Test

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  • HFS-410 Series - RF-Test Probes RF-Test Probes HFS-410 Series
    INGUN Prüfmittelbau
  • STI3000 - Wafer Probe Test System The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
    Solidus Technologies
  • Test System Interface Probes ECT is your source for interface probes for all major brands of test systems, including Teradyne, GenRad and Hewlett-Packard. In fact, two of these companies specify ECT probes as original equipment.
    Everett Charles Technologies
  • Flying Probe Test Ideal For Prototypes Flying probe test development is a cost effective method and technique for providing a methodology for prototype verification. Unlike ICT, no costly test fixtures are needed. This eliminates enormous cost programming time and allows design changes with simple test program changes.
    Nexlogic
  • MP21 - Test Probe Ideal for hipotting transformers, PCBs and other small assemblies. Four-finger-trigger must extend probe tip before the test can begin. The tester will shut down if the trigger is released
    Rod-L Electronics
  • 3910 - Test Probes Test Probes

    Model: 3910

    Features:
    • 2 mm probe,long version
    • Approx.137×10mm
    • Rated current 16A
    • Over voltage category CAT III/1000 V
    • Safety test probe with 4 mm safety socket and 2 mm stainless steel probe complying with IEC 61010,EN61010, DIN VDE 0411

    Available cable colours: red,black,blove,bice


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • Condor MTS500 - Flying Probe Test System The faster probing speed results in improved testing throughput without compromising probing accuracy and repeatability, or the high levels of test coverage made possible by targeting access points down to 75µm.
    Digitaltest GmbH
  • Series S200, S300, S400, and S500 - µHELIX® Test Probes Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
    AlphaTest
  • RITS520a - Flying probe Impedance Test System The RITS520a is equally at home testing impedance coupons, or controlled impedance test traces on PCBs or backplanes. The test table of the RITS520a can support coupon test fixtures for volume test of coupons or alternately accept PCBs up to 20" x 28"
    Polar Instruments
  • MTA20 - Set, Test Probes Test probes with tapered stainless steel tips. Use with MTA24 Test Leads.
    Snap-on
  • 3908 - Test Probes Test Probes

    Model: 3908

    Features:
    • 4 mm probe, short version
    • Approx.109×10mm
    • Rated current 16A
    • Over voltage category CAT III/1000 V
    • Safety test probewith 4 mm safety socket complying with IEC 61010, EN 61010,DIN VDE0411

    Available cable colours: red,black,blove,bice
    Shanghai Beihan Electronics
  • High-Current Test Probes High-Current Test Probes
    INGUN Prüfmittelbau
  • TLM10 - TEST PROBE SET contents: 4 crocodile clips / 4 x 4mm pins / 2 x 2mm pins / 2 forks. ratings: -. length: 90cm. remark: blister
    Velleman
  • 3907 - Test Probes Test Probes

    Model: 3907

    Features:

    • 2mm probe, short version
    • Approx. 102×10 mm
    • Rated current 16 A
    • Over voltage category CAT III/1000V
    • Safety test probe with 4 mm safety socket and 2 mm stainless steelprobe complying with IEC 61010, EN 61010, DIN VDE 0411

    Available cable colours:red,black,blove,bice
    Shanghai Beihan Electronics
  • TOP0 TOP1 - PCB Test Probes PCB test probes
    Chip Shine Electronics
  • UT-375-032 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • 50Mil test probe 50Mil test probe
    FUDA
  • UT-375-035 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • VersaCore - Parametric Test Probe Cards VersaCore™ is the industry's new price and performance leader for parametric test probe cards. The VersaCore™ provides a temperature range of -65°C to 200°C, and has two available core types for low leakage of <5fA/V and AttoFast™ settling to sub-1fA/V ultra high performance. This new ceramic probe technology delivers long lifetime and infinite rebuilds.
    Celadon Systems
  • Receptacle Test Probes Everett Charles Technologies-Contact Products Group has been a leader in the development of advanced test products since 1965. Our line of products includes signature PogoPlus® Contacts, loaded and bare board probes, battery interconnects, and semiconductor test products. ECT continues to expand the limits of test technology with innovative probe designs that deliver higher quality, longer life, and better performance.
    Everett Charles Technologies
  • HFS-840 Series - RF-Test Probes RF-Test Probes HFS-840 Series
    INGUN Prüfmittelbau
  • 3926 - Safety Clamp Test Probes Safety Clamp Test Probes

    Model: 3926

    Features:
    • Approx.160×49mm
    • Rated current 10A
    • Hook clamp with isulated shank
    • Over voltage category CATIII/1000 V
    • Safety clamp test probe with 4 mm safety socket complying with EN 61010,IEC61010, DIN VDE 0411

    Available cable colours: red,black


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • Loaded PCB Test Probes These probes, which include the new PogoPlus Series, address the unique demands of loaded board, vacuum fixture applications. Most feature an enhanced version of the legendary bias-ball design to virtually eliminate "false opens"; proprietary metal plating processes for higher conductivity; and precision MicroSharp steel tips for long-lasting durability. A full range of sizes accommodates products with mixed test center requirements.
    Everett Charles Technologies
  • Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".
    Interconnect Devices

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