Semiconductors

The B+K Precision model 520C Transistor Tester is designed for in circuit and out of circuit transistor testing with special features for making additional tests on devices out of circuit. The instrument is designed for a minimum amount of control manipulation, making for rapid testing of most devices. Determines good or bad transistors, FET's, SCR ...more

Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Map ...more

Micro was designed for thermal analysis on objects and features with micron size dimensions for semiconductor die thermal analysis and fiber optic thermal analysis. The InfraSight Mi thermal imaging camera provides high resolution and accuracy while capturing images at 30 images per second. The micrometer focusing stage provides exact camera p ...more

The Model 2430 1kW Pulse SourceMeter offers the same DC source and measurement ranges as the Model 2425 100W SourceMeter, plus a unique 1kW pulse mode that extends the upper current limit to 10A. This mode makes the Model 2430 ideal for measuring the breakdown voltage of many types of high-power devices, including multi-layer varistors (MLVs) ...more

Semiconductor Probes with .030 centers and 50 mOhms contact resistance, insertion loss 6.3 GHz @ -1dB ...more

Our four point probes measure the sheet resistance / resistivity / thickness of a wide variety of materials including group-IV semiconductors, metals, and compound semiconductors, as well as new materials found in flat panel displays and hard disks. We offer a wide range of models, options, and probe heads to suit your materials', measurement, and ...more

The Bird Model 4421 is a precision RF power meter that, while originally intended for general purpose laboratory applications where high accuracy is required, has found wide acceptance in semiconductor processing applications.  ...more

The electronics world today is marked by the move to higher density semiconductors on the 64 and 256 M order as well as bigger and higher resolution LCDs. For manufacturing, plasma processes are required to rapidly reproduce continually larger quantities of higher grade plasma, meaning processes need to ensure more sophisticated soft-damage co ...more

The ITC5730 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices. Included in the mainframe are all test equipment and software necessary to analyze and perform ...more

WaferSense ALS, a wireless, precision instrument can be handled the same as a wafer to easily capture the inclination of semiconductor process equipment that was previously out of reach. ALS reduces setup and PM downtime by delivering accurate, real-time measurements. Plus, logging data may reveal opportunities to improve equipment yield. ...more

AWG5000 Series models, with a 14 bits DA converter based sample rate from 600 MS/s to 1.2 GS/s, two to four output channels, synchronized four to eight digital marker outputs, and 28-channels of digital data outputs, easily solve the toughest measurement challenges in wireless base band I/Q communications, digital consumer product design such as im ...more

The TCAD Studio Process & Device Simulator is a fully featured semiconductor process and device modelling tool suite for the Microsoft® Windows® platform. With TCAD Studio you can create complex device geometries in minutes and build sophisticated circuit models with the minimum of effort in a powerful, yet easy to use TCAD environment. ...more

Quick contamination inspection for semiconductor processes. Accepts 300 mm (12"), 200 mm (8") and 150 mm (6"). Effective inspection of process contamination at various stages, cleaning, film deposition, exposure, etching, etc. ...more

The CL-2400 is designed for measurements on conductors, such as aluminum discs, and semiconductors, such as silicon wafers. Thickness is measured as the material under measurement passes through the gap formed between two opposing gap sensors. The CL-2400 can be used for static or running thickness measurements. ...more

As thin film technology advances, semiconductor and hard disk manufacturers increasingly recognize the need for X-ray fluorescence (XRF) analysis. PANalytical's Semyos energy-dispersive XRF wafer analyzer can play a vital role. ...more

Probe holder, For package and interconnect, MSI integrated circuit, microwave semiconductor, hybrid, and electro-optic device probing applications. W= Base X= Arm Length & Wafer diameter, Y= Position, Z= Position w/ respect to operator facing station. ...more

EMS61000-2L Sensitive Type ESD Generator is specially designed according to the characteristics and requirements of ESD measurement for sensitive semiconductors as LED, IC and transistor, electric PCB, electrical devices etc. and meets the standard requirement of MIL, GJB, ANSI. ...more

ATLAS enables device technology engineers to simulate the electrical, optical, and thermal behavior of semiconductor devices. ATLAS provides a physics-based, easy to use, modular, and extensible platform to analyze DC, AC, and time domain responses for all semiconductor based technologies in 2 and 3 dimensions. ...more

By the adoption of the diffuse type semiconductor transducer, it has the fullest trust & the long life. With the Bourdon's tube, the pointer used to blow for a use where the original pressure fluctuation is extreme, but with PE series there will be no problem. ...more

A red semiconductor laser is used as the emitting device and CCD is used as the receiving device. An ideally parallel optical beam is emitted enabling high accuracy measurement ...more

The MicroLine series of non-contact critical dimensional measurement systems are ideal for semiconductor and MEMS applications. MicroLine systems automatically measure linewidth, overlay, and other critical features on wafers and photomasks. Systems are capable of measuring features from 0.5 µm to 400 µm in size. Measurement repeatability is 10 nm ...more

Alacron introduces the FastFrame1303. Available in both analog/digital and digital-only configurations for greater flexibility and cost savings, FastFrame1303 uses the Nexperia (formerly TriMedia) PNX1302 microprocessor from Philips Semiconductors ...more

Semiconductor Probes with .039 centers and 50 mOhms contact resistance, insertion loss 2.9 GHz @ -1dB ...more

Polycold's leading edge technologies are found in applications across a broad range of markets - from semiconductors, optical networking, flat panel displays, detector cooling for aerospace, telescopic, and laboratory requirements, to web coating, decorative coating, and ophthalmic coating. ...more

Outstanding accuracy, stability and repeatability are the hallmarks of the Accumeasure System 9000, a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. Fast response time and extremely low noise levels make it ideal for critical measurements of targets suc ...more