Advanced Film Analysis System

NanoSpec® II - Nanometrics Incorporated

Extending the range and performance of the industry proven NanoSpec series, the NanoSpec II introduces a new design with automated sample alignment, fast autofocus and measurement repeatability better than 1Å*. The system can be incorporated with Nanometrics’ spectroscopic reflectivity analysis software, image processing for automated pattern alignment and various optical configuration options, making the NanoSpec II automated the most powerful thin film system in its class. The NanoSpec II is fully compatible to material cards of previous generations of Nanospec products. Additionally, many dispersion models created by Woolam® ellipsometers can be imported and used without conversion.