Amptek Inc.

A high technology company and a recognized world leader in the design and manufacture of state-of-the-art nuclear instrumentation for the satellite, x-ray and gamma ray detection, laboratory, analytical, and portable instrumentation industries.

  • (781) 275-2242
  • (781) 275-3470
  • sales@amptek.com
  • 14 De Angelo Drive
    Bedford, MA 01730
    United States

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Showing results: 1 - 8 of 8 items found.

  • FAST SDD and C2 Window

    EDS (SEM) Applications - Amptek Inc.

    Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).

  • Charge Sensitive Preamplifier-Discriminator

    A101 - Amptek Inc.

    Model A101 is a hybrid charge sensitive preamplifier, discriminator, and pulse shaper developed especially for instrumentation employing photomultiplier tubes, channel electron multipliers and other low capacitance charge producing detectors in the pulse counting mode. The A101 is widely used in laboratory and commercial applications for mass spectrometers, laboratory and research experiments, aerospace instrumentation, medical electronics, and electro-optical systems.

  • Gamma-Ray Analysis Software

    SODIGAM - Amptek Inc.

    SODIGAM is the only high-precision analytical software for scintillation spectrometers to use physically correct descriptions of background, baseline, and peakshapes as part of gamma-ray analysis. It contains many of the features normally found in programs designed for the high-precision analysis of HPGe spectra, and allows users to run samples from within the DPPMCA software.

  • Quantitative Analysis Software

    Electron Probe X-Ray Analyzer (EPXA) - Amptek Inc.

    The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.

  • XRF Systems

    OEM Solutions - Amptek Inc.

    Amptek offers a complete line of OEM detectors, preamplifiers, digital processors, and power supplies, and can work with you to help develop custom solutions unique to your needs. We provide established and emerging OEM customers a fast track to the market with our modular systems that will meet current needs, while being flexible enough to adapt to your product roadmap. The below options are typical configurations. Please contact us for custom solutions.

  • Selection Guide

    Hybrid - Amptek Inc.

    Get the best performance with solid state detectors, proportional counters, photodiodes, PM tubes, CEMs, or MCPs by using Amptek Charge Sensitive Preamplifiers

  • Gamma-Ray Analysis Software for HPGe Detectors

    GAMMA-W - Amptek Inc.

    Gamma-W software performs high-precision analysis of gamma-ray spectra from HPGe detectors, and is ideally combined with the PX5-HPGe and your high-purity germanium detector. It is noted for its accurate and reproducible analysis of small peaks even in the presence of high backgrounds. Gamma-W contains all of the options and algorithms legally required by many jurisdictions for quantitative analysis of HPGe gamma-ray spectra, including detection limit, radioactive decay control, uncertainties, documentation, etc…, and allows users to run samples from within the DPPMCA software.

  • Quantitative XRF Analysis Software

    XRS-FP2 - Amptek Inc.

    XRS-FP2 is the next generation quantitative analysis software package for materials analysis using X-Ray Fluorescence (XRF). The single, integrated software package can be used in 3 different modes for different applications:*Single-layer samples, for compositional and single-layer thickness analysis (XRS-FP2 BULK)*Multi-layer, thin-film samples, for composition and multilayer thickness analysis (XRS-FP2 MTF)*Single-layer samples, for composition and single-layer thickness using an incident electron beam instead of and x-ray beam (XRS-FP2 EPXA)

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