CSE Co.,Ltd
We pursue customer satisfaction. As you know, the Wafer Probing Machine is to test electric characteristics of each chip created on a wafer. The test is made by a probe of the probe card, attached to a wafer prober and connected to a tester, contacting to a pad of each chip of a wafer on the stage of the wafer prober. In testing this way, chips are sorted into either good or defective chips.
- +82-31- 765-3060
- +82-31- 765-3063
- brian@proberworld.com
- 121-9 Maejari-gil
Gwangju Si, Gyeonggi-do 464-893
Korea, South
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