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Wafer AOI

Wafer AOI

*Infrared illumination - transmitted light and reflected light.
*Higher throughput.
*Non-destructive inspection of the wafer''s surface and interior.
*Automated reading of wafer identification and pre-alignment parallel to inspection.
*Direct identification of each wafer by code reading (barcode, data matrix code, OCR).
*Automatic loading and unloading.

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