System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Large Size RF Test Enclosure, ≥100 DB Isolation, 300 MHz - 18 GHz
dbSAFE MAX
Some applications require larger test environments. The dbSAFE MAX blends all the superior isolation characteristics of the standard dbSAFE DUO shielded box into a larger volume to guarantee you get better results.
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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Spectrum and Signal Analyzer Frequency Extension Systems
SAE
The SAE modules are designed to interface with your existing microwave signal or spectrum analyzer and extend its frequency coverage to 500 GHz.
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Fully Automatic Tensile Testing System
This is a fully automatic tensile testing system for metals. The system is fully automated from supply of specimens, measurement of specimens, tensile testing, recovery of specimens, and data processing, and is capable of continuous nighttime testing.
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Fuse Lead Automotive DMM Test Leads
134
*ATC Fuse Holder In-Line *Provides extra overload protection *Can prevent your DMM’s internal fuse from blowing *For use with any Digital Multimeter
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Reach-In Humidity Test Chamber
The Humidity Test Chambers from Weiber are corrosion test chambers that are used to simulate high or low humidity conditions for testing the rust preventing capacity of various oils and greases. These high low humidity simulation chambers find wide spread usage in research organizations, educational institutions and industrial units and are most commonly employed by petroleum and chemical industries.
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Immunity Development System
Used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken.
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Automatic Power Control system
The Automatic Power Control system cuts the incoming power supply to a traction unit for short periods. This is required where power supplied from one part of a power distribution system in separated from another by a neutral section. Its fitment prevents damage to the power distribution system or the vehicle.
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Non-Contact High-Precision Proximity Measuring System
KD-2446
Kaman Fuzing & Precision Products
* Outstanding precision: static resolution to 12 microinches* Excellent performance with ferrous targets* Variable voltage input from 12 to 24 volts DC* Compact rugged electronics and sensors* Adjustable gain for up to 22 volts output (with 24 Vdc input)* Temperature tolerant sensors (to 400°F)* High speed (10 KHz) level adjustable switched output for process control* Very low switching hysteresis, < 1% on ferrous targets* RoHS compliant
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PV Test Solutions
High-speed and high-accuracy measurement of solar cell I-V characteristics in three modes
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ARINC825 (CAN Bus) Test & Simulation Module for VME With 4, 6 Or 8 CAN Bus Nodes
AVC825-x
ARINC825 (CAN bus) Test & Simulation Module for VME with 4, 6 or 8 electrically isolated CAN bus nodes operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s. The AVC825-x VME card can work either with full functionality as an active CAN node for testing and simulating or in Listening Only mode for monitoring and recording purposes.
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DDR4 Parametric Test Reference Solution
Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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D-Mic Testing System
BK3012V2
Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
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Luminescence Defect Inspection System
INSPECTRA® PL Series
This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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Subsea Pipe Detection & Tracking System
HydroPACT 440
The HydroPACT 440 pipe detection system has been established for a number of years as the industry standard, providing accurate and reliable survey data, which provides the position of conductive assets on or beneath the seabed. The system is flexible in its range of uses and can be installed on a variety of vehicles for undertaking survey work.It provides a reliable and simple method for performing accurate submarine surveys on a conductive target such as a cable or pipe.
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Neonatal Test Equipment
Our lineup of neonatal test equipment is a complete NICU quality assurance solution to ensure infant safety.
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Test Module
FailSim
FailSim simulates a faulty component and allows the user to quickly and simply improve the actual fault detection of a test program. The result represents a definitive conclusion for tested or untested components.
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EBIRST 78-pin D-type Test Tool
93-006-001
The 93-006-001 eBIRST 78-pin D-type test tool is part of a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Real-Time Content Monitoring System
ORION
Interra Systems' ORION is a real-time content monitoring system that enables service providers to deliver error-free, superior quality video. ORION provides real-time monitoring of IP-based infrastructures that looks at all aspects of video streams such as QoS, QoE, closed captions, ad-insertion verification, reporting and troubleshooting. ORION performs critical monitoring functions on hundreds of services simultaneously from a single platform, providing an operator with a single point of visib...show more -
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Pneumatic Bump Test Machine
KRD20 series
The KRD20 series pneumatic bump test machine replaces the traditional mechanical cam-type crash bench and is suitable for repeated impacts on electronic components, equipment and other electrical and electronic products during transportation or working.
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Equipment Front End Module (EFEM) Class 1 Minienvironment System
MiniMax™
Genmark’s MiniMax™ Equipment Front End Module (EFEM) is a class 1 minienvironment system designed to maximize productivity of semiconductor processing equipment tools that require the highest level of automation.The MiniMax™ can be customized to meet the automation requirements of any semiconductor manufacturing tool application and specified with one of the Genmark’s sophisticated and precise wafer and reticle handling robots, including the full line of patented GPR single or dual arm robots, GREX robot series, single and dual wafer aligners, FOUP/FOSB openers, reticle libraries, as well as any other customer specified equipment.
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Test Package
Shenzhen Bonad Instrument Co., Ltd.
We can provide a variety of different specifications of freezing load test packages, including AHAMHRF-1 2007/ SASO 2664-2007 Sawdust freezing test package, AS1731.4-2003 Australian frozen Load Test Package, AS72-2005 North American Commercial Refrigeration Load Simulation Test Package, IEC 62552 Test Package for Freezing Load Testing in Refrigerators. In addition, we can also provide customization according to test requirements. For more information, please contact us, BONAD will provide you with professional technical advice and high-quality testing equipment.
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Semiconductor Test Software Solutions
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Vibration Measuring System
SmartVibro
There are many functions to express characteristics of vibration. However it is necessary for the conventional vibrometers that the same point is measured plural times switching objective functions one by one. SmartVibro which has a simultaneous measurement function can measure Acceleration, Velocity and Displacement simultaneously by just pressing the measurement start key one time. It can reduce the operating time and prevent miss-measurements. By switching the screen, VM-4424S・VM4424H can confirm Acceleration Envelope for bearing condition which enables small scars to be found easily.
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Various Types of Automatic Hardness Testing System
Various Types of Automatic Hardness Testing System
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Regenerative Power System
IT6000B Series
From the perspective of improving customer experience, ITECH launches a new incorporated product--IT6000B series. IT6000B integrates bidirectional power supply and regenerative electronic load into one 3U unit. It is also a very powerful one. Only a button is needed to switch between the bidirectional power supply and the regenerative electronic load.
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System Trace Emulators
XDS560v2
The XDS560v2 System Trace Emulator is the second generation of the XDS560-class emulator design from Texas Instruments. It provides cost effective real-time emulation, debugging, and high-performance System Trace (STM) for Texas Instruments devices over both USB and Ethernet PC interfaces.
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Test Lead Holder For Wires Up To 0.450In (11.43mm) Dia.
2708
Test Lead Holder for Wires Up to 0.450in (11.43mm) Dia.
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