Test

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  • HIGH CURRENT TEST PROBES HIGH CURRENT TEST PROBES
    Test-X Fixture Products
  • HFS-810 Series - RF-Test Probes RF-Test Probes HFS-810 Series
    INGUN Prüfmittelbau
  • COAXIAL TEST PROBES COAXIAL TEST PROBES
    Test-X Fixture Products
  • HFS-810M/840M Series - RF-Test Probes RF-Test Probes HFS-810M/840M Series
    INGUN Prüfmittelbau
  • 5325A - DMM Test Probe Kit w/ multi-stacking banana plug DMM test probe kit with multi-stacking banana plug
    Pomona Electronics
  • RITS520a - Flying probe Impedance Test System The RITS520a is equally at home testing impedance coupons, or controlled impedance test traces on PCBs or backplanes. The test table of the RITS520a can support coupon test fixtures for volume test of coupons or alternately accept PCBs up to 20" x 28"
    Polar Instruments
  • clamp-types test probes Measuring voltage quickly and easily – this is possible in a wide variety of situations with the units shown on the left. SKS can offer you the clamp-type test probe that you need even special solutions to enable access to difficult-to-access places. The flexible shaft allows you to connect to wires, pins and eyelets as well as to measuring clamps, and to the finest connections in the electronics field.
    Hirschmann Test &
  • MP21 - Test Probe Ideal for hipotting transformers, PCBs and other small assemblies. Four-finger-trigger must extend probe tip before the test can begin. The tester will shut down if the trigger is released
    Rod-L Electronics
  • HFS-860 Series - RF-Test Probes RF-Test Probes HFS-860 Series
    INGUN Prüfmittelbau
  • SERIES 33 - SMT & THRU HOLE LOADED BOARD TEST PROBES Electrical MAXIMUM CURRENT:3 amps continuous at working travel, non-inductive RESISTANCE: At 35 mA test current, 20 mOHMS mean Materials and Finishes PLUNGER: Heat treated beryllium copper, 24Kt gold plated over nickel BARREL: Nickel silver with precious metal clad ID. SPRING: Music wire, silver plated
    Test Connections
  • CALISAR - Test Bench Probe Calibration for SAR Measurements The CALISAR bench is dedicated to the probe calibration process for SAR measurements. It allows the assessment of the relation between the theoretical and effective E-field using an open-ended waveguide and measures the isotropy and linearity values of the probe.
    SATIMO
  • ProbeWoRx 300 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy. The ProbeWoRx system delivers reduced test times, higher accuracy and repeatability, and improved correlation for high pin-count, large array probe cards compared to traditional analyzers; and the ability to measure the increasing number of large and complex probe cards in "one-touch".
    Tamar Technology
  • Series 1004/E - ICT Test Probe 40 mil International standard for 40 mil applications Contacting of assembled PCBs
    PTR Messtechnik GmbH
  • SERIES 80 - THRU HOLE BARE AND LOADED BOARD TEST PROBES MAXIMUM CURRENT: 6 amps continuous at working travel, non-inductive RESISTANCE: At 35 mA test current, 35 mOHMS mean Materials and Finishes PLUNGER: Heat treated beryllium copper, 24 Kt gold plated over nickel BARREL: Nickel silver with 24 Kt gold plated ID and OD over nickel SPRING: (Standard) Beryllium copper, silver plated. (-1) Stainless steel, silver plated
    Test Connections
  • VEC-109 - 12.0 GHz RealProbe In-circuit Test Probe The ultimate in-circuit high Impedance Probe till 12GHz. The must tool for any In circuit RF and Microwave testing and troubleshooting.
    Vectria Ltd
  • UT-375-039 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • UT-375-014 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • STI3000 - Wafer Probe Test System The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
    Solidus Technologies
  • SERIES-70 - LOADED BOARD TEST PROBES Electrical MAXIMUM CURRENT: 5 amps continuous at working travel, non-inductive RESISTANCE: At 35mA test current 70 18 mOhms mean 73 60 mOhms mean 74 40 mOhms mean Materials and Finishes PLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC 70 24Kt gold plated over nickel 73 24Kt gold plated over nickel 74 Rhodium plated over nickel BARREL: Nickel silver 70 24Kt gold plated ID and OD over nickel 73 No Finish 74 24Kt gold plated ID and OD over nickel
    Test Connections
  • A7L - Flying Probe Test System The A7L is mainly dedicated for large back panels and server boards. The double-sided test system A7L has 16 test probes and eight high-resolution XGA color cameras for the optical scanning of PCBs. Using modern linear drives, the A7L achieves a test speed which was unimaginable five years ago. Despite high deceleration forces, the extremely torsion resistant and light carbon fiber axes allow precise positioning.
    Atg Luther & Maelzer
  • SPEA 4060 - Flying Probe Testing and Test Engineering Enhanced mechanical accuracy with closed loop motion control servodrive, (.012 um resolution) Dual sided probing simultaneously on both sides of the PCBA increases test coverage and reduces board handling Measurement electronics directly on axis to minimize transmission path length and reduce signal noise New DSP based In Circuit instrumentation with 16 bit resolution increases measurement resolution and reduces test execution time Faster probe movement with use of lighter alloy in X, Y, and Z axis Full integration with Goepel Boundary Scan tools New Leonardo software simplifies program development with automatic debug and program tuning Utilize up to 6 flying probes as JTAG drivers and sensors, extending boundary scan test coverage Create mixed signal tests utilizing boundary scan access on the UUT and analog test capabilities on flying probes; Shorten flying probe test time by utilizing boundary scan for digital short testing Optimize test coverage and test strategy by combining the industry's leading boundary scan and flying probe test systems
    Datest
  • SERIES 43 - SMT & THRU HOLE LOADED BOARD TEST PROBES Mechanical MINIMUM CENTERS: .075 (1.91) FULL TRAVEL: .250 (6.35) WORKING TRAVEL: .167 (4.24) OPERATING LIFE: 1,000,000 cycles Electrical MAXIMUM CURRENT: 3 amps continuous at working travel, non-inductive RESISTANCE: At 35 mA test current, 30 mOHMS mean Materials and Finishes PLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC, both 24Kt gold plated over nickel BARREL: Nickel silver with 24Kt gold plated ID and OD over nickel SPRING: Music wire, 24Kt gold plated over nickel
    Test Connections
  • TLM10 - TEST PROBE SET contents: 4 crocodile clips / 4 x 4mm pins / 2 x 2mm pins / 2 forks. ratings: -. length: 90cm. remark: blister
    Velleman
  • Series 3003 - Switching Test Probe Switching test probe center 125 mil - switching travel 0.65 mm.
    PTR Messtechnik GmbH

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Test - An activity in which a system, device, component or signal is executed under specified conditions, the results are observed or recorded, and an evaluation is made of some aspect of the tested element.


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