Wafer Probes

for all fully-automatic wafer prober. close loop dew point controlled chuck system. high performance - durability ...more

Custom Loadbaord fixturing design & fabrication. Probe cards for wafer sort. Custom Test sockets for special final test solutions ...more

The Barth Model 45002WP TLP Wafer Probe is designed to be used with the Barth Pulse Curve Tracer, Model 4002 TLP test system for pulse testing of the ESD protection I/V characteristics at the wafer level. It has two separate needles and isolated probe connections that can be independently positioned with no interaction between them. ...more

low noise -  high isolation - parametric test. for all fully-automatic wafer prober. high performance - durability   ...more

Probe holder, For package and interconnect, MSI integrated circuit, microwave semiconductor, hybrid, and electro-optic device probing applications. W= Base X= Arm Length & Wafer diameter, Y= Position, Z= Position w/ respect to operator facing station. ...more

he broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade Microtech’s new Tesla on-wafer power device characterization system meets the challenge, reducing time-to-market for new power devices. Tesla is the industry’s first power device measurement system that provides a complete ...more

At the IBM Microelectronics Test Solutions Center, you will find wafer probe capability for 4" to 12" . Hot and cold chuck testing from -50°C to 150°C is also available. We use a wide variety of probing techniques from cantilever through Cobra (vertical array) Probing Technology and our capabilities include pre/post test inspection. ...more

The Air Coplanar Probe is a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. It features excellent probe-tip visibility and the lowest loss available. Available as both single and dual, the ACP probe combines outstanding electrical performance with precise probe mechanics and is todays most widely used mic ...more

The Air Coplanar Probe was developed in response to the need for a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. Air Coplanar Probes feature excellent probe-tip visibility and the lowest loss available. For measurements where pad area is at a premium, the ACP family is offered with a reduced contac ...more

 Pitch : 0.25 ~ 0.5mm  Planarity : < 20 ㎛  Accuracy : ± 10 ㎛  Spring Force : 6g/pin ~ 30g/pin  Resistance : < 0.5 Ω  Characteristic Impedance : 50 Ω ± 5  Application CSP or WLCSP type wafer level test Socket Part Name 152WLPC-0.25-D2 132WLPC-0.3-D1 64WLPC-0.5-G1 ...more

Cascade Microtech?s industry standard 200 mm wafer probing systems are in use at virtually all leading semiconductor manufacturing and design sites worldwide. They have been designed to allow access the full measurement range of today?s most advanced test instrumentation. Whatever the application - device characterization, modeling, process de ...more

The multi-contact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the ...more

low noise -  high isolation - parametric test. for all fully-automatic wafer prober. high performance - durability   ...more

The Cascade Microtech S300 probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggres ...more

Cascade Microtech?s 150mm (6 inch) probe stations provide the world?s leading semiconductor manufacturers access to, and extraction of essential information from the most complex wafers to solve the world?s toughest problems in advanced semiconductor design and development, thereby shrinking time to volume. Designed with exotic materials in mi ...more

Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade nee ...more

Our four point probes measure the sheet resistance / resistivity / thickness of a wide variety of materials including group-IV semiconductors, metals, and compound semiconductors, as well as new materials found in flat panel displays and hard disks. We offer a wide range of models, options, and probe heads to suit your materials', measurement, and ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

ISE Labs, Inc. provides effective test solutions that address the full range of industry requirements for Digital and Mixed Signal devices. Test platforms encompass wafer probe and finished package testing. Our skilled staff of test engineers assist in the development of customized solutions designed to address unique test requirements. ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

The HT - Series Needle Dresser Wafer reshapes (dresses) and cleans probe tips after they have been flattened through use. It is a wafer based cleaning sheet similar to, but more aggressive than, the on-line cleaning sheet. Its elastic properties minimize probe-tip wear during cleaning. The wafer can be used on-line or off-line. Cleaning is per ...more

The Needle Dresser System is developed for cleaning radius probe tips on standard Probe Card , resulting in lower contact resistance. In addition to cleaning probe tips, the System is able to maintain radius probe tips by using an exclusive cleaning sheet, the Needle Dresser Wafer. Using soft abrasives for cleaning the Needle Dresser Wafer cau ...more

APS is the global leader in the manufacture of small diameter needles used in cantilevered and vertical probe applications. All probes are manufactured according to customer specifications using stringent in-process quality assurance procedures. APS's efficient production systems will provide you with the best probe needles possible at the lowest c ...more

Highly repeatable needle contact conditions. Individually adjustable needle loadings with direct indication of set load. Micrometer controlled slice displacement. 4-point measurement of wafer resistivity and 3-point spreading resistance measurements. ...more

ISE Labs, Inc. provides effective test solutions that address the full range of industry requirements for Digital and Mixed Signal devices. Test platforms encompass wafer probe and finished package testing. Our skilled staff of test engineers assist in the development of customized solutions designed to address unique test requirements. ...more