Hprobe Company

Hprobe offers a 3D magnetic field wafer tester for all types of magnetic devices : - Planar and perpendicular Magnetic Tunnel Junction (MTJ) - STT-MRAM - SOT-MRAM - TMR sensors - Magnetic MEMS sensors Hprobe has developed a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing. With our 3D generator technology, each magnetic field spatial axis is driven independently. User can apply and control the maetic field in any direction of space, as well as generate rotating fields.