Semiconductor Test

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  • 5000E - Automated Discrete Semiconductor Tester (ATE) Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
    Scientific Test
  • 201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.

    Under program control, the 201.net tests a growing number of devices including:
    * Diodes / Zeners
    * Bipolar Transistors
    * Field Effect Transistors
    * Arrays
    * MOSFET
    * MOSFET Depletion
    * Optocouplers
    * JFet / JFet NO
    * Mechanical Relays
    * Sidac
    * Triac / SCRs
    * IGBT
    SemiTek International
  • SHR-1116 - 2D/3D Semiconductor Package Bump Testing System The SHR-1116 is a system that tests the height and quality of semiconductor package bumps by using state-of-the-art 2D/3D testing technology. The system can handle various types of testing of the entire semiconductor package, including bump height, volume and warpage, and achieves high-speed, high-accuracy testing. Nidec-Read offers products from ACERIS (Canada) to suit the specifications of each user.
    Nidec-Read
  • GATS-2100 - High Volume Semiconductor Substrate Interconnect Tester Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors. The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
    W.M. Hague Company
  • IST 8900 - DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device's lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
    IST Information Scan
  • YB4805/4830 - Digital Storage Semiconductor Graphic Testers Large LCD display, flexible keyboard control. Build in memory test curves can be stored and compared.
    Sinometer Instruments
  • Semiconductor Test tests regarding function, electrical and optoelectronical parameter
    RoodMicrotec GmbH
  • T3Ster® - Semiconductor Thermal Transient Tester T3Ster® (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
    Mentor Graphics
  • PST 5000 - Power Semiconductor Tester Consolidated Electronics, Inc. manufactures and markets the PST 5000, a Power Semiconductor Tester, .  It is specifically designed for saving down-time and component waste for users of power semiconductors found in many applications, such as rotation equipment, variable speed drives, solid state converters, etc.  Power semiconductor failure can shut down industrial operations, causing extremely expensive downtime.
    CEI - Consolidated
  • CONTACTLESS RESISTIVITY TESTER FOR SEMICONDUCTOR INGOTS The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.
    Telecom-STV Company
  • Double Impact Semiconductor Tester Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos 
    Lorlin Test Systems
  • UNISPOT DHP (Discrete High Power) - Power Semiconductor Tester Power tester UNISPOT DHP (Discrete High Power) is another representative of UNISPOT test platforms bringing the capability of IGBT testing to the world market. This system allows forcing current up to 1000 A and voltage up to 2500 V.
    UNITES Systems A.s.
  • Semiconductor Aging Testing Equipment The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
    CHINO
  • SM-2299 - Discrete Semiconductor Tester SM-2299 is the tester which can quickly and accurately measure electrical characteristics of the transistor and the FET. The system controller (personal computer) can control up to eight testers. Combination with high-speed handlers and wafer probing machines build up rationalized configuration of the production lines. 
    Kokuyo Electric Co
  • Semiconductor Test Services Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
    RoodMicrotec GmbH
  • AVR-DV1-B - Semiconductor Test Pulser The AVR-DV1-B is ideal for testing the dV/dt ratings of phototriacs. The amplitude can be adjusted up to +/- 1000V, and the 1%-63.2% switching time can be varied between 125 ns and 1.1 us. At a typical test voltage of 400V, dV/dt of 2 kV/us can be obtained.
    Avtech Electrosystems
  • AVR-EBF6-B - Semiconductor Test Pulser The AVR-EBF6-B is intended for forward recovery tests of most diode types. The waveforms generated by this instrument are suitable for MIL-STD-750E Method 4026.3 tests.
    Avtech Electrosystems
  • T-201 Tester - Compact Discrete Semiconductor Tester The OnTest Model T-201 is a compact small foot print, sophisticated Automatic Discrete Semiconductor Tester providing full functional electrical characteristics testing for a comprehensive range of Discrete Semiconductor Devices.
    OnTest Systems
  • AX-Series - Semiconductor Test Systems Modular industry standard PXI and AXIe technology gives users control over their test system configurations and upgrade paths. The PXI and AXIe platforms provide a mature, stable foundation that will support the wide range of configurations and long term roadmaps required by the semiconductor industry.
    Aeroflex
  • HS-PSTT - Semiconductor Large Range Type Tester HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001~19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
    HenergySolar
  • TRd, TRs, TRds - Power Semiconductor Tester The equipment is designed to test IGBTs, MOSFETs and free wheeling Diodes from single chip to complex power modules and IPMs.
    LEMSYS
  • AVR-EB4-B - Semiconductor Test Pulser The AVR-EB series was designed for MIL-STD-750E diode switching time tests. The AVR-EB4-B is intended for reverse recovery testing of high-speed power rectifiers. The similar AVR-EB5-B is intended for more specialized reverse recovery testing of long-lifetime high-voltage PIN diodes, and the AVR-EB7-B is intended for low-current small-signal diodes.
    Avtech Electrosystems
  • IST-8800 - Programmable Parametric Tester for Discrete Semiconductors The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
    IST Information Scan
  • Refurbished & Used Semiconductor Mfg / Test Equipment At JMC, we specialize in sales and service of ATE including a full line of products from most major manufacturers. JMC has an extensive inventory of semiconductor manufacturing and test equipment available to serve your capacity demands on time when you need them.
    JMC Worldwide

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Semiconductor Test - ..test and check high power diodes, thyristors, IGBT's and other similar devices. (www.fastron.com.au)