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UNISPOT S40/S80 ACCEL - High Volume Discrete Semiconductor Tester UNISPOT S40/S80 ACCEL is a newly designed top-class speed test system for mass production of small-signal discrete semiconductors. It is a dedicated test platform for different areas of applications and a wide range of components to test. Unispot S40/S80 Accel is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
HS-PSTT - Semiconductor Large Range Type Tester HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
5300HX - Automated Discrete Semiconductor Tester (ATE) The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
Semiconductor, IC Test Software Development Integra's engineering group is available now for semiconductor test software development and test processing support. We manage the development, characterization and correlation of your test programs locally before taking advantage of the benefits of transferring your product to one of our contract test manufacturing facilities off-shore. This aids the customer by offering turnkey test software and hardware development services which help to decrease capital expenditure costs.
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
ProbeWoRx 300 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy. The ProbeWoRx system delivers reduced test times, higher accuracy and repeatability, and improved correlation for high pin-count, large array probe cards compared to traditional analyzers; and the ability to measure the increasing number of large and complex probe cards in "one-touch".
IST-8800 - Programmable Parametric Tester for Discrete Semiconductors The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".
Refurbished & Used Semiconductor Mfg / Test Equipment At JMC, we specialize in sales and service of ATE including a full line of products from most major manufacturers. JMC has an extensive inventory of semiconductor manufacturing and test equipment available to serve your capacity demands on time when you need them.
High Temperature Semiconductor Test Systems Computer control and power supply rack for high temperature reverse bias test system for large power semiconductors.
AX-Series - Semiconductor Test Systems Modular industry standard PXI and AXIe technology gives users control over their test system configurations and upgrade paths. The PXI and AXIe platforms provide a mature, stable foundation that will support the wide range of configurations and long term roadmaps required by the semiconductor industry.
UNISPOT DHP (Discrete High Power) - Power Semiconductor Tester Power tester UNISPOT DHP (Discrete High Power) is another representative of UNISPOT test platforms bringing the capability of IGBT testing to the world market. This system allows forcing current up to 1000 A and voltage up to 2500 V.
Semiconductor Electrical Testing Services We provide full test engineering development service, IC qualification, reliability analysis, tape & reel and technology transfer. Whether you need just one of our world-class services or full turnkey capability, Integra Technologies wants to be a partner in your success.
Semiconductor Test Engineering Services TSSI is comprised of industry experts with extensive ATE applications knowledge. Pattern Conversions from EDA* to ATE*. Pattern Validation: simulate EDA or ATE formats against design netlist (DUT model). Test Engineering Training. Test Program Conversions: retargeting from one ATE format to another. On-site Contract Application Engineer. EDA: WGL, STIL, VCD/EVCD, SVF, IJTAG, TSSI ASCII, 30+ older EDA formats, others.
Semiconductor Aging Testing Equipment The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
AVR-CD1-B - Semiconductor Test Pulser The AVR-CD1-B is a high performance, GPIB and RS232-equipped instrument intended for reverse recovery time testing of diodes and other semiconductor devices. The AVR-CD1-B will apply a 2 us wide forward bias pulse with an adjustable amplitude of +0.1A to +10A to a device under test (DUT). At the end of that pulse, the current ramps downward at an adjustable rate of 20 to 200 A/us until the diode stops conducting.
CONTACTLESS RESISTIVITY TESTER FOR SEMICONDUCTOR INGOTS The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.
YB4805/4830 - Digital Storage Semiconductor Graphic Testers Large LCD display, flexible keyboard control. Build in memory test curves can be stored and compared.
IST 8900 - DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device's lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
AVR-EBF6-B - Semiconductor Test Pulser The AVR-EBF6-B is intended for forward recovery tests of most diode types. The waveforms generated by this instrument are suitable for MIL-STD-750E Method 4026.3 tests.
Semiconductor Test tests regarding function, electrical and optoelectronical parameter
T3Ster® - Semiconductor Thermal Transient Tester T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
PrecisionWoRx VX4 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Based on the industry-standard (PrecisionPoint), the PrecisionWoRx platform gives users the ability to confidently test tighter pitches and smaller probe tips.
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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)
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