Showing results: 1 - 6 of 6 items found.
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Tracer -
ABET Technologies Inc.
In Tracer you will find your all-in-one solution for the measurement and elaboration of IV-curve measurements. Tracer is the core application developed by ReRa that will help you to characterize your solar cells and compare the results.Tracer natively supports the control of Keithley 24xx and 26xx sourcemeters.These instruments have proven their strength over time for the measurement of solar cells.
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LS 150 Xenon Arc Lamp Source -
ABET Technologies Inc.
Model LS-150 is a Patented US Pat. No. 8116017 low cost, high output 150 watt Xe arc lamp based light source. The entire source, power supply, lamp, and optical compartment are housed in an extremely compact enclosure, 9 x 6 x 11 inches. The unit's base allows mounting on inch or metric spaced optical tables with the optics centered over the hole pattern to allow for easy integration with the rest of your setup.
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ABET Technologies Inc.
Abet Technologies offers a range of standard EQE and IQE measurement systems. Model QE-1100 is configured with the most useful components for single junction devices. It has a 350 – 1100 nm range. The QE-1800 is configured with components most useful for components for triple junction cells. Beyond the standard systems offered systems can be custom configured to meet a customer’s metrology needs.
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ABET Technologies Inc.
Abet Technologies offer a wide range of ASTM, IEC, and JIS standards compliant solar simulators ranging from 150W to 3kW with one sun or greater illuminated field sizes from 50 x 50 mm to 35 x 35 cm. The direction of illumination, traditional down pointing, horizontal, or vertical up pointing can be specified at the time of ordering.
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ABET Technologies Inc.
These test stations offer the same reliable repeatable measurement capability of our temperature monitored stations with the added dimension of temperature control.
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ABET Technologies Inc.
Standard maintenance, lamp, or filter replacement, does not require any tools. Locking indicator dials on all the system controls, located together for ease of alignment, provide for a reproducible setup. A beam imaging accessory makes alignment even faster.