Bruker Optics

Bruker Optics is the leading manufacturer and worldwide supplier of Fourier Transform Infrared, Near Infrared and Raman spectrometers for various industries and applications.

  • (978) 663-3660
  • (978) 663-5585
  • pr@bruker.com
  • 40 Manning Road
    Billerica, MA 01821
    United States

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Showing results: 1 - 15 of 15 items found.

  • FT-NIR Spectrometers

    Bruker Optics

    FT-NIR spectroscopy for quality control applications in all industries, including the pharmaceutical, food, agricultural and chemical sector. FT-NIR is ideal for rapid raw material identification and is also a powerful analysis tool capable of accurate multi-component quantitative analysis.

  • Multi Purpose FT-NIR Analyzer

    MPA II - Bruker Optics

    The MPA II is the result of more than 40 years of experience in the engineering and production of FTIR and FT-NIR spectrometers. It is a powerful tool for developing sophisticated calibration methods for your laboratory or process needs, yet an easy to use QA/QC instrument for routine work. With its modular technology, it can be configured individually for each analytical task.

  • On-line FT-NIR Analysis

    MATRIX-F - Bruker Optics

    The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.

  • Surface Analysis

    Dimension FastScan Bio - Bruker Optics

    The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.

  • Surface Analysis

    Dimension AFP - Bruker Optics

    The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.

  • Surface Analysis

    InSight-450 3DAFM - Bruker Optics

    Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.

  • WDXRF Analyzer

    S6 JAGUAR - Bruker Optics

    The S6 JAGUAR offers more analytical power with typically more than 50% reduced measurement times than any other compact WDXRF instrument, featuring its new compact WDXRF goniometer, closely coupled optics, and 400 W direct excitation power. Based on the brand new HighSense XE detector with its ultimate linear range of more than two Million cps, it delivers excellent accuracy and precision for quality control in industrial labs.

  • X-ray Diffraction and Elemental Analysis

    N8 HORIZON - Bruker Optics

    The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.

  • XRF Analysis

    Bruker Optics

    Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.

  • spectrometers

    VERTEX 80/80v - Bruker Optics

    The VERTEX 80 and the VERTEX 80v vacuum FT-IR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optics guarantees the ultimate sensitivity and stability. The VERTEX 80v is an evacuated optics bench that can eliminate atmospheric moisture absorptions for ultimate sensitivity and stability; enabling demanding experiments such as high resolution, ultra fast rapidscan, step-scan, or UV spectral range measurements.

  • WDXRF Spectrometer

    S8 TIGER Series 2 - Bruker Optics

    Thanks to HighSense technology the S8 TIGER Series 2 WDXRF spectrometer delivers for all elements accuracy and precision for industrial quality and process control. With high resolving WDXRF technology and optimal detection of light, medium and heavy elements based on the new HighSense beam path, the XRF2 mapping tool of the S8 TIGER Series delivers best sensitivity, smallest spot size, and highest resolution for small spot applications. Ergonomic and failsafe operation are vital for efficiency and best analytical data. Simple, intuitive start of samples are guaranteed with the multilingual TouchControl interface.

  • X-ray Diffraction and Elemental Analysis

    D8 ADVANCE - Bruker Optics

    The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.

  • X-ray Diffraction and Elemental Analysis

    D2 PHASER - Bruker Optics

    The D2 PHASER is the most compact and fastest, all-in-one crystalline phase analysis tool available on the market. It is mobile and easy to install with only the need for standard electrical power. The D2 PHASER is therefore ideal for laboratory or on-location operation, in other words, it is a true Plug'n Analyze system.

  • X-ray Diffraction and Elemental Analysis

    NANOSTAR - Bruker Optics

    In fact, the NANOSTAR analyzes pure sample properties, even for non-isotropic sample systems. The modular design permits setting the detector-to-sample distance from 11.5 mm up to 1070 mm. Hence, the entire range from SAXS to WAXS can be covered in combination with the Image Plate (IP) option simultaneously.

  • Surface Analysis

    Innova-IRIS - Bruker Optics

    This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

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