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IDA Electrodes
Interdigitated Array (IDA) electrode is an electrode developed for electrochemical measurements to be performed in a very small quantity of the sample. IDA electrode could be applied for the detection and reaction analysis of the compounds in a small quantity of the sample. IDA electrode is a microelectrode pattern fabricated by using the lithography technology. The Electrodes are composed of 65 pairs. In each one of the pair has a function of the oxidation and reduction electrodes.
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Reverberation Tent
This product is a chamber made of metal flexible fabric tent assembled as a cavity that provides a periodic electro-magnetic environment randomly polarized, spatially uniform, and isotropic.
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Leather Thickness Gauge
Crockmeter UI-TX50
Crockmeter (Crock Meter) is used to test color transfer of colored textile (leather, fabric and etc,) to other surface due to rubbing. It is test of colour fastness to rubbing, one of physical testing of textiles.
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Wireless Functional Test Fixtures
Circuit Check’s wireless fixture technologies reduce debug time, simplify ECO’s and reduce maintenance. This allows for the highest test performance, ability to probe denser smaller targets and achieve ultra-high node counts. Higher density more complex circuit boards complicate testing requirements. Smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board (T-Board).
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Circular Sample Cutter
TF513A/C/D
TESTEX Testing Equipment Systems Ltd.
A circular Sample Cutter or circular sampler, a fabric sample cutting machine, is a kind of equipment used to cut all kinds of wool, cotton, chemical fiber, knitting, and other fabric round samples. This GSM Cutter cuts fabric samples in various dimensions, such as 100cm2 for the Martindale test. The cutting pad is made of porous rubber, which allows GSM Round Cutter to cut into the base with complete safety. We are professional GSM cutter manufacturers. Our fabric gsm cutter price is reasonable.
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Wyzenbeek Abrasion Tester
TF212
TESTEX Testing Equipment Systems Ltd.
Wyzenbeek Abrasion Tester，to determine the abrasion resistance of fabrics when rubbed against a standard abradent or a wire mesh screen with a backward and forward motion over a curved surface. Wyzenbeek Machine complies with ASTM D4157, etc. Please contact us for more information about Wyzenbeek methods.
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Magnetism Detector DET
432
The MAC Magnetism Detector is widely used by steel suppliers and fabricators to determine residual magnetism in iron and steel objects.
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144-lane, 72-port, PCI Express
PEX89144
The new PCIe Gen 5.0 (32 GT/s) PEX89000 series builds on the longevity of the Broadcom series of switches, now spanning 13 families. The PEX89000 family allows customers to build systems from simple PCIe connectivity inside the box to high-performance, low-latency, scalable, cost-effective PCIe fabrics for composable hyperscale compute systems supporting ML/AI and Server/Storage applications.
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Moisture Management Tester
TF128
TESTEX Testing Equipment Systems Ltd.
Moisture Management Tester, to measure the dynamic liquid transport properties of textiles such as knitted and woven fabrics in three dimensions
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Fiber Manufacturing
From preform fabrication to final quality control, our fiber test instruments are designed to provide a complete end-to-end solution for all of your testing needs. Our technology is so widely used that virtually all fibers produced globally encounter multiple PK instruments before leaving the factory.
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Shrinkage Template Scale
TESTEX Testing Equipment Systems Ltd.
Shrinkage Template Scale, suitable for all shrink testing standards. Shrinkage Template Scale complies with AATCC 135/150/160/179, BS EN 3759, ISO 3759, etc. Welcome to contact us if you have any problems about fabric shrinkage test method.
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Crease Recovery Tester
TF110
TESTEX Testing Equipment Systems Ltd.
Crease Recovery Tester, to determining recovery properties of fabrics by creasing in a loading device for a predetermined time using a weight suitable for the test method specified (BS/ISO/AATCC), After transferring the specimen to the clamp of the tester, the specimen is allowed to recover and the angle of recovery recorded. Fabric Crease Tester complies with ISO 2313, AATCC 66, BS EN 22313， etc.
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L-Band RF Tuner and 2-Channel 200 MHz A/D with Virtex-6 FPGA - XMC
Model 71690
- Accepts RF Signals from 925 MHz to 2175 MHz- Programmable LNA boosts LNB (low noise block) antenna signal - levels with up to 60 dB gain- Programmable analog downconverter to I + Q baseband signals - 4 to 40 MHz bandwidth- Two 200 MHz 16-bit A/Ds digitize the I + Q signals synchronously- Supports Xilinx Virtex-6 LXT and SXT FPGA- 2 GB DDR3 SDRAM or 32 MB of QDRII+ SRAM- Sample clock synchronization to an external system reference- PCI Express (Gen. 1 & 2) interface, up to x8- Clock/sync bus for multimodule synchronization- VITA 42.0 XMC compatible with switched fabric interfaces- Optional user-configurable gigabit serial interface- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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VPX / Open VPX Backplanes
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. Open VPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
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FTB Ecosystem
Imagine test tools that actually help you deliver services with speed and quality. Imagine if you could institutionalize operational efficiencies, eliminate silos and make every component of your deployment, turn-up and monitoring part of one tightly woven fabric.
