Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications

Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications

Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.

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