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5300HX - Automated Discrete Semiconductor Tester (ATE) The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
YB4805/4830 - Digital Storage Semiconductor Graphic Testers Large LCD display, flexible keyboard control. Build in memory test curves can be stored and compared.
Power Semiconductor Accelerated Life Testing SEMTest is a configurable stress-screening system that performs accelerated lifetime testing of power semiconductors and modules incorporating IGBT, MOSFET, SCR, diode and bipolar parts. The system is ideal for both manufacturers and users of power semiconductors who want to qualify commercial off the shelf devices for use in high reliability applications found in automotive, transportation, aerospace, defense, industrial, and medical systems.
GATS-2100 - High Volume Semiconductor Substrate Interconnect Tester Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors. The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
PrecisionWoRx VX4 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Based on the industry-standard (PrecisionPoint), the PrecisionWoRx platform gives users the ability to confidently test tighter pitches and smaller probe tips.
Semiconductor Electrical Testing Services We provide full test engineering development service, IC qualification, reliability analysis, tape & reel and technology transfer. Whether you need just one of our world-class services or full turnkey capability, Integra Technologies wants to be a partner in your success.
Semiconductor Test Services Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
T3Ster® - Semiconductor Thermal Transient Tester T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
Test Services - Semiconductor Package Test Services * Front-end test development services and test consultation services * Wafer test, including testing of bumped wafers and known good die (KGD) solutions for assembly of stacked die into a single package * Final testing of simple and advanced packages using advanced test technology and automatic control of the test process that restricts yield losses to hard failures in the silicon itself * A full suite of optimized post test services for rapid delivery of the final products to the end customer
Refurbished & Used Semiconductor Mfg / Test Equipment At JMC, we specialize in sales and service of ATE including a full line of products from most major manufacturers. JMC has an extensive inventory of semiconductor manufacturing and test equipment available to serve your capacity demands on time when you need them.
AX-Series - Semiconductor Test Systems Modular industry standard PXI and AXIe technology gives users control over their test system configurations and upgrade paths. The PXI and AXIe platforms provide a mature, stable foundation that will support the wide range of configurations and long term roadmaps required by the semiconductor industry.
IST 8900 - DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device's lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
AVR-D2 - Semiconductor Test Pulser The AVR-D2 series is specifically designed to perform MIL-S-19500 switching time tests, but it is also useful as a high-speed medium-voltage general-purpose laboratory pulse generator.
Semiconductor Test Equipment CREA's power semiconductor test systems are the today choice on the market to address any production power testing requirement.
Reliable equipment that allow all kind of power devices testing in a single run.
Reduced investment and maintenance cost compared to the competition.
Double Impact Semiconductor Tester Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos
UNISPOT DHP (Discrete High Power) - Power Semiconductor Tester Power tester UNISPOT DHP (Discrete High Power) is another representative of UNISPOT test platforms bringing the capability of IGBT testing to the world market. This system allows forcing current up to 1000 A and voltage up to 2500 V.
AVR-DV1-B - Semiconductor Test Pulser The AVR-DV1-B is ideal for testing the dV/dt ratings of phototriacs. The amplitude can be adjusted up to +/- 1000V, and the 1%-63.2% switching time can be varied between 125 ns and 1.1 us. At a typical test voltage of 400V, dV/dt of 2 kV/us can be obtained.
IST-8800 - Programmable Parametric Tester for Discrete Semiconductors The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
Semiconductor Aging Testing Equipment The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
Semiconductor, IC Test Software Development Integra's engineering group is available now for semiconductor test software development and test processing support. We manage the development, characterization and correlation of your test programs locally before taking advantage of the benefits of transferring your product to one of our contract test manufacturing facilities off-shore. This aids the customer by offering turnkey test software and hardware development services which help to decrease capital expenditure costs.
AVR-EBF6-B - Semiconductor Test Pulser The AVR-EBF6-B is intended for forward recovery tests of most diode types. The waveforms generated by this instrument are suitable for MIL-STD-750E Method 4026.3 tests.
Semiconductor Test tests regarding function, electrical and optoelectronical parameter
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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)
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