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RF Shielding Services
LBA offers complete architectural RF shielding capabilities, including RF shielding for communications, medical and other radio frequency interference sensitive facilities. LBA is a major provider of architectural shielding solutions for buildings, laboratories and other spaces. LBA also offers other RF shielding materials, such as paints, fabrics and faraday cages, as well as an integrated line of shielding components to provide a comprehensive shielding system.
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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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Brush or Sponge Pilling Tester
TF222
TESTEX Testing Equipment Systems Ltd.
Brush or Sponge Pilling Tester, to determine the pilling propensity and simulate normal wear of knitted and woven fabrics used in apparel and automotive interiors by brush and/or sponging specimens together in a circular motion to form pills. Specimens are evaluated under standard lighting conditions using a pilliscope, light cabinet or similar, against users’ standard fabrics or piling photographs.
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Fabric Tactile Tester
DRK549A
Shandong Drick Instruments Co., Ltd.
Fabric feel style is not only one of the important evaluation indexes of textile comfort, but also an important factor affecting textile sales. Therefore, textile feel style measurement instrument has always been the research direction of textile science and technology.
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Bursting Strength Tester
TESTEX Testing Equipment Systems Ltd.
Bursting Strength Tester is used to test the strength of bursting for fabric. When you do bursting test, mullen burst tester is a wise machine for you.
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Highly Accelerated Life Testing (HALT)
Quickly validate reliability and identify manufacturing defects that could cause product failures in the field with MET’s Highly Accelerated Life Test (HALT)HALT technique uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages, which improves product reliability and customer confidence inherent to the design and fabrication process of a new product as well as during the production phase to find manufacturing defects that could cause product failures in the field.
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ICI Pilling Box Tester
UI-TX05
ICI Pilling Box Tester is used to assess fabric surface pilling and fuzzing by tumbling randomly. This pilling test machine is also called as ICI pilling and snagging tester/ICI pilling box. ICI pilling box test method includes ISO 12945.1, BS 5811, GB/T 4802.3, JIS L1076, etc.
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Mezzanines
Our mezzanines are available with fiber optic or electrical outputs and enable a high-degree of signal processing options and high data rates. Mezzanine electrical interfaces may be software defined for even more versatility and signal inspection/processing options. These mezzanines are interoperable with similar fabric building blocks that have a compatible mezzanine site for low-risk processing, subsystem pre-integration.
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Powered VXS Crates
6U VXS 6023-JL
The WIENER VXS 6023 crate series adds high performance Switch Fabrics according to VITA 41 specification to VME based systems. Designed primarily for high speed applications in data acquisition, as well as military / aerospace test and instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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Wafer Bonder
AML
Wafer bonding has found many applications in the field of MST, MEMS and micro engineering. These include the fabrication of pressure sensors, accelerometers, micro-pumps and other fluid handling devices. The process is also used for first-order packaging of silicon microstructures to isolate package-induced stresses. The OAI AML Wafer Bonder facilitates both the alignment and bonding to be performed in-situ, in a high vacuum chamber. For anodic bonding the wafers are loaded cold and heated in the process chamber. For high accuracy alignment the wafers are aligned and brought into contact only after the process temperature has been reached, thus avoiding differential thermal expansion effects which can compromise alignment. The AML Wafer Bonder is excellent for anodic bonding, silicon direct and thermal compression bonding applications. These features enable the bonder to be used with virtually any processing tool.
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UV Accelerated Weathering Testers
Dongguan Amade Instruments Technology Co., Ltd
UV accelerated weather tester is also well known as UV test chamber, which is a type of environmental test chamber using fluorescent UV as light source to determine the resistance of plastics, leathers, rubbers, fabrics and so on to weathering under the specified conditions. We know that Ultraviolet light only accounts for 7% of the total sunlight, but it plays a core role in deterioration of materials. Not only does the ultraviolet, but UV test machine also can simulate dewing, high temperature, high humidity, black environment to be reappeared as a circulation. So UV weathering test is an essential measure for people to research and know the degradation state of specimens in advance as the time goes on.
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Calibration Services
For over 25 years, OAI (Optical Associate Inc.), is the leader in NIST traceable calibration of instruments for measuring Ultra Violet (UV) light. Originally designed to meet the demanding needs of the semiconductor wafer fabrication industry, OAI developed the most repeatable NIST traceable calibration in the industry.
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ICI Mace Snag Tester
TF220
TESTEX Testing Equipment Systems Ltd.
ICI Mace Snag Tester. To determine the tendency of fabrics to snag (pull yarn loops from fabric) in normal wear (mace snag).Provided with 4 rotating test cylinders fitted with sleeves of test fabric, mace balls with tungsten carbide points and controlled by a predetermined electronic counter.
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Flying Probe Electrical Testers
Gardien has been present in the PCB industry since the advent of the personal computer. In our beginning Mania, the company that pioneered some of the first electrical grid testers used by PCB fabricators. We still produce class leading equipment to this day, such as our line of Gardien Flying Probe Testers and our Acceler8 Scanning System.
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3rd Gen MicroTCA Carrier Hub (MCH), Double Module, 40/10GbE/PCIe/FPGA/SRIO
UTC006
The VadaTech UTC006 is a double module, MTCA.4 format, MCH with front-panel fabric expansion and RTM support (PCIe optiononly). Fabric options include PCIe Gen3, 10/40GbE, Xilinx Virtex-7 FPGA, Cross Bar Switch (CBS), and SRIO.
