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Analytical Services
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IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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WAFERMAP
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WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Leading Edge Sensors
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The LaserGauge® Leading Edge Profiling System consists of a handheld or benchtop sensor and the Leading Edge software application. Designed to scan both sides of the blade simultaneously, the sensor returns a complete profile around the radius of the blade, which allows accurate measurements of the thickness and the plotting of the blade profile for comparison to its engineering design.
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High-Performance [Liquid Chromatograph Mass Spectrometer
LCMS-2020
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LCMS-2020 is optimized for the Prominence UFLC/UFLCXR Ultra Fast Liquid Chromatograph. Novel patent-pending technologies offer significantly enhanced scan speed and positive-negative ion polarity switching time, which are essential for UFLC, and simultaneously boost sensitivity. The instrument combines the excellent compound selectivity that is a feature of the mass spectrometer with significantly enhanced total productivity – from method development to analysis. The LCMS-2020 plays a useful role in a range of fields, including the synthesis of compounds in the pharmaceutical and chemical industries.
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Product
JTAG Live Controller
Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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Mass Spectrometry Solutions
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Discover new ways to apply mass spectrometry to today’s most pressing analytical challenges. Innovations such as Trapped Ion Mobility (TIMS), 10kHz scanning lasers for MALDI-MS Imaging that deliver true pixel fidelity (10 um spatial resolution), and eXtreme Resolution FTMS (XR) technology capable to reveal Isotopic Fine Structure (IFS) signatures are pushing scientific exploration to new heights. Our mass spectrometry solutions enable scientists to make breakthrough discoveries and gain deeper insights.Our industry leading software solutions such as SCiLs Lab for MS Imaging, FDA cleared microorganism reference library for the MALDI Biotyper, Biopharma Compass 2.0, and Toxtyper are examples our solutions doing the work for you. Bruker's product lines include the following technologies: FTMS, rapifleX MALDI-TOF/TOF, MALDI Biotyper Systems, timsTOF UHR-QTOF, Toxtyper, Triple Quadrupole, HDX Solution, ToxScreener, PesticideScreener
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Metrology/SEM
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Our SEM products use scanning electron microscope technology to measure and review tiny surface structures such as photomask etching and circuitry on wafers with high precision and stability.
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Product
16-bit, 100KHz, 16SE/8DIFF A/D Inputs; 8 14-bit, 30KHz D/A Outputs, 4 24V Digital I/O, All Isolated
CPCI-3120-16-8
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Input range:?± 10 V, 0-10 V software programmable0-5 V, ± 5 V, 0-2 V, ± 2 V, 0-1 V, ± 1 V (gain)0-20 mA (option) ? software-programmable amplifier:PGA x1, x2, x5, x10 ? Conversion triggered through software,scan, timer, external event ? Onboard FIFO buffering for 256 analog values ? Data exchange through 16-bit I/Oor 32-bit memory (PCI DMA) ? Sequence RAM ? Overvoltage protection ? input filter: 160 kHz
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Product
Stud-Metal-Wire-Detector
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With the procedure of scanning and marking from 2 sides, this detector will automatically find the distance of 60 x 60 x 20mm stud (deep mode: ≥2cm, standard mode: ≥1.5cm) detect distance of 20 x 1500mm pipe (deep mode: ≥3cm, standard mode: ≥1.5cm) detect AC electrification 90~380V, 50~60Hz cable (deep mode: ≥3cm)
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Product
Scan To CAD
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Scanning or hard probing, large or small, we have a large arsenal of hardware & software to fit our clients’ needs. With all the reference data coming directly from the CAD model this eliminates any human error that would have come through manually entering nominal information.
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Sensors
Contour Probe
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Contour tracer in a coordinate measuring machineMeasurement in workpiece coordinatesCapable of scanning in any directionMicro and macro structures can be measuredCalibration of optical measurements
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PXI Switch - 4x8 2-Wire Matrix Module
PXI-7931
Matrix Switch Module
ADLINK PXI-7931 is a matrix module with 32 cross-point 2-wire relays (DPDT, 2 Form C). The default configuration of the PXI-7931 itself is a 4-group 2x4 2-wire matrix. With the termination board, TB-6231, users could flexibly choose one of the configurations: one 4x8, two 4x4, one 2x16, two 2x8 and four 2x4. Any contact of the PXI-7931 can connect to other contacts, individually or in combination. The PXI-7931 matrix module simplifies the wiring and makes it easy to change the internal connection path. The contact position of the relays can be changed either by direct software commands or by following the instructions previously stored in the on-board scan list. The scan list advances upon the trigger from external measurement devices, such as a DMM. The scan list could also advance when the scan-delay timer expires. In the PXI-7931, PXI trigger functions are supported and software programmable. Multiple modules can therefore be synchronized without additional field wiring.
