Semiconductors

Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Map ...more

The B+K Precision model 520C Transistor Tester is designed for in circuit and out of circuit transistor testing with special features for making additional tests on devices out of circuit. The instrument is designed for a minimum amount of control manipulation, making for rapid testing of most devices. Determines good or bad transistors, FET's, SCR ...more

The Model 2430 1kW Pulse SourceMeter offers the same DC source and measurement ranges as the Model 2425 100W SourceMeter, plus a unique 1kW pulse mode that extends the upper current limit to 10A. This mode makes the Model 2430 ideal for measuring the breakdown voltage of many types of high-power devices, including multi-layer varistors (MLVs) ...more

Automation Technology?s new taping machines, models BT-150 and BT-200, meet Class 100 clean-room requirements of preparing semiconductor wafer shipping boxes.  ...more

The 4232 is designed to safely analyze floating signals. The built in amplifier scales and converts the high voltage differential input to a low, voltage single-ended BNC output, compatible with any oscilloscope. The inputs are useful in measurements of power semiconductor circuits, robotic drives, NC machines and the latest switching circuits ...more

Accurate and non-destructive production testing of ac Isolation Voltage and Partial Discharge. With over 450 systems installed worldwide the 946X series of test systems are the standard and system of choice used by the majority of semiconductor manufacturers that produce optically isolated devices. ...more

The Digital LCR Meter, Model AX-222 offers easy measurement of contact resistance of electric components such as a coil, condenser, resistor, switch, relay etc., of inner resistance of a battery, of junction capacity of semiconductor and of any kind of elements. Determination display of [GO][NG] by digital comparator inclusion. Auto range and auto ...more

The MHF-D100LR-IR light source is based on our standard 100W Halogen light source. This light source is effective not only for Si, but also for compound semiconductors. It can be used for many applications such as wafer on wafer alignment, MEMs inspection, and void inspection. LM-100-IR 100W spare lamps for the MHF-D100LR-IR are also available. ...more

The MicroLine series of non-contact critical dimensional measurement systems are ideal for semiconductor and MEMS applications. MicroLine systems automatically measure linewidth, overlay, and other critical features on wafers and photomasks. Systems are capable of measuring features from 0.5 µm to 400 µm in size. Measurement repeatability is 10 nm ...more

The CTI-Cryogenics products are global leaders in cryogenic high-vacuum technology. CTI builds a broad array of cryopumps and cryopump systems designed to deliver exceptional performance, reliability and productivity. From our single cryopumps used in a spectrum of high-technology research applications to our sophisticated cryopump systems use ...more

The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level.  With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of to ...more

The Proforma 200SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 75 to 200 mm. wafers, the 200SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacita ...more

The WaferCheck 150 system is a complete and easy-to-use system for Time-resolved Photoluminescence (TRPL) measurements. TRPL is a very powerful tool for the contact free characterization and investigation of semiconductor materials. ...more

FastImage1303 is an Autonomous Imaging System (AIS) that offers a balanced architecture of flexible I/O and processing power with computational and memory bandwidth, typically required by demanding, real-time imaging, vision, and DSP applications. And FastImage1303 is based on the TriMedia TM1302 microprocessor from Philips Semiconductors. ...more

Examinator (the combination of EXAMINe + translATOR) is a software solution that enables test and product engineers to perform device characterization, production monitoring, and yield analysis studies from standard semiconductor data files such as STDF, Agilent GDF, e-Test (WAT and PCM), CSV, RosettaNet, etc. ...more

The Prior Scientific motorized Shuttle Stage is designed to be used with the Nikon and Olympus wafer loader systems for 3, 4, 6, and 8 inch wafers. The system greatly reduces operator fatigue while increasing inspection accuracy and repeatability.  ...more

ATLAS enables device technology engineers to simulate the electrical, optical, and thermal behavior of semiconductor devices. ATLAS provides a physics-based, easy to use, modular, and extensible platform to analyze DC, AC, and time domain responses for all semiconductor based technologies in 2 and 3 dimensions. ...more

Semiconductor Probes with .050 centers and 25 mOhms contact resistance, insertion loss 10 GHz @ -1dB ...more

* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including ea ...more

Perfluoropolyether (PFPE) is a lubricant widely used in many aerospace, vacuum, electronic and semiconductor applications due to its excellent chemical and tribological properties. It is typically used for friction reducing films on hard disks. In order to obtain a greater amount of functional PFPE, supercritical carbon dioxide extraction systems c ...more

The TCAD Studio Process & Device Simulator is a fully featured semiconductor process and device modelling tool suite for the Microsoft® Windows® platform. With TCAD Studio you can create complex device geometries in minutes and build sophisticated circuit models with the minimum of effort in a powerful, yet easy to use TCAD environment. ...more

Synopsys’ Odyssey™ product line consists of multiple components to satisfy the requirements of today’s modern semiconductor fabs. Odyssey Defect is a production-proven defect data management solution that is in use at over thirty manufacturing sites worldwide. With over ten years of developmental history, Odyssey Defect provides real-time lot dispo ...more

Semiconductor Probes with .039 centers and 50 mOhms contact resistance, insertion loss 4.75 GHz @ -1dB ...more

PTA's contactors (sockets for automation) are normally designed for your device package and your specific automated test environment. Contacting solutions for semiconductor final test. ...more

MicroTec is a widely recognized educational tool and is now used by more than 75 universities in 25 countries including University of California at Berkeley and Waseda University in Tokyo. The software is a perfect supplement to any book or a course on semiconductor devices or processes which enables students to create their own devices and test th ...more