RMS Vision Systems Inc

RMS Vision Systems and Hologenix specialize in precision measurement technology for high-end optical defect inspection and dimensional metrology for semiconductor manufacturing. Our Customers are companies that use or manufacture automated precision metrology systems where high accuracy, throughput and reliability are required. We provide our customers with complete solutions featuring the industry's most advanced vision technology and systems for metrology and automation.

  • 805-222-5430
  • sales@rms-vision.com

  • ,
    United States

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Showing results: 1 - 4 of 4 items found.

  • Advanced Metrology System

    NGS 3500L - RMS Vision Systems Inc

    This top performance system is designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. It is well suited for use as a dedicated production tool or as a versatile processdevelopment system. It features a powerful set of automated as well as semi-automatic optical/ video tools optimized for high accuracy, production throughput, and ease of use.

  • Vision Metrology System

    NGS 3500Z - RMS Vision Systems Inc

    This bench top lower cost, yet high performance system is designed for applications where defect detection and precisionmeasurements on wafers and other parts (up to 200 mm) are required. It is well suited for use as a dedicated productiontool or as a versatile process development system. It features a powerful set of automated as well as semi-automaticoptical/ video tools optimized for high accuracy, production throughput, and ease of use.This automated and versatile platform features a standard Nikon/ Olympus bright/ dark field microscope with optionalNomarski, and precise part staging. This system offers significant and unique advantages for dual production/ engineeringuse, and provides the perfect solution when both defect detection and dimensional metrology are required.

  • Slip Line Detection System

    YIS 200 - RMS Vision Systems Inc

    The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.

  • SlipFinder

    YIS and SF Series - RMS Vision Systems Inc

    The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.

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