X-ray Diffraction and Elemental Analysis

NANOSTAR - Bruker Optics (Bruker)

In fact, the NANOSTAR analyzes pure sample properties, even for non-isotropic sample systems. The modular design permits setting the detector-to-sample distance from 11.5 mm up to 1070 mm. Hence, the entire range from SAXS to WAXS can be covered in combination with the Image Plate (IP) option simultaneously.