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5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
5300HX - Automated Discrete Semiconductor Tester (ATE) The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
AX-Series - Semiconductor Test Systems Modular industry standard PXI and AXIe technology gives users control over their test system configurations and upgrade paths. The PXI and AXIe platforms provide a mature, stable foundation that will support the wide range of configurations and long term roadmaps required by the semiconductor industry.
T3Ster® - Semiconductor Thermal Transient Tester T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
AVR-D2 - Semiconductor Test Pulser The AVR-D2 series is specifically designed to perform MIL-S-19500 switching time tests, but it is also useful as a high-speed medium-voltage general-purpose laboratory pulse generator.
AVR-EBF6-B - Semiconductor Test Pulser The AVR-EBF6-B is intended for forward recovery tests of most diode types. The waveforms generated by this instrument are suitable for MIL-STD-750E Method 4026.3 tests.
Semiconductor Test tests regarding function, electrical and optoelectronical parameter
TRd, TRs, TRds - Power Semiconductor Tester The equipment is designed to test IGBTs, MOSFETs and free wheeling Diodes from single chip to complex power modules and IPMs.
GATS-2100 - High Volume Semiconductor Substrate Interconnect Tester Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors. The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
Semiconductor Aging Testing Equipment The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
Double Impact Semiconductor Tester Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos
AVR-EB4-B - Semiconductor Test Pulser The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB4-B is intended for reverse recovery testing of high-speed power rectifiers. The similar AVR-EB5-B is intended for more specialized reverse recovery testing of long-lifetime high-voltage PIN diodes, and the AVR-EB7-B is intended for low-current small-signal diodes.
T-201 Tester - Compact Discrete Semiconductor Tester The OnTest Model T-201 is a compact small foot print, sophisticated Automatic Discrete Semiconductor Tester providing full functional electrical characteristics testing for a comprehensive range of Discrete Semiconductor Devices.
7BT - Discrete Semiconductor Tester The Impact 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
AVR-DV1-B - Semiconductor Test Pulser The AVR-DV1-B is ideal for testing the dV/dt ratings of phototriacs. The amplitude can be adjusted up to +/- 1000V, and the 1%-63.2% switching time can be varied between 125 ns and 1.1 us. At a typical test voltage of 400V, dV/dt of 2 kV/us can be obtained.
UNISPOT S40/S80 ACCEL - High Volume Discrete Semiconductor Tester UNISPOT S40/S80 ACCEL is a newly designed top-class speed test system for mass production of small-signal discrete semiconductors. It is a dedicated test platform for different areas of applications and a wide range of components to test. Unispot S40/S80 Accel is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
Semiconductor Test Services Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
YB4805/4830 - Digital Storage Semiconductor Graphic Testers Large LCD display, flexible keyboard control. Build in memory test curves can be stored and compared.
IST-8800 - Programmable Parametric Tester for Discrete Semiconductors The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
ProbeWoRx 300 - For semiconductor manufacturers PROBE CARD TEST AND ANALYSIS Featuring "Hi-Speed 3-Dimensional Optical Comparative Metrology" at its core, this technology enables a breakthrough in overall system performance for both speed and accuracy. The ProbeWoRx system delivers reduced test times, higher accuracy and repeatability, and improved correlation for high pin-count, large array probe cards compared to traditional analyzers; and the ability to measure the increasing number of large and complex probe cards in "one-touch".
yieldWerx - Semiconductor Test & Yield Management Solution Software yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.
Semiconductor Test Probes IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".
Semiconductor Electrical Testing Services We provide full test engineering development service, IC qualification, reliability analysis, tape & reel and technology transfer. Whether you need just one of our world-class services or full turnkey capability, Integra Technologies wants to be a partner in your success.
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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)
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