Wafer-Level 1/f Noise Characterization System

Wafer-Level 1/f Noise Characterization System

9812DX provides a true 10 megahertz (MHz) bandwidth for accurate on-wafer noise measurement and user can also measure very low-frequency noises starting at 0.03Hz. 9812DX has the lowest system resolution for on-wafer measurement at 1×10-27A2/Hz, a 10X+ improvement over 9812D. It enables noise measurement of extreme low DC current at 0.1nA, a requirement for advanced designs that need to bias devices at weak inversion conditions, dark current noise of photodiodes or image sensors for many consumer, communication, automotive and industrial applications. Additionally, it handles high-voltage device operations up to 200V and a wider range of measurement conditions and device types. Those include bulk MOSFET, FinFET, FD-SOI, bipolar junction transistors (BJTs) and junction field effect transistors (JFETs) and various diodes, such as photo, laser and Zener diodes, wide range of resistors (10 to 10M ohm), including voltage-controlled resistors, and integrated circuits (ICs). 9812DX is the only system on the market that supports a complete range of impedance for both high and low impedance devices and works with the most advanced technology nodes, from 16-nanometer (nm) and 14nm to 10nm and 7nm technology development.

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