Frontier Semiconductor, Inc,

Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate

  • +1 408 432 8838
  • +1 408 232 1115
  • FSM100@frontiersemi.com
  • 2127 Ringwood Avenue,
    San Jose, CA 95131
    United States

Filter Results By:

Products

Applications

Showing results: 1 - 9 of 9 items found.

Get Help