Si
atomic number 14 tetravalent metalloid chemical element.
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Product
Si Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Product
16-element Si photodiode array
S12362-321
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The S12362/S12363 series is a back-illuminated type 16-element photodiode array specifi cally designed for non-destructive X-ray inspection. These are modified versions of our previous products (S11212 series: 1.575 mm pitch). The pitch has been changed to 2.5 mm. The back-illuminated photodiode array is also simple to handle and easily couples to scintillators without having to worry about wire damage because there are no bonding wires and photosensitive areas on the back side.
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Product
RF Front-end
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The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Product
Signal Integrity Studio, Analysis & Simulation SW for WAVEPULSER High-Speed Interconnect Analyzer
WavePulser-Signal Integrity (SI) Studio
Analyzer
WavePulser Signal Integrity (SI) Studio is included as a single license in the WavePulser 40iX-BUNDLE or can be purchased as an additional license for offline access to additional users. WavePulser Signal Integrity (SI) Studio combines S-parameter, Impedance profiling and de-embedding measurements, channel and equalizer modeling, eye diagrams and jitter analysis in a single affordable software package for emulating the complete serial data channel.
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Product
KV CAPS
1000 V
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Macom Technology Solutions Holdings Inc.
The MACOM KV CAPS™ Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available in surface mount (SMT) plastic packages or in hermetic ceramic packages.
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Medical Device Calibration
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Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Flow Calibration
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Trescal provides full Flow Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Flow Calibration services can be delivered at your site or at our lab. Accreditations for our flow calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Electrical Calibration
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Trescal provides full Electrical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Electrical Calibration services can be delivered at your site or at our lab. Accreditations for our electrical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
4-Port Serial Interface
APCI-7500-3
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This Model has a 37-pin D-Sub male connectorRS232, RS422, RS485, 20 mA Current LoopModular structure through SI modulesWith or without optical isolationMode configuration free for each port128-byte FIFO-buffer, common interruptTransfer rate programmable up to 115,200 BaudOption: up to 1 MBaud for RS485 and RS422Automatic direction recognition for RS48Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)Transmission mode asynchronous, full, half duplexTransfer rate: progr. up to 115.2 kBaud up to 1 MBaud on requestProtocol: 5, 6, 7 or 8-bit character 1, 1? or 2 stop bitsParity: even, odd, none, mark or spaceInterrupt lines: automatic through BIOS
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
GaN Power Amplifiers > 5W
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Macom Technology Solutions Holdings Inc.
MACOM GaN RF power amplifier solutions are designed with the latest GaN-on-SiC and GaN-on-Si technologies. Our MACOM PURE CARBIDE series of GaN-on-SiC power amplifiers offers high performance and reliability for the most demanding applications. Our expanding GaN portfolio is designed to address the challenging requirements of Aerospace & Defense, Industrial, Scientific and Medical applications and 5G wireless infrastructure. MACOM GaN products deliver output power levels ranging from 2 W to over 7 kW and exhibit best in class RF performance with respect to gain and efficiency. For sensitive Aerospace & Defense applications MACOM can offer a US only supply chain with AS9100D Certification.
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Product
Hardness Calibration
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Trescal provides full Hardness Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Hardness Calibration services can be delivered at your site or at our lab. Accreditations for our hardness calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Magnetic Susceptibility Meter
SM-20
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The SM-20 magnetic susceptibility meter is very useful tool for a number of geological and geophysical applications where the unique sensitivity of 10-6 SI units together with its small, shirt-pocket size and low weight are appreciated.
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Product
MPI PCB Probe Systems
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MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Product
1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
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This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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Product
General Purpose Geiger Counter
Radalert® 100X
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The Radalert® 100X is a general purpose geiger counter that measures alpha, beta, gamma, and X-radiation. Features of the Radalert® 100X, include a three-second update and a Utility Menu that allows you to change the default settings for several operating parameters. Its digital liquid crystal display (LCD) shows the current radiation level in your choice of SI units (microsieverts per hour) from .000 to 1,100 and counts per minute (CPM) from 0 to 350,000 or counts per second (CPS) from 0 to 3,500. For users of conventional units mR/hr (milliroentgens per hour) from .000 to 110 and CPM are optional in the Utility Menu. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours.
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Product
Ultra-Low Noise 2 kHz Photoreceiver w/ Si-PIN Photodiode
PWPR-2K-SI
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Picowatt Photoreceiver series PWPR-2K with switchable gain (10 to the 9th V/A, 10 to the 10th V/A) and a bandwidth from DC to 2 kHz is the perfect choice for cw-measurements, time resolved signal acquisitions and highly sensitive modulated measurements. Si and InGaAs models cover the wavelength range from 320 to 1700 nm.
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Product
RS232 Mode SI-module With Optical Isolation
MX232-G
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RS232 mode SI-module with optical isolation
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Product
RS422 Mode SI-module With Optical Isolation
MX422-G
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RS422 mode SI-module with optical isolation
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Product
Force Calibration
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Trescal provides full Force Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Force Calibration services can be delivered at your site or at our lab. Accreditations for our force calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Pressure Calibration
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Trescal provides full Pressure Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Pressure Calibration services can be delivered at your site or at our lab. Accreditations for our pressure calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
General Purpose Radiation Survey Meter/Geiger Counter
Rad 100™
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The RAD 100™ is a general purpose radiation survey meter/geiger counter that detects and measures alpha, beta, gamma, and X-radiation. It is intended for personal safety and educational purposes. Like the popular Radalert® 100X, the RAD 100™ features a 3-second update on its digital liquid crystal display (LCD). The LCD shows the current radiation level in your choice of microSieverts per hour (SI units) or mR/hr for gamma radiation measurements. For mixed sources (alpha, beta, gamma) the CPM mode is recommended. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours. A red LED blinks and a beeper chirps with each count (the chirp can be muted). This is a professional instrument that is also easy to learn to use and to operate, and carries the industry leading Medcom warranty (2 years overall limited to 1 year on the GM sensor). Many instruments designed by the Medcom team are still working perfectly after 30 years of use, so this instrument should provide a lifetime of useful information.
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Product
Temperature Calibration
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Trescal provides full Temperature Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Temperature Calibration services can be delivered at your site or at our lab. Accreditations for our temperature calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Scanning Slit Beam Profilers
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DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Product
Schottky Mixer and Detector Diodes
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Macom Technology Solutions Holdings Inc.
Schottky diodes are majority carrier diodes formed by plating a layer of metal on a layer of doped semiconductor, which forms a rectifying junction. The type of metal and the type of dopant in the semiconductor determines the diode’s barrier height, which is a measure of the amount of energy required to force the diode into forward conduction. MACOM produces Si Schottky diodes as well as GaAs Schottky diodes for use as signal detectors or in frequency mixers.
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Product
Velocity Calibration
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Trescal provides full Velocity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Velocity Calibration services can be delivered at your site or at our lab. Accreditations for our velocity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Radiometry Calibration
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Trescal provides full Radiometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Radiometry Calibration services can be delivered at your site or at our lab. Accreditations for our radiometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
