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5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
AX-Series - Semiconductor Test Systems Modular industry standard PXI and AXIe technology gives users control over their test system configurations and upgrade paths. The PXI and AXIe platforms provide a mature, stable foundation that will support the wide range of configurations and long term roadmaps required by the semiconductor industry.
SM-2299 - Discrete Semiconductor Tester SM-2299 is the tester which can quickly and accurately measure electrical characteristics of the transistor and the FET. The system controller (personal computer) can control up to eight testers. Combination with high-speed handlers and wafer probing machines build up rationalized configuration of the production lines.
Semiconductor Test Services Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
CONTACTLESS RESISTIVITY TESTER FOR SEMICONDUCTOR INGOTS The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.
Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".
SHR-1116 - 2D/3D Semiconductor Package Bump Testing System The SHR-1116 is a system that tests the height and quality of semiconductor package bumps by using state-of-the-art 2D/3D testing technology. The system can handle various types of testing of the entire semiconductor package, including bump height, volume and warpage, and achieves high-speed, high-accuracy testing. Nidec-Read offers products from ACERIS (Canada) to suit the specifications of each user.
PST 5000 - Power Semiconductor Tester Consolidated Electronics, Inc. manufactures and markets the PST 5000, a Power Semiconductor Tester, . It is specifically designed for saving down-time and component waste for users of power semiconductors found in many applications, such as rotation equipment, variable speed drives, solid state converters, etc. Power semiconductor failure can shut down industrial operations, causing extremely expensive downtime.
5300HX - Automated Discrete Semiconductor Tester (ATE) The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
IST-8800 - Programmable Parametric Tester for Discrete Semiconductors The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
AVR-EBF6-B - Semiconductor Test Pulser The AVR-EBF6-B is intended for forward recovery tests of most diode types. The waveforms generated by this instrument are suitable for MIL-STD-750E Method 4026.3 tests.
Test Services - Semiconductor Package Test Services * Front-end test development services and test consultation services * Wafer test, including testing of bumped wafers and known good die (KGD) solutions for assembly of stacked die into a single package * Final testing of simple and advanced packages using advanced test technology and automatic control of the test process that restricts yield losses to hard failures in the silicon itself * A full suite of optimized post test services for rapid delivery of the final products to the end customer
AVR-EB2A-B - Semiconductor Test Pulser The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB2A-B is intended for reverse recovery testing of high-speed low-current switching diodes. The current waveforms generated by these instruments are suitable for MIL-STD-750E Method 4031.4 Test Condition A tests. Avtech can also provide systems for Condition B and Condition D tests.
Power Semiconductor Accelerated Life Testing SEMTest is a configurable stress-screening system that performs accelerated lifetime testing of power semiconductors and modules incorporating IGBT, MOSFET, SCR, diode and bipolar parts. The system is ideal for both manufacturers and users of power semiconductors who want to qualify commercial off the shelf devices for use in high reliability applications found in automotive, transportation, aerospace, defense, industrial, and medical systems.
7BT - Discrete Semiconductor Tester The Impact 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
T3Ster® - Semiconductor Thermal Transient Tester T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
GATS-2100 - High Volume Semiconductor Substrate Interconnect Tester Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors. The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
AVR-CD1-B - Semiconductor Test Pulser The AVR-CD1-B is a high performance, GPIB and RS232-equipped instrument intended for reverse recovery time testing of diodes and other semiconductor devices. The AVR-CD1-B will apply a 2 us wide forward bias pulse with an adjustable amplitude of +0.1A to +10A to a device under test (DUT). At the end of that pulse, the current ramps downward at an adjustable rate of 20 to 200 A/us until the diode stops conducting.
yieldWerx - Semiconductor Test & Yield Management Solution Software yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.
YB4805/4830 - Digital Storage Semiconductor Graphic Testers Large LCD display, flexible keyboard control. Build in memory test curves can be stored and compared.
Semiconductor Test Equipment CREA's power semiconductor test systems are the today choice on the market to address any production power testing requirement.
Reliable equipment that allow all kind of power devices testing in a single run.
Reduced investment and maintenance cost compared to the competition.
Double Impact Semiconductor Tester Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos
Refurbished & Used Semiconductor Mfg / Test Equipment At JMC, we specialize in sales and service of ATE including a full line of products from most major manufacturers. JMC has an extensive inventory of semiconductor manufacturing and test equipment available to serve your capacity demands on time when you need them.
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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)
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