Showing results: 1 - 13 of 13 items found.
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Tokyo Electronics Trading Co., Ltd.
This LCD failure analyzer provides test patterns and programmable power supplies for the LCD unit test. R, G, B signals are applied to the LCD unit under test. Compact control box connected by a cable allows test pattern selection, gray scale control, cursor location and scan direction. If PC is connected through RS-232C port, complex test sequence can be programmed. It is applicable to the production test, design verification, quality control and failure analysis.
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Ecdm-100E/400E -
Tokyo Electronics Trading Co., Ltd.
Ecdm Series is an inexpensive and manually controlled bench-top ESD simulator. By replacing an external probe or adaptor, every ESD event such as Human Body Model (HBM), Machine Model (MM) and Charged Device Model (CDM) including FI-CDM and Direct charging CDM can be simulated.
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DVR-V/S -
Tokyo Electronics Trading Co., Ltd.
Technology innovation of optical disk and write method is radical. This R&D pattern generator allows analysis and selection of optimized write pattern for laser diode relative to the optical disc material.
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RZCVT-10GH -
Tokyo Electronics Trading Co., Ltd.
RZ (Return to Zero) pattern is occasionally required to test high speed communication circuits. This converter gives it from general purpose NRZ (Non return to Zero) pattern genarator, so that dedicated RZ pattern generator is not required.
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550 -
Tokyo Electronics Trading Co., Ltd.
Charged Device Model (CDM) is to simulate a discharge to metal from any metal terminal of a charged electronic component or from metal tool held by a charged human body to metal terminal of an electronic component. CDM discharge causes very fast charge transfer, and then component is damaged by the stress. The CDM test system analyzes the robustness of component against CDM stress.
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400SW -
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.
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EV-10A -
Tokyo Electronics Trading Co., Ltd.
EV-10A detects ESD (Electro-Static Discharge) and records them in a PC. ESD sensitive electronic components increase rapidly. If electro-static charge is not strictly controlled in the production line of these components or in the assemble line using them, the yield will be decreased.
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7000 -
Tokyo Electronics Trading Co., Ltd.
ESD test based on Human Body Model (HBM) and Machine Model (MM) is the most important reliability test among the Electro-static Discharge (ESD) test of the semiconductor device. Latch-up test, on the other hand, should not be omitted from the reliability test of the CMOS devices.
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ESPIER2001 -
Tokyo Electronics Trading Co., Ltd.
There is a requirement of fast DC test such as open/short of any DUT pins, though complete performance test is not requested. Simplified test before and after burn-in, screening before the final test or before shipment are some of these examples. For this type of application, fast and inexpensive open/short tester is more suitable than the full DC tester that has plentiful test functions.
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8600 -
Tokyo Electronics Trading Co., Ltd.
Basically manual operation bench top Latch-up Tester provides all elements required for the latch-up test such as constant current pulse, programmable power supplies, simple pattern generator, timing generator and pull-up/down function, though some of them are optional.
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7500 -
Tokyo Electronics Trading Co., Ltd.
ESD test based on Human Body Model (HBM) and Machine Model (MM) is the most important reliability test among the Electro-static Discharge (ESD) test of the semiconductor device. Latch-up test, on the other hand, should not be omitted from the reliability test of the CMOS devices.