Showing results: 1 - 8 of 8 items found.
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MASER Engineering B.V.
Customers of MASER Engineering that are using electronic components and materials are interested in the manufacturing quality and used materials.
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MASER Engineering B.V.
Failure analysis on electronic components is a continuous challenging task. The smaller transistor dimensions, increasing functional complexity and changing device packaging styles requires new tools and skills for sample preparation, fault localization techniques, high resolution imaging and analysis.
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MASER Engineering B.V.
Customers of MASER Engineering that are designing electronic products and thereby using bare and assembled Printed Circuit Boards (PCB's) are interested in the manufacturing quality of the PCB and assembling quality of the PCBA.
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MASER Engineering B.V.
The mechanical properties of an electronic system enclosure have to be stressed in order to determine the robustness of the total system. The multiple electrical interconnections have our special attention.
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MASER Engineering B.V.
The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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MASER Engineering B.V.
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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MASER Engineering B.V.
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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MASER Engineering B.V.
HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
