Makers of the Model 5300 series of discrete a.t.e.'s featuring high speed datalog, intuitive PC programming, real-time math, statistics reports, and lot summaries. Test OPTOS thru MOSFETS and everything between.www.scitest.com
The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required. Under program control, the 201.net tests a growing number...
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy. The ProbeWoRx system delivers reduced test times, higher accuracy and repeatability, and improved correlation for high pin-count, large array probe cards compared to traditional analyzers; and the ability to measure the increasing number of large and complex probe cards in "one-touch".
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
Modular industry standard PXI and AXIe technology gives users control over their test system configurations and upgrade paths. The PXI and AXIe platforms provide a mature, stable foundation that will support the wide range of configurations and long term roadmaps required by the semiconductor industry.
T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
TSSI is comprised of industry experts with extensive ATE applications knowledge. Pattern Conversions from EDA* to ATE*. Pattern Validation: simulate EDA or ATE formats against design netlist (DUT model). Test Engineering Training. Test Program Conversions: retargeting from one ATE format to another. On-site Contract Application Engineer. EDA: WGL, STIL, VCD/EVCD, SVF, IJTAG, TSSI ASCII, 30+ older EDA formats, others.
HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB4-B is intended for reverse recovery testing of high-speed power rectifiers. The similar AVR-EB5-B is intended for more specialized reverse recovery testing of long-lifetime high-voltage PIN diodes, and the AVR-EB7-B is intended for low-current small-signal diodes.
Power tester UNISPOT DHP (Discrete High Power) is another representative of UNISPOT test platforms bringing the capability of IGBT testing to the world market. This system allows forcing current up to 1000 A and voltage up to 2500 V.
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
Aeroflex offers a full range of PXI/AXIe modules, integrated subsystems, and complete turnkey systems for semiconductor characterization and production test applications. Our semiconductor test product portfolio brings the price, performance, and flexibility benefits of PXI/AXIe to custom in house developed test solutions, legacy test system upgrades, and complete turnkey test systems.