Tanisys Technology, Inc.

Complete line of test systems designed for evaluating both IC fabrication and module manufacturing defects using a full complement of functional and AC/DC parametric tests. Subsidiary of Neosem.

  • (512) 257-5000
  • info@tanisys.com
  • 11001 Lakeline Blvd.
    Bldg I, Suite 150
    Austin, TX 78717
    United States

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