Neaspec GmbH

  • 49 89 787 939 78
  • 49 89 787 939 79
  • info@neaspec.com
  • Bunsenstr. 5
    Martinsried, Munich D-82152
    Germany

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Showing results: 1 - 4 of 4 items found.

  • Near-Field Detection Module for Imaging

    Reflection - Neaspec GmbH

    Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution

  • Near-Field Detection Module for Imaging

    Transmission - Neaspec GmbH

    Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution

  • Near-Field Detection Module for Spectroscopy

    nanoFTIR - Neaspec GmbH

    Reflective AFM-tip illuminationDetection optimized for high-performance near-field spectroscopyPatented background-free detection technologyBased on optimized Fourier-Transform spectrometerUp to 3 spectra per secondStandard spectral resolution: 6.4/cmUpgrade to 3 cm-1 spectral resolution availableSuited for visible & infrared detection (0.5 20 m)Exchangeable beam-splitter mount includedNEW: Suited for IR synchrotron sources

  • NeaSNOM Microscope

    Neaspec GmbH

    Based on high-stability scanning-sample Atomic Force Microscope optimized for optical nanoscopyOptical focusing unit accepts visible, infrared and even terahertz illuminationTwo independent module bays allow imaging & spectroscopy at the same time

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