Showing results: 151 - 165 of 434 items found.
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VBT200A -
Recif Technologies Inc.
The Vertical Batch Transfer and Notch alignment machine (VBT200A) is a single stage, automated tool that can transfer a batch of 200mm wafers between semi-standard cassettes and align a batch of 200mm wafers by the notch.
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KLA-Tencor Corp
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Recif Technologies Inc.
The AWT (Automated Wafer Transfer) and MWT (Manual Wafer Transfer) machnes transfer wafers horizontally between cassettes.On AWT, a series of sensors on the loading stage ensure cassettes are in the correct position for transfer. Removing a cassette during a transfer cycle will automatically stop the cycle. Mechanical guides on the load stage also help the Operator place the cassettes correctly.
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Precision Development Consulting Inc
Fast Open Loop temperature control system, Batch CVD temperature control system, Single Wafer Temperature control system, Disk Drive Spindle Motor Control, Wafer Indexer Motor Control
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X-eye NF120 -
SEC Co., Ltd.
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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CP-4 -
Bruker Nano Surfaces
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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Advanced Energy
Advanced Energy's Trek e-chuck supplies have been a staple in the semiconductor industry for decades. They allow you to improve throughput, virtually eliminate sticky wafer and wafer popping issues, and reduce backside gas errors.
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Recif Technologies Inc.
The ANA (Automated Notch Aligner) and MNA (Manual Notch Aligner) align a batch of 200mm wafers by the notch. Wafers are aligned using the heavily industrialized alignment technology developed by RECIF, used in the multiple standalone and OEM systems.
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VS6845E -
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Onto Innovation
FTIR (Fourier Transform Infrared) is the most important technology for measuring epitaxial film (Epi) thickness, measuring impurities in Silicon and monitoring dielectrcis, like Borophosphosilicate glass (BPSG), FSG, PSG, etc in semiconductor industry. FTIR is evolving from a primarily quality control (wafer supply chain) technology to a tool/process/chamber (test wafers) monitoring technology and more importantly, a device (product wafers) monitoring tool.
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KLA-Tencor Corp
KLA’s comprehensive portfolio of SensArray® products enables in situ monitoring of process tools’ environments. With wired and wireless sensor wafers and reticles, an automation package and data analysis systems, SensArray products provide comprehensive information for a wide range of wafer and reticle processes. Wafer process equipment manufacturers, IC manufacturers and reticle manufacturers use SensArray data to visualize, diagnose and control process conditions.
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SURFTENS HL Automatic -
Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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CoorsTek, Inc.
Engineered ceramics are used in the semiconductor industry because of their excellent material properties. Ultra-pure ceramics are often used in the whole cycle of semiconductor manufacturing including Semiconductor Wafer & Wafer Processing, Semiconductor Fabrication (Front End), and Semiconductor Packaging (Back End).
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GP Solar GmbH
LABORATORY MEASUREMENT SYSTEMS FOR CHARACTERIZATION AND OPTIMIZATION IN THE PRODUCTION OF SOLAR WAFERS AND CELLS
