MechanicalMINIMUM CENTERS: .075 (1.91)FULL TRAVEL: .250 (6.35)WORKING TRAVEL: .167 (4.24)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 3 amps continuous at working travel, non-inductiveRESISTANCE: At 35 mA test current,30 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC, both 24Kt gold plated over nickelBARREL: Nickel silver with 24Kt gold plated ID and OD over nickelSPRING: Music wire, 24Kt gold plated over nickel
Enhanced mechanical accuracy with closed loop motion control servodrive, (.012 um resolution)Dual sided probing simultaneously on both sides of the PCBA increases test coverage and reduces board handlingMeasurement electronics directly on axis to minimize transmission path length and reduce signal noiseNew DSP based In Circuit instrumentation with 16 bit resolution increases measurement resolution and reduces test execution timeFaster probe movement with use of lighter alloy in X, Y, and Z axisF...
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
The increasing speed at which semiconductor devices operate has driven the need for higher speed probing capabilities. One approach is to mechanically probe the device while it is mounted directly in a test head.
LUMETRON TF-Series Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safetyrequirements. One aspect of safety in electrical appliances is ensured if an accessible part is not live or a live part is not accessible (ACCESSIBLE PART =Conductive part that can be touched by human fingers). Checking whether a part is live or not is, therefore, necessary to ensure Safety. This test also allowsthe IP protection classes from IP1X to IP4X to b...
Flying probe test development is a cost effective method and technique for providing a methodology for prototype verification. Unlike ICT, no costly test fixtures are needed. This eliminates enormous cost programming time and allows design changes with simple test program changes.
ElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35mA test current70 18 mOhms mean73 60 mOhms mean74 40 mOhms meanMaterials and FinishesPLUNGER: Heat treated beryllium copperor steel hardened to 55-60RC70 24Kt gold plated over nickel73 24Kt gold plated over nickel74 Rhodium plated over nickelBARREL: Nickel silver70 24Kt gold plated ID and OD over nickel73 No Finish74 24Kt gold plated ID and OD over nickel
The ProbeWoRx® System with fast 3D-OCM is the industry standard probe card production test and analysis system for large array, high pin-count cards.Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy.
VersaCore™ is the industry's new price and performance leader for parametric test probe cards. The VersaCore™ provides a temperature range of -65°C to 200°C, and has two available core types for low leakage of <5fA/V and AttoFast™ settling to sub-1fA/V ultra high performance. This new ceramic probe technology delivers long lifetime and infinite rebuilds.
Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
Test - activity in which a system, device, component or signal is executed under specified conditions, the results are observed or recorded, and an evaluation is made of some aspect of the tested element.