303 Series - Relay Test System The SemiTek 303-Relay Test System is PC-based and designed to test the integrity of electromechanical or coax relay devices. The system may be configured for multi-terminal testing right from the main station and the PC.

With production and final test in mind, the 303-Relay Test System can perform an array of tests and control device output binning in a fraction of the time of any other tester on the market.

Under program control, the test system can test:
* Pull In/Drop Out
* Contact Voltage Drop
* Insulation Leakage
* Variable AC Coil Frequency
* Timing
* Coil Resistance
* Semiconductor
* Isolation
* Contact Resistance
* Dielectric Withstanding.

To maximize the system’s resources, multiple switching cards can be configured for additional test terminals (subject to space) allowing an operator to test at one site while prepping another. This helps to maximize the use of the system. In this configuration, each terminal may test the same or a different relay part.

COMBITEST - Relay Test System COMBITEST relay test system provides a wide range of testing capabilities. All parts of the COMBIFLEX relay and the overall system can be accessed for testing. COMBITEST also means additional personnel safety during testing. In a test it is possible to inject signals to the isolated relay in order to observe its performance and operation limits.

GF4600 - 61850 Test System Features: Simulation 61850 client can request IEC61850 directory service, the realization, speaking, reading and writing, to create, delete data set service, receiving reports, log, control, protection fixed value, setting changeover, document service. The client support multiple server, support twin wire hot standby.
Automatic polling test multiple IED, detection communication status, remote measure, remote communication, SOE, remote control, remote regulating function.

201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.

Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* Arrays
* MOSFET
* MOSFET Depletion
* Optocouplers
* JFet / JFet NO
* Mechanical Relays
* Sidac
* Triac / SCRs
* IGBT

Xtramus NuStreams 2000i - Gigabit Ethernet IP Performance Test Systems NuStreams-2000i is an advanced Ethernet test system for Layer 2 to 7 and wire-speed Layer 2 and Layer 3 IP packet generation for testing of multichannel IP devices. Designed for testing in the laboratory and in manufacturing NuStreams 2000 can be easily configured for Ethernet switch, router and gateway production testing. Call for demo.

GF303D-120 - All-in-one test systems Range of the current
source is 10 mA to 120 A
Range of the voltage
source is 10 V to 500 V
Supplied via test voltage
with protective earth conductor or mains voltage
For direct current measure-
ment up to 500 V / 120 A

GF302D-120 - Portable three phase test system with integrated current and voltage source Control of Switching Operations
With the help of vector diagrams the correct wiring in meter installations is ensured. Errors in the wiring are the most frequently occuring errors and can result in high financial losses at the carriers side.
Functions
Vector diagram display of quantities
Power and energy measurement of active, reactive and apparent energy
Frequency-, phase angle- and power factor measurement
Rotary field display
Network analysis
Network analysis is for testing the net quality. Interfering sources e. g. can necessitate an extension of the net or lead to wrong measurements.
Functions
Distortion factor measurement
Waveform sampling
Harmonic waveform analysis for voltage and current up to the 40th THD
Selective power measurement
Error measurement under defined load
With the error measurement the measuring mechanism is tested on correct functioning.
Functions
Testing of electricity meter installations with 2-wire, 3-wire and 4-wire circuits
4 quadrant measurement
Register measurement under defined load
With the register measurement the meter's register are tested on correct functioning.
Functions
Testing of energy and power registers
Current and voltage generation
Functions
Free programmable load point setting for current and voltage
Programmable phase shifting from
0 to 360°
Programmable frequency
Programming of balanced and unbalanced load points
Energy dosage

TYPE PDME-200 - Microwave Landing System / DME P/N Interrogator and Transponder Test Set The PDME-200 is a new-generation Test Set that provides basic to full capability testing utilizing building-block techniques without compromising accuracy or reliability. This allows a customer to purchase a Test Set to their exact requirements while staying within their budget. The basic Test Set acts a Transponder simulator and Interrogator tester with multipath capability. The addition of the three o

Test System Interface Probes ECT is your source for interface probes for all major brands of test systems, including Teradyne, GenRad and Hewlett-Packard. In fact, two of these companies specify ECT probes as original equipment.

