Test

Sponsor Your Catalog
  • STI3000 - Wafer Probe Test System The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
    Solidus Technologies
  • GRS500 - Flying Probe PCB Test and Repair System Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
    Polar Instruments
  • Compass 200 - Repair/Test Station for Epoxy-Type Probe Cards Compass CMP 200 is a build/repair station for epoxy cantilever probe cards. Expoxy type probe cards have: 1. High pin counts 2. Automated probilt testing 3. Competitive turn times
    Wentworth Laboratories
  • Unity Probe ™ - Multicontact probe for RFIC engineering test ascade Microtech's Unity multicontact probe streamlines RFIC engineering test. Leveraging common-sense, test-structure design rules, the build-to-order Unity Probe is a durable and scalable solution that is fast and easy to implement; saving you time, aggravation and money.
    Cascade Microtech
  • UT-375-023 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • Series 1012/G - 75 mil Test Probe Test probe with thread for center 75 mil
    PTR Messtechnik GmbH
  • ATE Test Probes For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
    Coda Systems Ltd
  • Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".
    IDI
  • General Purpose Test Probes
    Coda Systems Ltd
  • UT-375-016 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • ProbeWoRx 300 - Probe Card Test and Analysis The ProbeWoRx® System with fast 3D-OCM is the industry standard probe card production test and analysis system for large array, high pin-count cards. Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy.
    Rudolph Technologies
  • 3924 - Test Probes Test Probes

    Model: 3924

    Features:
    • Spring loaded version
    • Approx. 100×21 mm
    • Rated current 6A
    • Over voltage category CATIII/1000V
    • Safety test probe with spring-loaded probe,with 4 mm safety socket complying with IEC 61010, EN 61010, DINVDE0411

    Available cable colours:red,black,blove,bice


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • Probes For Test Systems Good probes are the primary factors for test systems and its fixtures. Therefore, Jet take the best quality material such as Beryllium copper to do the heat treatment and strengthen the stiffness and wear resistance of the probes to extend the life cycles. 
    Jet Technology Co
  • SERIES 80 - THRU HOLE BARE AND LOADED BOARD TEST PROBES MAXIMUM CURRENT: 6 amps continuous at working travel, non-inductive RESISTANCE: At 35 mA test current, 35 mOHMS mean Materials and Finishes PLUNGER: Heat treated beryllium copper, 24 Kt gold plated over nickel BARREL: Nickel silver with 24 Kt gold plated ID and OD over nickel SPRING: (Standard) Beryllium copper, silver plated. (-1) Stainless steel, silver plated
    Test Connections
  • TL743 - Slim Reach Test Probe Set Sharp point for piercing insulation
    Extech Instruments
  • 3923 - Test Probes Test Probes

    Model: 3923

    Features:
    • Approx.142×10mm
    • Rated current 6A
    • Over voltage category CAT III/1000 V
    • Safety test probe with 4 mm safety socket complying with IEC 61010, EN 61010, DIN VDE 0411

    Available cable colours: red,black, blove,bice


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • SERIES-70 - LOADED BOARD TEST PROBES Electrical MAXIMUM CURRENT: 5 amps continuous at working travel, non-inductive RESISTANCE: At 35mA test current 70 18 mOhms mean 73 60 mOhms mean 74 40 mOhms mean Materials and Finishes PLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC 70 24Kt gold plated over nickel 73 24Kt gold plated over nickel 74 Rhodium plated over nickel BARREL: Nickel silver 70 24Kt gold plated ID and OD over nickel 73 No Finish 74 24Kt gold plated ID and OD over nickel
    Test Connections
  • 100Mil test probe 100Mil test probe with three needles
    FUDA
  • ATP02-P - Armature Test Low Impedance Test Probe Armature test low impedance test probe
    SKF Condition Monitoring
  • 3907 - Test Probes Test Probes

    Model: 3907

    Features:

    • 2mm probe, short version
    • Approx. 102×10 mm
    • Rated current 16 A
    • Over voltage category CAT III/1000V
    • Safety test probe with 4 mm safety socket and 2 mm stainless steelprobe complying with IEC 61010, EN 61010, DIN VDE 0411

    Available cable colours:red,black,blove,bice
    Shanghai Beihan Electronics
  • UT-375-020 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • Specialist Test Probes High Current Test Probes, Ultra-high Current Test Probes,Kelvin Test Probes, High Frequency Test Probes, Switching Test Probes
    Coda Systems Ltd
  • BARE BOARD TEST PROBES Probe Technical Data Mechanical MINIMUM CENTERS: .100 (2.54) FULL TRAVEL: .160 (4.06) WORKING TRAVEL: .107 (2.72) OPERATING LIFE: 1,000,000 cycles Electrical MAXIMUM CURRENT: 5 amps continuous at working travel, non-inductive RESISTANCE: At 35 mA test current 60 18 mOHMS mean 63 60 mOHMS mean Materials and Finishes PLUNGER: Heat treated beryllium copper 60 24 Kt gold plated over nickel 63 24 Kt gold plated over nickel BARREL: Nickel silver 60 24 Kt gold plated ID and OD over nickel 63 No Finish SPRING: Music Wire, 24 Kt gold plated over nickel
    Test Connections
  • 5325A - DMM Test Probe Kit w/ multi-stacking banana plug DMM test probe kit with multi-stacking banana plug
    Pomona Electronics

Results 1 - 24 of 833

Test - An activity in which a system, device, component or signal is executed under specified conditions, the results are observed or recorded, and an evaluation is made of some aspect of the tested element.


Search Filters

  • Probes x

Manufacturers

View All (304)Hide List

Types

Features