Test

Sponsor Your Products
  • ProbeWoRx 300 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy. The ProbeWoRx system delivers reduced test times, higher accuracy and repeatability, and improved correlation for high pin-count, large array probe cards compared to traditional analyzers; and the ability to measure the increasing number of large and complex probe cards in "one-touch".
    Tamar Technology
  • Test probe and Receptacle Fixture with test probe
    FUDA
  • MTA20 - Set, Test Probes Test probes with tapered stainless steel tips. Use with MTA24 Test Leads.
    Snap-on
  • TF-24 Series - Accessibility Test Probes LUMETRON TF-Series Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements. One aspect of safety in electrical appliances is ensured if an accessible part is not live or a live part is not accessible (ACCESSIBLE PART = Conductive part that can be touched by human fingers). Checking whether a part is live or not is, therefore, necessary to ensure Safety. This test also allows the IP protection classes from IP1X to IP4X to be determined. Rigid Test Finger, Flexible Test Finger, Test Pin, Long Test Pin & Test Cone are different types of mechanical test probes that are normally employed to measure & check the accessibility of any conductive part. A control unit comprising audio & visual fault indicators is also used along with the probes to indicate access. The probes are precision machined and fabricated to maintain the accurate tolerances specific in the standards.
    Lumetronics
  • VEC-109EX - 18.0 GHz RealProbe In-circuit Test Probe The ultimate in-circuit high impedance probe till 18GHZ. Shorten your development cycles and accelerate your debugging process.
    Vectria Ltd
  • SR-PC - 1 Test Probe Test probe with 4 mm plug at one end and testing pin at other. Metal part is of brass, nickel plated. 3.8 mm wire is used length of wire is of 1 meter strands of wire 80. Set of red and black colour.
    Gaurang Auto Manufacturers
  • ProbeCommander Suite - Probe & Test Integration Software ProbeCommander Suite Probe & Test Integration Software. The Complete Application Package Needed To Fully Integrate Probe And Test on PWS Wafer Probe Systems. ProbeCommander can be used on any PWS Wafer Probe System, from engineering (desktop) to production. The ProbeCommander Suite provides features that support a wide variety of wafer types, probing environments, and test interfaces.
    Pacific Western Systems
  • Probes For Test Systems Good probes are the primary factors for test systems and its fixtures. Therefore, Jet take the best quality material such as Beryllium copper to do the heat treatment and strengthen the stiffness and wear resistance of the probes to extend the life cycles. 
    Jet Technology Co
  • UT-375-023 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • UT-375-014 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • 3932 - 2mm Test Probes 2mm Test Probes

    Model: 3932

    Features:
    • 2 mm probe with 2 mm socket system
    • Suitable for all voltage tester and multimeter test probes
    • Approx.86×7.5 mm
    • Max. voltage 50V AC/75V DC

    Available colours: red,black


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • Test probe Test probe with 9points
    FUDA
  • Series S200, S300, S400, and S500 - µHELIX® Test Probes Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
    AlphaTest
  • Compass 200 - Repair/Test Station for Epoxy-Type Probe Cards Compass CMP 200 is a build/repair station for epoxy cantilever probe cards. Expoxy type probe cards have: 1. High pin counts 2. Automated probilt testing 3. Competitive turn times
    Wentworth Laboratories
  • Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".
    Interconnect Devices
  • I-Stop - Reverse Test Probe The I-Stop Reverse Test Probe is a test accessory designed for use with most signal level meters and with the Trilithic 9580 Return Maintenance System. Screw the probe into a distribution tap's unused KS port and a spring-loaded "stinger" connects a 20 dB resistive test point circuit to the hardline.
    Trilithic
  • HFS-819 Series - RF-Test Probes RF-Test Probes HFS-819 Series
    INGUN Prüfmittelbau
  • ProbeWoRx 300 - Probe Card Test and Analysis The ProbeWoRx® System with fast 3D-OCM is the industry standard probe card production test and analysis system for large array, high pin-count cards. Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy.
    Rudolph Technologies
  • Loaded PCB Test Probes These probes, which include the new PogoPlus Series, address the unique demands of loaded board, vacuum fixture applications. Most feature an enhanced version of the legendary bias-ball design to virtually eliminate "false opens"; proprietary metal plating processes for higher conductivity; and precision MicroSharp steel tips for long-lasting durability. A full range of sizes accommodates products with mixed test center requirements.
    Everett Charles Technologies
  • 3925 - Safety Clamp Test Probes Safety Clamp Test Probes

    Model: 3925

    Features:
    • Approx.160×49mm
    • Rated current 10A
    • Wide opening grip claws with isolated shank
    • Over voltage category CATIII/1000 V
    • Safety clamp test probe with 4 mm safety socket complying with EN 61010,IEC61010, DIN VDE 0411

    Available cable colours: red,black


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • PILOT Line - Automatic Flying Probe Test Systems Pilot is the world's most versatile and complete line of automatic flying probe test systems, offering the widest range of solutions and performances for flying probe test of electronic boards on the market today. Models range from 2 to 8 test probes, accessing simultaneously one or both sides of the board, which can be positioned either horizontally or vertically.
    SEICA SpA
  • 75Mil test probe 75Mil test probe with different tips
    FUDA
  • 3933 - High Current Safety Clamp Test Probes High Current Safety Clamp Test Probes

    Model: 3933

    Features:
    • Approx.160×60mm
    • Rated current 10A
    • Over voltage category CATIII/1000 V
    • Reinforced spring wire clip with isolated shank
    • Safety clamp test probe with 4 mm safety socket complying with EN 61010, IEC 61010, DIN VDE 0411

    Available cable colours: red,black


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • THP100 - Test Head Probe System To enable analytical tests of fully functional devices, Cascade Microtech offers a truly portable probing platform that docks onto test heads from all leading vendors. This concept eliminates cabled interfaces between the probe system and the tester, making at-speed testing on a flexible analytical probe station possible.
    Cascade Microtech

Results 1 - 24 of 749

Test - An activity in which a system, device, component or signal is executed under specified conditions, the results are observed or recorded, and an evaluation is made of some aspect of the tested element.


Search Filters

  • Probes x

Manufacturers

View All (284)Hide List

Types

Features