KDX 1000 - Automated Test System The KD Optics KDX1000 modular test system is intended for use both as a laboratory instrument and as production test equipment. The unit features a mainframe with power meter controller with capacity for multimode, singlemode and visible light sources. When used as a production test system, the test software allows full automation, giving the operator a totally hand-free test environment, with the test sequence and results stored in an Access database.

TSI-5320-1 - Optical Test System SONET/SDH Optical Test System

SERIES 3650 - Primary Cell Test System The multifunction SERIES 3650 primary cell test system has been engineered to meet the growing demands of existing and upcoming ANSI and IEC tests. Each test position: Operates independently of the other positions; Can be user programmed to run a wide range of multi step tests, including pulse tests; Can be user programmed to operate in steps of fixed current, fixed power, fixed voltage, fixed resistance; Has a dynamic range to ANSI and IEC standards of current|power|resistance of over 25,000 to 1. The Series 3650 is supplied as a complete turnkey system with PC computer and software.

HAST 1000X - Highly Accelerated Stress Test Systems (HAST) Highly Accelerated Stress Test Systems (HAST) The Hast 1000X and 6000X pressurized humidity test systems offer a fast and cost effective alternative to conventional 85/85 temperature and humidity testing for plastic encapsulated integrated circuits.

SX-18 - Endurance Test Systems Automated equipment to test switches, circuit breakers etc. which require mechanical operation coupled with electrical loading, micro processor controlled systems with complete digital instrumentation.

CKT1190 - Cable High-Voltage Test Systems The CKT1190 is a low cost, benchtop cable test system which is available up to 300 test points. The basic system includes 100 test points; expansion is available in 100 test point increments. Plug-in adapter modules interface the cable-under-test to the test electronics. These adapter modules are available from stock for the most common connector types; new modules can normally be made available in 2 - 3 weeks.

Motor Test System DTS-MT for Servomotors * Safety tests (HV, PE, etc.)
* Power tests (measurement of voltage, current, power)
* Physical tests (ke and emf, speed and rotation direction, structure-borne noise, etc.)
* Function tests (signal from position encoder, control of parameter, etc.)
* Customised solutions

Test System Development We supply turnkey equipment for the automation, computer-aided inspection, testing and handling of components and devices. Products on offer range from inspection equipment for development and prototype construction, through continuous testing stands, and up to production-integrated inspection systems used in manufacturing and assembly.

LED Accelerate Life Test Real-time Monitor System Test in 3-cell constant temperature and humidity environment test chamber. 40 LED components can be tested in each cell. Total 120 LED components can be tested in three cells. 120 groups of burin-in current source (Max. 2A/ch). No waiting needed for environment chamber to cool down to remove materials inside. Can proceed real-time optical properties monitor test directly (VF, LOP, λp, λd, x,y, Tj..etc). Temperature range -10℃~100℃ Data of LED properties change collection and curves drawing. LED group life statistics. LED life estimation.

GM8030 - PLC Insertion Loss/PDL Test System GM803 PLC Insertion Loss/PDL test system is special design for 1X 8, 1 X 16, 1 X 32, 1X 64 PLC components

F1500 - Automatic Test system w/ Dynamic Resistance Oscilloscope Module 4 Wire (Kelvin) Continuity Resistance Measurement. Short Circuit Detection. Insulation Test Voltages up to 1500Vdc. Insulation Resistance Measurement up to 1000M?. AC Dielectric Hi-Pot test up to 1000Vac. Oscilloscope Module for Dynamic Resistance Measurement and Trace Analysis. (Developed for Slip Ring Testing ? but can be applied to any ?resistance over time? application.)

CKT2175-20 - Benchtop Wire Test System - Expanded The CKT2175-20 is a 250 VDC, high-speed wiring testing system that is capable of virtually unlimited test point expansion. The system features a very stable, fault tolerant design which eliminates the periodic requirement for calibration. As a matter of fact, the precise stimulus generator and measurement instruments have no internal calibration adjustments.

V93000 SOC - Test System for Digital, Precision Analog and RF Measurement The requirements of today's SOC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system.