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5300HX - Automated Discrete Semiconductor Tester (ATE) The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
UNISPOT DHP (Discrete High Power) - Power Semiconductor Tester Power tester UNISPOT DHP (Discrete High Power) is another representative of UNISPOT test platforms bringing the capability of IGBT testing to the world market. This system allows forcing current up to 1000 A and voltage up to 2500 V.
GATS-2100 - High Volume Semiconductor Substrate Interconnect Tester Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors. The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
ProbeWoRx 300 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy. The ProbeWoRx system delivers reduced test times, higher accuracy and repeatability, and improved correlation for high pin-count, large array probe cards compared to traditional analyzers; and the ability to measure the increasing number of large and complex probe cards in "one-touch".
PrecisionWoRx VX4 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Based on the industry-standard (PrecisionPoint), the PrecisionWoRx platform gives users the ability to confidently test tighter pitches and smaller probe tips.
Semiconductor Electrical Testing Services We provide full test engineering development service, IC qualification, reliability analysis, tape & reel and technology transfer. Whether you need just one of our world-class services or full turnkey capability, Integra Technologies wants to be a partner in your success.
AVR-DV1-B - Semiconductor Test Pulser The AVR-DV1-B is ideal for testing the dV/dt ratings of phototriacs. The amplitude can be adjusted up to +/- 1000V, and the 1%-63.2% switching time can be varied between 125 ns and 1.1 us. At a typical test voltage of 400V, dV/dt of 2 kV/us can be obtained.
AVR-CD1-B - Semiconductor Test Pulser The AVR-CD1-B is a high performance, GPIB and RS232-equipped instrument intended for reverse recovery time testing of diodes and other semiconductor devices. The AVR-CD1-B will apply a 2 us wide forward bias pulse with an adjustable amplitude of +0.1A to +10A to a device under test (DUT). At the end of that pulse, the current ramps downward at an adjustable rate of 20 to 200 A/us until the diode stops conducting.
Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".
T-201 Tester - Compact Discrete Semiconductor Tester The OnTest Model T-201 is a compact small foot print, sophisticated Automatic Discrete Semiconductor Tester providing full functional electrical characteristics testing for a comprehensive range of Discrete Semiconductor Devices.
Semiconductor Test tests regarding function, electrical and optoelectronical parameter
IST 8900 - DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device's lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
Semiconductor Aging Testing Equipment The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
YB4805/4830 - Digital Storage Semiconductor Graphic Testers Large LCD display, flexible keyboard control. Build in memory test curves can be stored and compared.
CONTACTLESS RESISTIVITY TESTER FOR SEMICONDUCTOR INGOTS The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.
yieldWerx - Semiconductor Test & Yield Management Solution Software yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.
Semiconductor Test Services Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
AVR-EB4-B - Semiconductor Test Pulser The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB4-B is intended for reverse recovery testing of high-speed power rectifiers. The similar AVR-EB5-B is intended for more specialized reverse recovery testing of long-lifetime high-voltage PIN diodes, and the AVR-EB7-B is intended for low-current small-signal diodes.
Double Impact Semiconductor Tester Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos
Power Semiconductor Accelerated Life Testing SEMTest is a configurable stress-screening system that performs accelerated lifetime testing of power semiconductors and modules incorporating IGBT, MOSFET, SCR, diode and bipolar parts. The system is ideal for both manufacturers and users of power semiconductors who want to qualify commercial off the shelf devices for use in high reliability applications found in automotive, transportation, aerospace, defense, industrial, and medical systems.
T3Ster® - Semiconductor Thermal Transient Tester T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
SHR-1116 - 2D/3D Semiconductor Package Bump Testing System The SHR-1116 is a system that tests the height and quality of semiconductor package bumps by using state-of-the-art 2D/3D testing technology. The system can handle various types of testing of the entire semiconductor package, including bump height, volume and warpage, and achieves high-speed, high-accuracy testing. Nidec-Read offers products from ACERIS (Canada) to suit the specifications of each user.
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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)
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