Safety Clamp Test Probes Model: 3926 Features: • Approx.160×49mm • Rated current 10A • Hook clamp with isulated shank • Over voltage category CATIII/1000 V • Safety clamp test probe with 4 mm safety socket complying with EN 61010,IEC61010, DIN VDE 0411 Available cable colours: red,black MOQ. 100pcs
Good probes are the primary factors for test systems and its fixtures. Therefore, Jet take the best quality material such as Beryllium copper to do the heat treatment and strengthen the stiffness and wear resistance of the probes to extend the life cycles.
MechanicalMINIMUM CENTERS: .075 (1.91)FULL TRAVEL: .250 (6.35)WORKING TRAVEL: .167 (4.24)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 3 amps continuous at working travel, non-inductiveRESISTANCE: At 35 mA test current,30 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC, both 24Kt gold plated over nickelBARREL: Nickel silver with 24Kt gold plated ID and OD over nickelSPRING: Music wire, 24Kt gold plated over nickel
Enhanced mechanical accuracy with closed loop motion control servodrive, (.012 um resolution)Dual sided probing simultaneously on both sides of the PCBA increases test coverage and reduces board handlingMeasurement electronics directly on axis to minimize transmission path length and reduce signal noiseNew DSP based In Circuit instrumentation with 16 bit resolution increases measurement resolution and reduces test execution timeFaster probe movement with use of lighter alloy in X, Y, and Z axisF...
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
The increasing speed at which semiconductor devices operate has driven the need for higher speed probing capabilities. One approach is to mechanically probe the device while it is mounted directly in a test head.
LUMETRON TF-Series Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safetyrequirements. One aspect of safety in electrical appliances is ensured if an accessible part is not live or a live part is not accessible (ACCESSIBLE PART =Conductive part that can be touched by human fingers). Checking whether a part is live or not is, therefore, necessary to ensure Safety. This test also allowsthe IP protection classes from IP1X to IP4X to b...
Flying probe test development is a cost effective method and technique for providing a methodology for prototype verification. Unlike ICT, no costly test fixtures are needed. This eliminates enormous cost programming time and allows design changes with simple test program changes.
ElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35mA test current70 18 mOhms mean73 60 mOhms mean74 40 mOhms meanMaterials and FinishesPLUNGER: Heat treated beryllium copperor steel hardened to 55-60RC70 24Kt gold plated over nickel73 24Kt gold plated over nickel74 Rhodium plated over nickelBARREL: Nickel silver70 24Kt gold plated ID and OD over nickel73 No Finish74 24Kt gold plated ID and OD over nickel
Test Probes Model: 3908 Features: • 4 mm probe, short version • Approx.109×10mm • Rated current 16A • Over voltage category CAT III/1000 V • Safety test probewith 4 mm safety socket complying with IEC 61010, EN 61010,DIN VDE0411 Available cable colours: red,black,blove,bice
Test Probes Model: 3907 Features: • 2mm probe, short version • Approx. 102×10 mm • Rated current 16 A • Over voltage category CAT III/1000V • Safety test probe with 4 mm safety socket and 2 mm stainless steelprobe complying with IEC 61010, EN 61010, DIN VDE 0411 Available cable colours:red,black,blove,bice
Test - activity in which a system, device, component or signal is executed under specified conditions, the results are observed or recorded, and an evaluation is made of some aspect of the tested element.