measurement System is a semi-automated thickness gauging platform and data analysis system for the measurement of optical media stampers. Patented non-contact capacitive sensors determine the stamper thickness without any damage to the stamper. A personal computer is provided to run the gauging platform, acquire measurement data and display results.
-
Series CD -
Teledyne Defense Electronics Relays & Coax Switch
The CD series Solid-state Relay utilizes the latest technology to provide a low ON resistance. The control circuit is buffered to enable the relay to be driven directly from standard CMOS or open collector TTL logic circuits. Available options include short circuit protection and current overload protection or a status output line.MSL 1CD relays are controlled by 3.8-6VdcC = Through-hole mount SC = Surface mountAvailable options include:CD00CF 2A, 60Vdc LoadSCD00CF 2A, 60Vdc LoadCD01CF 2A, 60Vdc Load; control statusSCD01CF 2A, 60Vdc Load; control statusCD20CD 1A, 60Vdc Load; short-circuit protectionSCD20CD 1A, 60Vdc Load; short circuit protectionCD21CD 1A, 60Vdc Load; short-circuit protection & control statusSCD21CD 1A, 60Vdc Load; short circuit protection & control status
-
MOS-500. -
BioLogic
CD spectropolarimeter specifically optimized for both steady state and rapid kinetics applications. The CD spectrometer guarantees excellent performance: sensitivity, precision, speed and modularity from far-UV to NIR region.
-
Keisoku Giken Co., Ltd
Introducing a built-in type jitter meter that measures the jitter of CD players and DVD players.
-
Supracon AG
The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
-
InSight-450 3DAFM -
Bruker Optics
Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.
-
KT-2821 -
KILTER ELECTRONIC CO.,LTD
Display main parameter and sub-parameter. Test Parameter: L-Q,C-D,R-Q and Z-Q. Display mode:Direct measurement value,absoute deviation,percent deviation
-
VIT -
Frontier Semiconductor, Inc,
TSV profile (depth, top & bottom CD, tilt, SWA)-Residue Detection-RST-Copper Nail Height-Bump Height and Cu pillar height-Edge trim profile