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5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
7BT - Discrete Semiconductor Tester The Impact 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
Double Impact Semiconductor Tester Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos
SM-2007 - Discrete Semiconductor Tester SM-2007,SM-2299 is the tester which can quickly and accurately measure electrical characteristics of the transistor and the FET. The system controller (personal computer) can control up to eight testers. Combination with high-speed handlers and wafer probing machines build up rationalized configuration of the production lines. Programs will be operated by Windows XP·Vista
Semiconductor Aging Testing Equipment The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
Semiconductor Test Services Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
GATS-3200 - Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test * Test individual packages or
* Test Multi-image panels with Step&Repeat Function
* single flying probe top using very high speed voice coil motor (VCM) technology
* 50 - 100 tests per second ... high throughput
* Dual Flying Probe Top for testing bump-to-bump nets
* flying probe head allows testing of all nets including each power and ground point
* 4-wire test capability
PST 5000 - Power Semiconductor Tester Consolidated Electronics, Inc. manufactures and markets the PST 5000, a Power Semiconductor Tester, . It is specifically designed for saving down-time and component waste for users of power semiconductors found in many applications, such as rotation equipment, variable speed drives, solid state converters, etc. Power semiconductor failure can shut down industrial operations, causing extremely expensive downtime.
YB4805/4830 - Digital Storage Semiconductor Graphic Testers Large LCD display, flexible keyboard control. Build in memory test curves can be stored and compared.
Refurbished & Used Semiconductor Mfg / Test Equipment At JMC, we specialize in sales and service of ATE including a full line of products from most major manufacturers. JMC has an extensive inventory of semiconductor manufacturing and test equipment available to serve your capacity demands on time when you need them.
yieldWerx - Semiconductor Test & Yield Management Solution Software yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.
TRd, TRs, TRds - Power Semiconductor Tester The equipment is designed to test IGBTs, MOSFETs and free wheeling Diodes from single chip to complex power modules and IPMs.
T-201 Tester - Compact Discrete Semiconductor Tester The OnTest Model T-201 is a compact small foot print, sophisticated Automatic Discrete Semiconductor Tester providing full functional electrical characteristics testing for a comprehensive range of Discrete Semiconductor Devices.
AVR-D2 - Semiconductor Test Pulser The AVR-D2 series is specifically designed to perform MIL-S-19500 switching time tests, but it is also useful as a high-speed medium-voltage general-purpose laboratory pulse generator.
AVR-CD1-B - Semiconductor Test Pulser The AVR-CD1-B is a high performance, GPIB and RS232-equipped instrument intended for reverse recovery time testing of diodes and other semiconductor devices. The AVR-CD1-B will apply a 2 us wide forward bias pulse with an adjustable amplitude of +0.1A to +10A to a device under test (DUT). At the end of that pulse, the current ramps downward at an adjustable rate of 20 to 200 A/us until the diode stops conducting.
UNISPOT S40/S80 ACCEL - High Volume Discrete Semiconductor Tester UNISPOT S40/S80 ACCEL is a newly designed top-class speed test system for mass production of small-signal discrete semiconductors. It is a dedicated test platform for different areas of applications and a wide range of components to test. Unispot S40/S80 Accel is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
SM-2299 - Discrete Semiconductor Tester SM-2299 is the tester which can quickly and accurately measure electrical characteristics of the transistor and the FET. The system controller (personal computer) can control up to eight testers. Combination with high-speed handlers and wafer probing machines build up rationalized configuration of the production lines.
Power Semiconductor Accelerated Life Testing SEMTest is a configurable stress-screening system that performs accelerated lifetime testing of power semiconductors and modules incorporating IGBT, MOSFET, SCR, diode and bipolar parts. The system is ideal for both manufacturers and users of power semiconductors who want to qualify commercial off the shelf devices for use in high reliability applications found in automotive, transportation, aerospace, defense, industrial, and medical systems.
Semiconductor, IC Test Software Development Integra's engineering group is available now for semiconductor test software development and test processing support. We manage the development, characterization and correlation of your test programs locally before taking advantage of the benefits of transferring your product to one of our contract test manufacturing facilities off-shore. This aids the customer by offering turnkey test software and hardware development services which help to decrease capital expenditure costs.
Semiconductor Electrical Testing Services We provide full test engineering development service, IC qualification, reliability analysis, tape & reel and technology transfer. Whether you need just one of our world-class services or full turnkey capability, Integra Technologies wants to be a partner in your success.
GATS-2100 - High Volume Semiconductor Substrate Interconnect Tester Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors. The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
AVR-EB4-B - Semiconductor Test Pulser The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB4-B is intended for reverse recovery testing of high-speed power rectifiers. The similar AVR-EB5-B is intended for more specialized reverse recovery testing of long-lifetime high-voltage PIN diodes, and the AVR-EB7-B is intended for low-current small-signal diodes.
Test Services - Semiconductor Package Test Services * Front-end test development services and test consultation services * Wafer test, including testing of bumped wafers and known good die (KGD) solutions for assembly of stacked die into a single package * Final testing of simple and advanced packages using advanced test technology and automatic control of the test process that restricts yield losses to hard failures in the silicon itself * A full suite of optimized post test services for rapid delivery of the final products to the end customer
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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)
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