FA Instruments

FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection in the visible to NIR range. We also manufacture “SIFT” Stimulus Induced Fault Testing systems.

  • 408 789 7560
  • 484 210 2961
  • info@fainstruments.com
  • 2381 Zanker Rd.
    Suite 100
    San Jose, CA 95131
    United States

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  • Parametric Analyzer

    FA Instruments

    FA Instruments Parametric Analyzer offers all the functions of a 'big box' circuit testing solution, without the 'big box' footprint!The Parametric Analyzer is an advanced software module that can performs within the Crystalvision suite. The module provides all the functionality and testing schemes you would expect from a high-end solution, with all functionality being geared towards providing the maximum information to the FA engineer.

  • Microscopy Software Suite/IC Diagnostics

    Crystal Vision - FA Instruments

    Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity.

  • Stimulus Induced Fault Testing

    SIFT - FA Instruments

    SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

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