HFS-810 Series - RF-Test Probes RF-Test Probes HFS-810 Series

PrecisionWoRx VX4 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Based on the industry-standard (PrecisionPoint), the PrecisionWoRx platform gives users the ability to confidently test tighter pitches and smaller probe tips.

HFS-860 Series - RF-Test Probes RF-Test Probes HFS-860 Series

SHORT STROKE TEST PROBES SHORT STROKE TEST PROBES

SPEA 4060 - Flying Probe Testing and Test Engineering Enhanced mechanical accuracy with closed loop motion control servodrive, (.012 um resolution) Dual sided probing simultaneously on both sides of the PCBA increases test coverage and reduces board handling Measurement electronics directly on axis to minimize transmission path length and reduce signal noise New DSP based In Circuit instrumentation with 16 bit resolution increases measurement resolution and reduces test execution time Faster probe movement with use of lighter alloy in X, Y, and Z axis Full integration with Goepel Boundary Scan tools New Leonardo software simplifies program development with automatic debug and program tuning Utilize up to 6 flying probes as JTAG drivers and sensors, extending boundary scan test coverage Create mixed signal tests utilizing boundary scan access on the UUT and analog test capabilities on flying probes; Shorten flying probe test time by utilizing boundary scan for digital short testing Optimize test coverage and test strategy by combining the industry's leading boundary scan and flying probe test systems

Test probe Test probe with 9points

ProbeCommander Suite - Probe & Test Integration Software ProbeCommander Suite Probe & Test Integration Software. The Complete Application Package Needed To Fully Integrate Probe And Test on PWS Wafer Probe Systems. ProbeCommander can be used on any PWS Wafer Probe System, from engineering (desktop) to production. The ProbeCommander Suite provides features that support a wide variety of wafer types, probing environments, and test interfaces.

A7L - Flying Probe Test System The A7L is mainly dedicated for large back panels and server boards. The double-sided test system A7L has 16 test probes and eight high-resolution XGA color cameras for the optical scanning of PCBs. Using modern linear drives, the A7L achieves a test speed which was unimaginable five years ago. Despite high deceleration forces, the extremely torsion resistant and light carbon fiber axes allow precise positioning.

UT-375-016 - Test Probe Universal Pin Test Probe Universal Pin

Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".

TF-24 Series - Accessibility Test Probes LUMETRON TF-Series Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements. One aspect of safety in electrical appliances is ensured if an accessible part is not live or a live part is not accessible (ACCESSIBLE PART = Conductive part that can be touched by human fingers). Checking whether a part is live or not is, therefore, necessary to ensure Safety. This test also allows the IP protection classes from IP1X to IP4X to be determined. Rigid Test Finger, Flexible Test Finger, Test Pin, Long Test Pin & Test Cone are different types of mechanical test probes that are normally employed to measure & check the accessibility of any conductive part. A control unit comprising audio & visual fault indicators is also used along with the probes to indicate access. The probes are precision machined and fabricated to maintain the accurate tolerances specific in the standards.

3907 - Test Probes Test Probes

Model: 3907

Features:

• 2mm probe, short version
• Approx. 102×10 mm
• Rated current 16 A
• Over voltage category CAT III/1000V
• Safety test probe with 4 mm safety socket and 2 mm stainless steelprobe complying with IEC 61010, EN 61010, DIN VDE 0411

Available cable colours:red,black,blove,bice

COAXIAL TEST PROBES COAXIAL TEST PROBES

GATS-3200 - Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test * Test individual packages or
* Test Multi-image panels with Step&Repeat Function
* single flying probe top using very high speed voice coil motor (VCM) technology
* 50 - 100 tests per second ... high throughput
* Dual Flying Probe Top for testing bump-to-bump nets
* flying probe head allows testing of all nets including each power and ground point
* 4-wire test capability

Compass 200 - Repair/Test Station for Epoxy-Type Probe Cards Compass CMP 200 is a build/repair station for epoxy cantilever probe cards. Expoxy type probe cards have: 1. High pin counts 2. Automated probilt testing 3. Competitive turn times

Condor MTS500 - Flying Probe Test System The faster probing speed results in improved testing throughput without compromising probing accuracy and repeatability, or the high levels of test coverage made possible by targeting access points down to 75µm.

3925 - Safety Clamp Test Probes Safety Clamp Test Probes

Model: 3925

Features:
• Approx.160×49mm
• Rated current 10A
• Wide opening grip claws with isolated shank
• Over voltage category CATIII/1000 V
• Safety clamp test probe with 4 mm safety socket complying with EN 61010,IEC61010, DIN VDE 0411

Available cable colours: red,black


MOQ. 100pcs

Spring Test Probes No matter how much you spend on test equipment the solution you rely on can never be better than the point of contact to your product which, in most cases, involves a spring contact probe. Through the links established for you by Cimbian UK you now have access to some of the finest German engineering in spring contact probes but with full local support.

UT-375-039 - Test Probe Universal Pin Test Probe Universal Pin

ProbeWoRx 300 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy. The ProbeWoRx system delivers reduced test times, higher accuracy and repeatability, and improved correlation for high pin-count, large array probe cards compared to traditional analyzers; and the ability to measure the increasing number of large and complex probe cards in "one-touch".

SFT S1-2016 - IT Test Probe Safequipment offers a wide range of probes to meet the most common standards including those from IEC, EN, UL, GB, and others. Such standards require the checking of accessibility to dangerous parts of home electronics and appliances, toys, tools, and a host of other products that are intended to be protected by enclosures. These probes simulate human fingers, tools, and other items that would be hazardous to come in contact with certain parts of products.

HFS-868 Series - RF-Test Probes RF-Test Probes HFS-868 Series

3910 - Test Probes Test Probes

Model: 3910

Features:
• 2 mm probe,long version
• Approx.137×10mm
• Rated current 16A
• Over voltage category CAT III/1000 V
• Safety test probe with 4 mm safety socket and 2 mm stainless steel probe complying with IEC 61010,EN61010, DIN VDE 0411

Available cable colours: red,black,blove,bice


MOQ. 100pcs