Test

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  • MTA20 - Set, Test Probes Test probes with tapered stainless steel tips. Use with MTA24 Test Leads.
    Snap-on
  • SPEA 4060 - Flying Probe Testing and Test Engineering Enhanced mechanical accuracy with closed loop motion control servodrive, (.012 um resolution) Dual sided probing simultaneously on both sides of the PCBA increases test coverage and reduces board handling Measurement electronics directly on axis to minimize transmission path length and reduce signal noise New DSP based In Circuit instrumentation with 16 bit resolution increases measurement resolution and reduces test execution time Faster probe movement with use of lighter alloy in X, Y, and Z axis Full integration with Goepel Boundary Scan tools New Leonardo software simplifies program development with automatic debug and program tuning Utilize up to 6 flying probes as JTAG drivers and sensors, extending boundary scan test coverage Create mixed signal tests utilizing boundary scan access on the UUT and analog test capabilities on flying probes; Shorten flying probe test time by utilizing boundary scan for digital short testing Optimize test coverage and test strategy by combining the industry's leading boundary scan and flying probe test systems
    Datest
  • 100Mil test probe 100Mil test probe with three needles
    FUDA
  • ATP02-C - Armature Test Low Impedance Test Probe and Clips Armature test low impedance test probe and clips
    SKF Condition Monitoring
  • Test probe Test probe with 9points
    FUDA
  • LOADED BOARD TEST PROBES AND RECEPTACLES LOADED BOARD TEST PROBES AND RECEPTACLES
    Test-X Fixture Products
  • 3907 - Test Probes Test Probes

    Model: 3907

    Features:

    • 2mm probe, short version
    • Approx. 102×10 mm
    • Rated current 16 A
    • Over voltage category CAT III/1000V
    • Safety test probe with 4 mm safety socket and 2 mm stainless steelprobe complying with IEC 61010, EN 61010, DIN VDE 0411

    Available cable colours:red,black,blove,bice
    Shanghai Beihan Electronics
  • STI3000 - Wafer Probe Test System The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
    Solidus Technologies
  • UT-375-020 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • ProbeWoRx 300 - Probe Card Test and Analysis High speed, high force, and high throughput for high pin-count, large array probe cards
    NanoPhotonics AG
  • 3911 - 4mm Test Probes Test Probes

    Model: 3911

    Features:
    • 4 mm probe,long version
    • Approx.142×10mm
    • Rated current 16A
    • Over voltage category CAT III/1000 V
    • Safety test probe with 4 mm safety socket complying with IEC 61010,EN61010, DIN VDE 0411

    Available cable colours: red,black, blove,bice


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • 3933 - High Current Safety Clamp Test Probes High Current Safety Clamp Test Probes

    Model: 3933

    Features:
    • Approx.160×60mm
    • Rated current 10A
    • Over voltage category CATIII/1000 V
    • Reinforced spring wire clip with isolated shank
    • Safety clamp test probe with 4 mm safety socket complying with EN 61010, IEC 61010, DIN VDE 0411

    Available cable colours: red,black


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • Flying Probe Test Programming & Testing Services ZDI has purchased a Seica Pilot flying probe tester in order to provide program development and test services to select customers in Silicon Valley and throughout North America.
    Zero Defects International
  • 3925 - Safety Clamp Test Probes Safety Clamp Test Probes

    Model: 3925

    Features:
    • Approx.160×49mm
    • Rated current 10A
    • Wide opening grip claws with isolated shank
    • Over voltage category CATIII/1000 V
    • Safety clamp test probe with 4 mm safety socket complying with EN 61010,IEC61010, DIN VDE 0411

    Available cable colours: red,black


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • 3932 - 2mm Test Probes 2mm Test Probes

    Model: 3932

    Features:
    • 2 mm probe with 2 mm socket system
    • Suitable for all voltage tester and multimeter test probes
    • Approx.86×7.5 mm
    • Max. voltage 50V AC/75V DC

    Available colours: red,black


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • I-Stop - Reverse Test Probe The I-Stop Reverse Test Probe is a test accessory designed for use with most signal level meters and with the Trilithic 9580 Return Maintenance System. Screw the probe into a distribution tap's unused KS port and a spring-loaded "stinger" connects a 20 dB resistive test point circuit to the hardline.
    Trilithic
  • 3910 - Test Probes Test Probes

    Model: 3910

    Features:
    • 2 mm probe,long version
    • Approx.137×10mm
    • Rated current 16A
    • Over voltage category CAT III/1000 V
    • Safety test probe with 4 mm safety socket and 2 mm stainless steel probe complying with IEC 61010,EN61010, DIN VDE 0411

    Available cable colours: red,black,blove,bice


    MOQ. 100pcs
    Shanghai Beihan Electronics
  • UT-375-023 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • RITS520a - Flying probe Impedance Test System The RITS520a is equally at home testing impedance coupons, or controlled impedance test traces on PCBs or backplanes. The test table of the RITS520a can support coupon test fixtures for volume test of coupons or alternately accept PCBs up to 20" x 28"
    Polar Instruments
  • UT-375-016 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • UT-375-039 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies
  • GATS-3200 - Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test * Test individual packages or
    * Test Multi-image panels with Step&Repeat Function
    * single flying probe top using very high speed voice coil motor (VCM) technology
    * 50 - 100 tests per second ... high throughput
    * Dual Flying Probe Top for testing bump-to-bump nets
    * flying probe head allows testing of all nets including each power and ground point
    * 4-wire test capability
    W.M. Hague Company
  • HIGH CURRENT TEST PROBES HIGH CURRENT TEST PROBES
    Test-X Fixture Products
  • UT-375-035 - Test Probe Universal Pin Test Probe Universal Pin
    Utron Technologies

Results 1 - 24 of 832

Test - An activity in which a system, device, component or signal is executed under specified conditions, the results are observed or recorded, and an evaluation is made of some aspect of the tested element.


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