Showing results: 1 - 15 of 19 items found.
-
STAr Technologies, Inc.
STAr's functional test cantilever probe cards represent the finest technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, image sensor etc.
-
STAr Technologies, Inc.
In semiconductor manufacturing, the performance of metrology tools directly impacts quality and yield. Partnering with key metrology equipment suppliers, STAr aims to provide solutions for advanced process controls, defect analysis and critical structural metrology measurements.
-
STAr Technologies, Inc.
STAr's strong R&D with its high-quality manufacturing line enables the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
-
STAr Technologies, Inc.
STAr's strong R&D with its high-quality manufacturing line enables the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
-
STAr Technologies, Inc.
STAr's power electronics test solutions included developed software and hardware to apply in industries in semiconductor, LEDs devices, communications, etc.
-
STAr Technologies, Inc.
STAr offers complete range of probe station from lowest cost value-based 150 mm adaptive probe station to highest performance 300 mm precision engineering automatic probe station.
-
STAr Technologies, Inc.
STAr has developed a proprietary patented vertical probe card design that is tunable for wide varieties of parametric, mixed signal, memory IC and logic IC applications.
-
STAr Technologies, Inc.
Semiconductor product yield is the utmost priority for all wafer fabrication plant as it represents the viability of a wafer fabrication plant to compete for customers. STAr provides multiple software solutions for wafer fabrication plant to improve yield by reducing errors and enabling advanced data analysis.
-
STAr Technologies, Inc.
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
-
STAr Technologies, Inc.
STAr and group company Accel-RF have been devoted to RF and wireless test solutions for decades and focus on delivering the most innovative/advanced solutions and addressing industry customers’ testing need for today and the future.
-
STAr Technologies, Inc.
STAr uses its extensive industry expertise to design, build, test and support reliability systems for semiconductor devices and interconnects reliability life test, IC product burn-in, environmental test, product screening, PCB reliability test, etc. to fulfill all the needs to build a solid reliability engineering system.
-
STAr Technologies, Inc.
STAr provides cost effective semiconductor ATE test systems for linear, power management and mixed signal devices and ensures industry customers attain the highest level of return-on-investments and satisfaction.
-
STAr Technologies, Inc.
In the manufacturing process of FPD and LED, inspection and testing are required to assure production yield. STAr launches advanced integrated test system which is the efficient test solution to industry customers.
-
STAr Technologies, Inc.
The silicon photonics and optronics market is growing fast in data centers, and more applications are looming on the horizon. STAr has over 20 years of integration test system experience and is able to design and manufacture test solutions to meet customer requirements for R&D, engineering, high-volume production, and reliability qualification.
-
STAr Technologies, Inc.
STAr is the leading parametric test system integrator, with over 20 years of experience and many successes for total parametric test solutions serving customers within the semiconductor wafer fabs, flat panel display, LED and PCB industries.
