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Showing results: 61 - 63 of 63 items found.

  • Speed Test

    Spectator™ Family - IneoQuest

    When it comes to video streaming, a simple speed test is not enough. Speed tests simply move large data objects from a server across a network to your device, and measure performance based on how long it took. But it will not tell you how well-distributed the transfer was. For today''''s streaming, performance consistency is critical to a high quality streaming experience. Spectator NOW measures actual streams for accurate results. Using your provided video URL, or one of the included test URLs, Spectator NOW identifies the video''''s available source bit rates (the rendition set), and graphically illustrates the current and average playback bit rate and rate shifts during the playback session. IneoQuest''''s patented VeriStream measurement and scoring technology delivers easily understood results. Spectator NOW also measures the streaming capacity of the connection, so you can learn if your network connection can support even higher quality, such as 4K/UHD or HD 1080p.

  • Programmable High Power DC Power Supply

    ADG series - Preen AC Power Corp.

    Preen’s ADG series is a programmable DC power supply with high power density and high output power, and offers many great advantages on response time, accuracy and output voltage range. ADG is an excellent source for testing or facility type applications, such as aerospace, renewable energy, automated test system, battery and server. With power level up to 80kW per unit, the ADG series provides output voltage up to 1000V and high output current of 2000A after custom modification.

  • Memory Test System

    T5833/T5833ES - Advantest Corp.

    T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.

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