This product is no longer listed

MEMS Wafer Fully Parametric Automatic Test System

MEMS Wafer Fully Parametric Automatic Test System

If you are in the development and manufacture of MEMS (microelectromechanical systems) wafer, then you need a test system to measure whether the chip wafer reaches your design requirements. In addition to the test system used to connect the chip pin probe station outside, still need a variety of instruments used to measure the dynamic parameters and static parameters of the wafer. In addition to these hardware devices, for volume manufacturing, the automation of the measurement is also very important aspect.

Get Help