Discrete Component Tester

XP-8500 - Lorlin Test Systems (Lorlin Test Systems)

Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.

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Discrete Component Testers
Component Testers
Component
Testers
Power Test Systems
Production Test Systems
Automatic Test Systems
Discrete Semiconductor Testers
Component Test
System Test