Semiconductors

Micro was designed for thermal analysis on objects and features with micron size dimensions for semiconductor die thermal analysis and fiber optic thermal analysis. The InfraSight Mi thermal imaging camera provides high resolution and accuracy while capturing images at 30 images per second. The micrometer focusing stage provides exact camera p ...more

The B+K Precision model 520C Transistor Tester is designed for in circuit and out of circuit transistor testing with special features for making additional tests on devices out of circuit. The instrument is designed for a minimum amount of control manipulation, making for rapid testing of most devices. Determines good or bad transistors, FET's ...more

Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Map ...more

The Model 4200-PG2 dual-channel pulse generator is an option for the Model 4200-SCS semiconductor characterization system. This pulse generator produces voltage pulses as short as 10ns in high speed mode or up to $177;20V (into 50O) in high voltage mode. Two pulse generators on one card provides you with the flexibility to apply pulses to two ...more

The Model 2430 1kW Pulse SourceMeter offers the same DC source and measurement ranges as the Model 2425 100W SourceMeter, plus a unique 1kW pulse mode that extends the upper current limit to 10A. This mode makes the Model 2430 ideal for measuring the breakdown voltage of many types of high-power devices, including multi-layer varistors (MLVs) ...more

A complete device characterization process frequently includes the etching and delayering of semiconductors to perform construction analysis and/or failure analysis. ...more

Berkeley Process Control offers system-, subsystem- and component-level products to semiconductor industry toolmakers. Robust designs combined with advanced capabilities such as Autocalibration® technology, make these best-of-class products. ...more

Semiconductor Probes with .050 centers and 50 mOhms contact resistance, insertion loss consult factory. ...more

The Bird Model 4421 is a precision RF power meter that, while originally intended for general purpose laboratory applications where high accuracy is required, has found wide acceptance in semiconductor processing applications.  ...more

The Bird Model 4421 is a precision RF power meter that, while originally intended for general purpose laboratory applications where high accuracy is required, has found wide acceptance in semiconductor processing applications.  ...more

The CSA8200 and TDS8200 Sampling Oscilloscopes are comprehensive acquisition and measurement instruments for research, design evaluation, and manufacturing test in the fields of datacom and telecom components, transceiver subassemblies, and transmission systems, computer and storage based high speed electrical serial data, semiconductor test, ...more

Semiconductor Probes with .020 centers and 50 mOhms contact resistance, insertion loss 4.5 GHz @ -1dB ...more

The AeroTrak transport system is an overhead monorail system.  It is the most flexible wafer transport system available today. AeroTrak provides safe, reliable, and clean (below Class 1) automated transport for semiconductor WIP carriers and lithography reticles. ...more

Cascade Microtech?s industry standard 200 mm wafer probing systems are in use at virtually all leading semiconductor manufacturing and design sites worldwide. They have been designed to allow access the full measurement range of today?s most advanced test instrumentation. Whatever the application - device characterization, modeling, process de ...more

Alacron introduces the FastFrame-CB. Available in both analog, digital, and camera link configurations for greater flexibility and cost savings. The FastFrame-CB uses the Nexperia (formerly TriMedia) PNX1302 microprocessor from Philips Semiconductors. ...more

Probe holder, For package and interconnect, MSI integrated circuit, microwave semiconductor, hybrid, and electro-optic device probing applications. W= Base X= Arm Length & Wafer diameter, Y= Position, Z= Position w/ respect to operator facing station. ...more

Cascade Microtech?s 150mm (6 inch) probe stations provide the world?s leading semiconductor manufacturers access to, and extraction of essential information from the most complex wafers to solve the world?s toughest problems in advanced semiconductor design and development, thereby shrinking time to volume. Designed with exotic materials in mi ...more

This equipment is designed to acquire process, store, analyze and display image information from focused x-ray radiation. ...more

Together with the Analytical Services Group, our on-site sister organization, the IBM Microelectronics Test Solutions Center can provide complete analysis of semiconductor failure modes that utilize a large variety of diagnosis and analytical techniques. Combining Test with Failure Analysis capability puts a complete IC analysis team at your s ...more

By the adoption of the diffuse type semiconductor transducer, it has the fullest trust & the long life. With the Bourdon's tube, the pointer used to blow for a use where the original pressure fluctuation is extreme, but with PE series there will be no problem. ...more

A red semiconductor laser is used as the emitting device and CCD is used as the receiving device. An ideally parallel optical beam is emitted enabling high accuracy measurement ...more

The Digital LCR Meter, Model AX-222 offers easy measurement of contact resistance of electric components such as a coil, condenser, resistor, switch, relay etc., of inner resistance of a battery, of junction capacity of semiconductor and of any kind of elements. Determination display of [GO][NG] by digital comparator inclusion. Auto range and auto ...more

FCC Custom Communications, Inc. offers a family of Transverse Electromagnetic (TEM) cells that can be used for both emissions and immunity testing. Models FCC-TEM-JM1 and FCC-TEM-JM2 are ideal for radiated emission testing of semiconductor devices according to SAE 1752/3. Both the FCC-TEM-JM1 and FCC-TEM-JM2 can be used for immunity testing. ...more

WaferSense ALS, a wireless, precision instrument can be handled the same as a wafer to easily capture the inclination of semiconductor process equipment that was previously out of reach. ALS reduces setup and PM downtime by delivering accurate, real-time measurements. Plus, logging data may reveal opportunities to improve equipment yield. ...more

Semiconductor Probes with .039 centers and 50 mOhms contact resistance, insertion loss 2.0 GHz @ -1dB ...more