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Manufacturing Test Station
Scan Executive
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The Scan ExecutiveTM Manufacturing Test Station is used to apply the same IEEE 1149.1 tests that were developed and used in the lab in a high-volume manufacturing environment without requiring additional development.
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Line Scan Camera
Linea
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Introducing Linea, a CMOS line scan camera that can help you improve your imaging and lower your costs. Linea starts with an advanced CMOS sensor with high quantum efficiency and low noise for better images. Linea is also packed with advanced features to make your machine vision job almost effortless.
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Flexible AFM
SA-AFM
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The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Product
Universal Cable/Harness Tester
LX-686
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Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·256 Max. Test Points , (Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Arc detection level 0-9 ,auto prompt．·Adopted high resolution colour 640*480 TFT LCD ,．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,．·Full Programming Sequence Test ,．·Versatile I/O Ports for application ,．·Statistics and Print Function,．·Provide REMOTE interface, communicate with PLD auto test fixture,．·Provide personalized customization according to different requirements,
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Reverse Engineering 3D Scanner
peel 3.CAD
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peel 3.CAD is your go-to fully integrated 3D scanning solution for all your reverse engineering needs. Extract all the information you need and send them right to your preferred CAD software.
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Phoenix Camera Link Frame Grabber (D48-PE1)
AS-PHX-D48CL-PE1
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Phoenix-D48CL x1 is a PCI Express board for the acquisition of digital data from a variety of Camera Link sources, including digital frame capture and line scan cameras. It supports all the formats of the Base and Medium configurations, i.e. single 8- to 16-bit data, through 12-bit RGB, to four tap 12-bit sources, as well as dual Base configuration, i.e. acquisition from two asynchronous Base cameras.
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PANELMAP
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PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Special Development AFM Tips ...
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AFM Cantilevers and material variations. Ultra-Short AFM Cantilevers: 1) Ultra-Short Tipless AFM Cantilevers 11 (for High Speed Scanning). Diverse (AFM related)
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Product
Lan Cable Tester
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Shanghai Beha Electronics Co., Ltd.
Designed for RJ45/RJ11 modular cables, 10/100 base-T cable and Token Ring cable etc.• The Lan cable tester can verify cable continuity, open,short circuit and miss-wired.• The remote receiving unit is available for installed cables far away either on the wall plates or on the patch panels.• Auto and manual scan function.• Ground wire test.• Lock status function.• Buzzer sound warning for wire status.• Display: LED indication for wire status.
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Automated Optical Inspection System
AOI Series
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Perform visual inspections of printed circuit boards (PCB) during manufacturing in which a camera is used to scan the board in extremely fine detail to check for any defects or failures.
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Scanning Electron Microscope w/ EDX Laboratory
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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AWS Probes For Ultrasonic Weld Seam Testing (ASTM)
SONOSCAN R
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The robust ultrasonic probes with BNC connector allow a fast scanning over comparatively large areas with high precision and repeatability. Both our own and third-party wedges can be attached to our probes. . Thanks to the different types of wedges various material tests can be performed.
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Laser Raman Microscopy System
RAMANforce/RAMANtouch
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Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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Laser Scanner
FARO Focus3D
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The smallest and lightest laser scanners on the market - Focus3D X Series are ideal tools for indoor and outdoor applications. The fast and accurate laser scanners Focus3D offer everything you might expect from professional 3D laser scanners with FARO's established and well-known level of simplicity. Focus3D X 330 offers extra long range - 330m, Focus3D X 130 is a mid-range device offering precise scanning up to 130m. Both scanner models are equipped with GPS and offer the possibility to perform scanning even in bright sunlight. Remote scanning as well as almost limitless scan data sharing via SCENE Webshare Cloud make the laser scanning solution truly mobile.
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Autonomous Pulsed Doppler Wind LiDAR System
Galion
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The Galion LiDAR, distributed by SgurrEnergy, has been optimised for collecting data for wind power applications. The all-sky scanning capability enables many more data collection opportunities than VAD scanning alone.
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Satellite Signal Level Meter
Super Buddy
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Complete more installs faster and better using the Super Buddy satellite finder meter. Be "sure of your bird" with the positive ID feature or use the automatic scan to identify the unknown satellite. The Super Buddy's geo-sensitive "Field Guide" shows you just the birds visible to your install -- ALL of them, with their individual transponders. The Super Buddy even gives the elevation and azimuth for whichever satellite you select.
