NEOSEM TECHNOLOGY INC

A leading provider of testing and measurement solutions for technology manufacturers. The company’s products are used to conduct standardized, repeatable testing solutions of storage-related devices such as HDDs, SSDs ODDs and PCIe drives.

  • +1-408-643-7000
  • sales@neosemtech.com
  • 4659 Las Positas Rd
    Unit C
    Livermore, CA 94551
    United States

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Showing results: 1 - 4 of 4 items found.

  • LED Test

    NEOSEM TECHNOLOGY INC

    Neosem developed and released the LX500 - LED Accelerated Aging Tester to provide our customers with the capability to deliver highly reliable automotive LED products to the market. By adopting Neosem’s patented temperature control algorithm, the customer can execute the LED device aging test at very stable temperatures.

  • DRAM Module Test

    NEOSEM TECHNOLOGY INC

    We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market. The integrated system with CMB (custom designed Motherboard), Thermal subsystem and Automation technologies provides a Turn-key Automated Test System which reduces Integration risks and time to Volume Production. Our Automated DIMM SLT (System Level Test) System is highly configurable to address our customers needs and environments constraints for Best Cost of Ownership, Best Performance and shortest Time to Yield.

  • SSD Test System

    NEOSEM TECHNOLOGY INC

    The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI. The SSD test system of Neosem is available ranging from desktop sized desktop sizedconfigurations for engineering use to manufcturing scale test systems for mass production with multiple burn-in chambers.

  • Memory Burn-In Test

    NEOSEM TECHNOLOGY INC

    The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.

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