SPEA S.p.A.

Since 1976, SPEA has been engaged, with creativity and innovation, in designing and manufacturing the best test equipment for microchips and electronic boards.

  • +39 011 9825 400
  • +39 011 9825 405
  • info@spea.com
  • Via Torino, 16
    Volpiano (TO), 10088
    Italy

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Showing results: 1 - 8 of 8 items found.

  • Flying Probe Testers

    SPEA S.p.A.

    SPEA’s Flying Probe Testers help manufacturers of printed circuit boards to deliver top-quality products in the fastest time-to-market, avoiding fixture cost and increasing accessibility when compared to bed-of-nails testers.

  • Smart Card Module Test Cells

    SPEA S.p.A.

    Current and voltage measures are executed on defined pins, in stable conditions.Measurements:- Open/short- Input leakage current- IDD Supply instant/average current test (static/dynamic mode)- Input capacitance @13 MHz and inductance- Retro modulation index (RMI)Test of passive devices:- Capacitors- Resistors- Resonators

  • Analog Mixed Signal Testers

    SPEA S.p.A.

    - PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz

  • Operating System Software

    ATOS C2 - SPEA S.p.A.

    Comptest MX systems performance are complemented by the powerful ATOS C2 operating system. ATOS C2 sets new standards for the test development process, for the use of the system in production and for the maintenance operation management.

  • Power Module Test Cells

    SPEA S.p.A.

    SPEA’s Power Module Test Cells are the complete industrial equipment oriented to the production test requirements of IGBT semiconductor power modules for consumer, transportation, energy production, industrial applications.SPEA’s Power Module Test Cells provide a turnkey solution for the automated handling, contacting and testing of these products, with the capability to force and measure the very high current (up to 1000 A) and voltage (up to 2500 V) values required for a complete, reliable test.

  • Sensors Test Cells

    Integrated MEMS - SPEA S.p.A.

    The best technical performance, cost optimization, one-shot factory integration.A single unit integrates the modules for the handling, contacting and complete testing of MEMS devices, including the physical stimulus for functional test, and the tri-temp thermal conditioning.

  • MEMS Device-Oriented Testers

    SPEA S.p.A.

    Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.

  • Smart Card Testers

    CT1000 - SPEA S.p.A.

    The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.

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