Showing results: 661 - 675 of 5306 items found.
-
PWB Interconnect Solutions Inc.
Integrated package including PC, Software with real time graphing and all related systems and hardware for 8 head, dual sense testing model IST-HC
-
17040 -
Chroma ATE Inc.
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
-
LXinstruments GmbH
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
-
Accel-RF Corporation
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
-
VX Instruments GmbH
Our testing systems are based on established industry standards and can be individually configured to meet your requirements. In addition, our systems can be easily and efficiently adapted to changing and new challenges.
-
Max 450 -
Aehr Test Systems
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
-
CKT1175-MBA -
CK Technologies, Inc.
The CKT1175-MBA (for multiple-bus architecture) will provide seamless testing of electronic racks, panels and chassis containing passive and active components such as relays, solenoids, switches, circuit breakers, lamps and LED's, diodes, resistors, capacitors, etc. This functionality is made possible by a switching matrix that is up to 10 levels deep, plus a multiplexer that controls the various stimuli sources, instrumentation connections, and external energization outputs.
-
VLF-60 -
Kharkovenergopribor Ltd.
The system is designed for VLF (0.1 Hz) withstand testing of cross-linked polyethylene (XLPE) insulated cables.Integrated Tan Delta (tan δ) measurement module allows to evaluate the general condition of cable insulation according to IEEE 400.2-2013 international standard.
-
BK9015 -
BaKo Co., Ltd
Based on the BK3011 MEMS Mic Tester, the BK9015 is our fully automatic 8 channel MEMS (Silicon) mic sweep tester. Testing up to 8 DUT's simultaneously, the BK9015 can test 8 mics simultaneously and sort them according to passing grade and cause of failure! Because it uses a sweep test, it can check characteristics for the entire frequency range. Your data can be viewed in real time or stored so you can analyze problems or trends.
-
PCITS -
Silicon Control Inc.
The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
-
VuPower Corporation
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
-
Aero Nav Laboratories, Inc.
This test is also known as the power supply line voltage and frequency variations test. A few of the measured characteristics are: voltage and frequency modulation, voltage spike, and voltage transient recovery.
-
Magtrol Inc.
Magtrol’s 4 quadrant motorized dynamometers provides expanded testing flexibility over a typical braking dynamometer. With the ability to bring the motor under test (MUT) to synchronous RPM before beginning a test, repeatability is improved. Since the motor windings are at ambient temperature before starting a ramp test, wattage is more consistent.
-
17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
-
P9001A -
Keysight Technologies
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
