Test Program Sets Astronics DME has developed a reputation as the preferred source for Test Program Sets for the Marine Corps on the Virtual Instrument Portable Equipment Repair/Tester (VIPER/T) and TETS as well as the Air Force Special Operations Forces (SOF) for our work on the AC-130U/H Gunship Test Equipment/Test Program Sets.

Genesys Basic Test Program Our Basic Test Program will provide all of the standard operations that are necessary when creating a Test Program for the HP3070. When you order the Basic Test Program you will receive the following: CAD translation of your data to board and board_xy. Shorts and Opens test. Analog discrete component test. Standard digital library tests (HP-3070 Library). Setup libraries for all non HP-3070 libraries.

Pyramid Accel Test Program Debug Fixture The Pyramid Accel test program debug fixture addresses the increasingly complex test challenges brought on by today's SoC and RF devices. It provides a unique capability to reduce time and cost to develop accurate, predictable and reliable production test programs, and reduce overall product time to market by up to 60%.

Test Program Development Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request. 

TPS04 - Test Program Development ITS offers a full service custom TPS development for all types of digital/analog modules. Our TPS services are tailored to the development of advanced functional tests for the most complicated module architectures. Microprocessor based, multi-peripheral, multi-ASIC, and multi-protocol designs are our specialty. Our proficiency in the area or modeling and simulation development allow us to handle the most complicated modules from a system level.

Test program Comparator - Content based revision compare of Test Programs TP-C is part of the new test program life cycle solutions from TestInsight Address concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?

Checksum Generator - Test Program Verification Checksum Generator (CHKSUM) guarantees you are using the right version of a test program. The program reads the data in a disk resident file and produces a unique four (4) digit identification number (CHKSUM) for that test file. You can even configure your test software to automatically stop if the checksum value changes, indicating that the wrong version of a test program has been accessed.

TPQR - Test Program Quality Report TPQR [Test Program Quality Report] is powered by TestWay, the world-wide reference coverage analysis tool, helping users to quantify and qualify the test coverage for a wide range of inspection and test equipments.

Test Program Consulting Service Test program development providing turnkey test programs for our customers. We have consultants familiar with all types of commercial ATEs, and military systems, including the US Navy's CASS, the US Army's IFTE and many US Air Force systems. Our consultants can develop test programs on most commercially available ATEs, whether it is for ICs, boards or systems.

Test Program Development Access to experienced Test Engineers Faster time-to-market & time-to-volume Able to augment existing internal team during times of urgency Professional Program Management Keeps projects on track Provides single point-of-contact Cost Reduction No need to maintain large test team between product/market cycles

TP-M - Test Program Management TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.

GATE - Graphic Oriented Test Program Graphical programming environment. - Unlimited hierarchical sub-flow. - Plenty of convenient debugging tools: trace, single step... Data manager that provides "live" data to be shared among test program and utilities. - Test flow runtime variables which new data type can be defined by TSPs or users.

APG - Automatic Program Generator Test Program APG is the most efficient method to generate complicated test programs and results in considerable timesavings over other methods. Using APG reduces the programming effort and eliminates the guesswork. Best of all, you can generate the test programs off-line from the test system so you don't negatively impact testing schedules.

PEL-2040 - Programmable DC Electronic Load Sequence function to do high Efficient load simulations -Flexible configuration with mainframes and plug-in modules -Multiple independent load inputs up to 8 channels in a mainframe -Parallel connection of inputs for increased load capacity -Parallel connection of inputs for static and dynamic tests -Multiple channels run for dynamic tests under one clock control -Maximum rated power for low range high resolution CC tests -Von setting and Von on/off for start-up Von tests -Program mode to create work routines for repetitive tests -OPP/OCP/OVP/OTP protections -External channel control/monitoring via an analog control connector

PEL-2030 - Programmable DC Electronic Load Sequence function to do high Efficient load simulations -Flexible configuration with mainframes and plug-in modules -Multiple independent load inputs up to 8 channels in a mainframe -Parallel connection of inputs for increased load capacity -Parallel connection of inputs for static and dynamic tests -Multiple channels run for dynamic tests under one clock control -Maximum rated power for low range high resolution CC tests -Von setting and Von on/off for start-up Von tests -Program mode to create work routines for repetitive tests -OPP/OCP/OVP/OTP protections -External channel control/monitoring via an analog control connector

PEL-2041 - Programmable DC Electronic Load Sequence function to do high Efficient load simulations -Flexible configuration with mainframes and plug-in modules -Multiple independent load inputs up to 8 channels in a mainframe -Parallel connection of inputs for increased load capacity -Parallel connection of inputs for static and dynamic tests -Multiple channels run for dynamic tests under one clock control -Maximum rated power for low range high resolution CC tests -Von setting and Von on/off for start-up Von tests -Program mode to create work routines for repetitive tests -OPP/OCP/OVP/OTP protections -External channel control/monitoring via an analog control connector -Multi-Interface USB Device / Host, RS-232C, and GPIB (Optional) -Multi-mainframe link up to 5 mainframes in a system

PEL-2020 Series - Programmable DC Electronic Load Sequence function to do high Efficient load simulations -Flexible configuration with mainframes and plug-in modules -Multiple independent load inputs up to 8 channels in a mainframe -Parallel connection of inputs for increased load capacity -Parallel connection of inputs for static and dynamic tests -Multiple channels run for dynamic tests under one clock control -Maximum rated power for low range high resolution CC tests -Von setting and Von on/off for start-up Von tests -Program mode to create work routines for repetitive tests -OPP/OCP/OVP/OTP protections -External channel control/monitoring via an analog control connector -Multi-Interface USB Device / Host, RS-232C, and GPIB (Optional) -Multi-mainframe link up to 5 mainframes in a system

OLR-Software Optical Reconstruction of Layouts for Generating Test Programs and Fixtures

M3000 - Test Application Developement UNITES Systems a.s. provides expert test application development to meet customers needs such as: * Test program package development including HW design for customers specific applicatons * Test program conversions * Multisite production & wafer level tests for automotive, industry, telecom and Std linear

Global Support Global Debug, Installation and Support Test programs and fixtures Our ownership : # Test program development # Test fixture manufacturing # Program and fixture installation # Local support and service # ECOs # Maintenance and spare parts ECT resources are located where you need them, when you need them.

Wave Wizard - Pattern Conversion Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective. 

Electronics Test Consulting Consulting service for test programs, test services, failure analysis, specific types of ATEs to buy or borrow, to test a product before you have an ATE, or anything connected with test

ICT - Test Development StarTest provides turn-key test program development services for the Teradyne Z18xx family of In-Circuit Testers.