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Nanotronics Imaging

Nanotronics Imaging was founded in 2010 by Matthew and John Putman after they sold Tech Pro (a leader in physical testing equipment) to Roper Industries.

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Phone:212.401.6209
Address:New Lab - Building 128
63 Flushing Avenue, Unit 241
Brooklyn, NY 11205
United States

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Wafer (2)
Ada (1)
Computer (1)
Defect (1)
Detection (1)
Film (1)
Intelligence (1)
Thin Film (1)
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AI ANALYZER

Nanotronics Imaging

Nanotronics uses artificial intelligence to give our customers’ unprecedented freedom and control for defect detection. We offer an AI based Anomaly Detection Algorithm (ADA) toolkit that automates the work of writing computer vision algorithms to detect and classify defects on bare substrate and epi wafers as well as on thin films, glass and any other material with a uniform background.

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Macro Inspection

Nanotronics Imaging

High-throughput automated macro inspectionAny wafer size, in less than one second with ~75 micron resolutionSmall footprint table-top system

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