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5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
5300HX - Automated Discrete Semiconductor Tester (ATE) The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
GATS-3200 - Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test * Test individual packages or
* Test Multi-image panels with Step&Repeat Function
* single flying probe top using very high speed voice coil motor (VCM) technology
* 50 - 100 tests per second ... high throughput
* Dual Flying Probe Top for testing bump-to-bump nets
* flying probe head allows testing of all nets including each power and ground point
* 4-wire test capability
AX-Series - Semiconductor Test Systems Modular industry standard PXI and AXIe technology gives users control over their test system configurations and upgrade paths. The PXI and AXIe platforms provide a mature, stable foundation that will support the wide range of configurations and long term roadmaps required by the semiconductor industry.
T3Ster® - Semiconductor Thermal Transient Tester T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
PrecisionWoRx VX4 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Based on the industry-standard (PrecisionPoint), the PrecisionWoRx platform gives users the ability to confidently test tighter pitches and smaller probe tips.
PST 5000 - Power Semiconductor Tester Consolidated Electronics, Inc. manufactures and markets the PST 5000, a Power Semiconductor Tester, . It is specifically designed for saving down-time and component waste for users of power semiconductors found in many applications, such as rotation equipment, variable speed drives, solid state converters, etc. Power semiconductor failure can shut down industrial operations, causing extremely expensive downtime.
UNISPOT S40/S80 ACCEL - High Volume Discrete Semiconductor Tester UNISPOT S40/S80 ACCEL is a newly designed top-class speed test system for mass production of small-signal discrete semiconductors. It is a dedicated test platform for different areas of applications and a wide range of components to test. Unispot S40/S80 Accel is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
Semiconductor Aging Testing Equipment The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
Double Impact Semiconductor Tester Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos
yieldWerx - Semiconductor Test & Yield Management Solution Software yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.
CONTACTLESS RESISTIVITY TESTER FOR SEMICONDUCTOR INGOTS The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.
AVR-DV1-B - Semiconductor Test Pulser The AVR-DV1-B is ideal for testing the dV/dt ratings of phototriacs. The amplitude can be adjusted up to +/- 1000V, and the 1%-63.2% switching time can be varied between 125 ns and 1.1 us. At a typical test voltage of 400V, dV/dt of 2 kV/us can be obtained.
T-201 Tester - Compact Discrete Semiconductor Tester The OnTest Model T-201 is a compact small foot print, sophisticated Automatic Discrete Semiconductor Tester providing full functional electrical characteristics testing for a comprehensive range of Discrete Semiconductor Devices.
GATS-2100 - High Volume Semiconductor Substrate Interconnect Tester Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors. The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
Semiconductor, IC Test Software Development Integra's engineering group is available now for semiconductor test software development and test processing support. We manage the development, characterization and correlation of your test programs locally before taking advantage of the benefits of transferring your product to one of our contract test manufacturing facilities off-shore. This aids the customer by offering turnkey test software and hardware development services which help to decrease capital expenditure costs.
Test Services - Semiconductor Package Test Services * Front-end test development services and test consultation services * Wafer test, including testing of bumped wafers and known good die (KGD) solutions for assembly of stacked die into a single package * Final testing of simple and advanced packages using advanced test technology and automatic control of the test process that restricts yield losses to hard failures in the silicon itself * A full suite of optimized post test services for rapid delivery of the final products to the end customer
SHR-1116 - 2D/3D Semiconductor Package Bump Testing System The SHR-1116 is a system that tests the height and quality of semiconductor package bumps by using state-of-the-art 2D/3D testing technology. The system can handle various types of testing of the entire semiconductor package, including bump height, volume and warpage, and achieves high-speed, high-accuracy testing. Nidec-Read offers products from ACERIS (Canada) to suit the specifications of each user.
AVR-EB4-B - Semiconductor Test Pulser The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB4-B is intended for reverse recovery testing of high-speed power rectifiers. The similar AVR-EB5-B is intended for more specialized reverse recovery testing of long-lifetime high-voltage PIN diodes, and the AVR-EB7-B is intended for low-current small-signal diodes.
HS-PSTT - Semiconductor Large Range Type Tester HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
AVR-EB2A-B - Semiconductor Test Pulser The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB2A-B is intended for reverse recovery testing of high-speed low-current switching diodes. The current waveforms generated by these instruments are suitable for MIL-STD-750E Method 4031.4 Test Condition A tests. Avtech can also provide systems for Condition B and Condition D tests.
7BT - Discrete Semiconductor Tester The Impact 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
TRd, TRs, TRds - Power Semiconductor Tester The equipment is designed to test IGBTs, MOSFETs and free wheeling Diodes from single chip to complex power modules and IPMs.
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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)
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