Showing results: 1 - 10 of 10 items found.
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PLED 6000 -
Xceltron Technologies
Measured parameters can be programmable. 128 Bin classifications. Consults CIE norm, absolute value to read. Reference Standard not needed for correct. Can show the wavelength diagram dynamically. Measurable optics characteristics: ג p B , ג dB , x, y, z, Purity, FWHM, CCT, IV and luminous flux Measurable electrical characteristics: VR, IR, VF, IF, VFD (Thyristor judgment), Delta VR and Delta IR. Measurable LED types: Lamp LED, Chip LED. Kelvin contacts and polarity check
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TVR 6100 -
Xceltron Technologies
The TVR6100 is a multipurpose, versatile Binning Tester. It can be used to classify parameters, including TRR (reverse recovery time), VF (forward voltage, IF is up to 100A), VBR (reserve breakdown voltage) and IR (reverse leakage current). Moreover, it can test IR SURGE, ΔVR(delta reverse voltage) and IR parameters at the same time. Each parameter, for testing or not testing, can be selected by each operator.
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HT 9460 and 9464 -
Xceltron Technologies
These systems assure that the devices shipped will meet the stringent specifications of UL and VDE-0083 for isolation testing as well as the VDE-0884 partial discharge specification.Both the 9460 and 9464 systems are available in two basic models: Manual model Fig.1 for sample/lab. Production testing Fig. 2 with interface to automatic handlers.
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MOV 6000 -
Xceltron Technologies
The MODEL MOV6000 metal oxide varistor BIN sorting tester, has the capability of testing the parameters: VR, ά, and IR simultaneously in the following testing order: VB1, VB2, VB3 and VB4, and IR last. You can choose whether you want each parameter to be tested or not.
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DVF 6000 -
Xceltron Technologies
The Function of the Model DVF6000 is for the testing of power diode DVF parameters. Its testing procedures first check the VF parameters to screen out abnormal VF diodes, and then it measures the DVF parameter. The maximum current source it can provide is up to 25 A.
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SZ6000N -
Xceltron Technologies
The Model SZ6000N tester primarily tests Zener Diode and Switching Diode. The testing parameters include VF (forward voltage), Breakdown Voltage, Maximum Power setting VZM, DVR (delta reverse voltage), and two IR (reverse leakage current) testing, which cover all testing parameters for both devices, except for ZZT&ZZK parameters of Zener diode. (Testing equipment is available from Kyoto Enterprise to measure ZZT&ZZK parameters of Zener Diodes.
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PTHY2002 -
Xceltron Technologies
The SIDAC Tester Model PTHY2002 tests a wide range of SIDAC device characteristics. The testing parameters include leakage current ID, Clamping voltage VBO, IBO clamping current, IH holding current, and On state voltage VT, and also has a classification function. It is designed to test normal direction testing, reverse direction testing and bi-directional testing.
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OPT02002 -
Xceltron Technologies
The MODEL OPT02002 is primarily designed to test a variety of photo-couplers' parameters and conversion times. It is able to test the AC or DC input and output side of NPN or Darlington transistor. You choose a 4 PIN or 6 PIN package for testing. The CTR parameter can be classified into 24 grades according to the settings.
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MPT 6000 -
Xceltron Technologies
The MPT6000 tester is a multi-purpose tester, which can test nine different DUT (Device Under Testing) packaging configurations. The testing of reverse voltage is from 3V - 2000V and it can sort 11 Bins. In addition, the MPT6000 tester can be connected to a TRR (Reverse Recovery Time) emulator for sequential testing. Parameters such as RG1 TRR and DC characteristics can be tested together.
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VFR 6000 -
Xceltron Technologies
The main function of the VFR 6000 tester is to test material's VFR(Forward Recovery Voltage) values, not including DC characteristics. It uses a fixed-direction testing. There are 10 groups for setting and saving programs. In addition to this, Xceltron is active in the research and development of production management system software that can provide all types of reports and analysis diagrams.