Showing results: 1 - 6 of 6 items found.
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Teseda Corporation
Developed with our customer’s Remote Customer Quality Engineers, who support their customers with rapid in-field failure analysis.
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Teseda Corporation
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Teseda Corporation
Comprehensive Product Engineering and Failure Analysis Lab system for complete device analysis and physical defect isolation.
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Teseda Corporation
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB