Scanning Probe Microscopes
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SPM
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Scanning Probe Microscope system - Solver HV NT-MDT Co. Contact Info Send To Colleague Solver HV is intended for work in high vacuum conditions and controllable gas medium. Measuring modes: Contact AFM/ LFM/ ResonantMode (semicontact + noncontact AFM)/ Phase Imaging/ Force Modulation (viscoelastisity)/ MFM/ EFM/ Adhesion Force Imaging/Scanning Capacitance microscopy (SCM)/Scanning Kelvin probe microscopy(SKM)/Spreading Resistance Im ...more -
Q-Scope™ Series - SCANNING PROBE MICROSCOPES / ATOMIC FORCE MICROSCOPES (SPM/AFM) Ambios Technology, Inc. Contact Info Send To Colleague The Q-Scope™ family of Scanning Probe Microscope (SPM) features a totally modular design approach which delivers unmatched versatility and utility. Patented Isotopic Focal System™ permits 90 degree top-down view for easy alignment and positioning of the probe as well as tracking of cantilever/probe during scanning for increased sensitivity and eli ...more -
Scanning Probe Microscope system Solver P47-PRO NT-MDT Co. Contact Info Send To Colleague A universal tool for complex research of different objects with the highest resolution in air, liquid and controlled gas at the temperature up to 130°C. Measuring modes In air: STM/low current STM/STS/contact AFM/LFM/Resonant Mode(semicontact AFM+noncontact AFM)/Phase Imaging/Force Modulation/Spreading Resistance Imaging/MFM/EFM/SCM/SKM/Adhesion F ...more -
NTEGRA Solaris - Nearfield optical SPM system NT-MDT Co. Contact Info Send To Colleague Uses Scanning Near-Field Optical Microscopy (SNOM) to investigate optical properties beyond the conventional limits imposed by diffraction. NTEGRA Solaris combines three different microscopy techniques: light, scanning nearfield optical microscopy (SNOM), and atomic force microscopy (AFM). Integration at this advanced level creates enormous design ...more -
Scanning Probe Microscope system - SMENA NT-MDT Co. Contact Info Send To Colleague Stand Alone SMENA expands the scope of SPM to bring you innovative facilities for investigating samples with unlimited size in all available SPM measuring modes. Measuring modes - In air: Contact AFM/ LFM/ ResonantMode AFM (semicontact + noncontact)/ Phase Imaging/ Force Modulation (viscoelastisity)/ Adhesion Force Imaging/ Spreading Resistance I ...more -
Scanning Probe Microscope system Solver LS NT-MDT Co. Contact Info Send To Colleague Solver LS is a cutting-edge solution not only for scientific research, but also for production monitoring. With this sophisticated tool you can investigate and control samples (wafers) with the size up to 250mm (300mm optional) in diameter and 15mm thick. Measuring modes in air: Contact AFM / LFM / ResonantMode (semicontact AFM + noncontact AFM)/ ...more -
Scanning Probe Microscope system Solver P47H-PRO NT-MDT Co. Contact Info Send To Colleague The number of available measurement and influence methods and modes reaches several tens. Scanning-by-probe scheme allows characterization of samples with sizes up to 100x100x20 mm. Measuring modes - In air: STM/ STS/ Contact AFM/ LFM/Semicontact AFM/Noncontact AFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM ...more -
Q-Scope™ Universal SPM | Scanning Probe Microscope Ambios Technology, Inc. Contact Info Send To Colleague The USPM Model is a small sample scanning probe microscope that rasters the sample rather than the probe. The tight mechanical loop of this instrument allows the highest resolution data when imaging in either AFM or STM imaging modes. It is equipped with a built-in 250X video microscope. ...more -
CP-II SCANNING PROBE MICROSCOPE (SPM) Veeco Instruments Inc Contact Info Send To Colleague The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research. ...more -
MULTIMODE SCANNING PROBE MICROSCOPE (SPM) Veeco Instruments Inc Contact Info Send To Colleague It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. ...more -
Electrochemical SPM Scanning Probe Microscope Systems Veeco Instruments Inc Contact Info Send To Colleague Veeco offers several powerful electrochemical systems that provide researchers the spatial resolution, flexibility, and ease of use to study a wide range of real-time, in situ electrochemical processes. Each system is powered by the world-leading NanoScope controller and is available with a choice of different scanning probe microscope (SPM) platfo ...more -
Dimension V Scanning Probe Microscope (SPM) Veeco Instruments Inc Contact Info Send To Colleague The di Dimension V scanning probe microscope utilizes atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter. Its laser spot alignment system and the abil ...more -
Caliber SPM Veeco Instruments Inc Contact Info Send To Colleague The low-cost, high value Caliber scanning probe microscope (SPM) is the ideal entry level instrument for research or industrial labs. Our new Caliber "Mini-SPM" offers compact portability, an open-hardware architecture, closed-loop scanning, advanced software capabilities, and several image modes. It is able to perform a variety of SPM applications ...more -
DIMENSION 5000 - SCANNING PROBE MICROSCOPE (SPM) Veeco Instruments Inc Contact Info Send To Colleague The Dimension 5000 Scanning Probe Microscope (SPM) provides the ultimate in automated large-sample capability for semiconductor and data storage device manufacturers, measuring up to one hundred areas on samples up to 350 mm in diameter. With the entire range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques a ...more -
DIMENSION 3100 SCANNING PROBE MICROSCOPE (SPM) Veeco Instruments Inc Contact Info Send To Colleague The Dimension 3100 Scanning Probe Microscope (SPM) utilizes automated atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200 mm in diameter. Its laser spot alignme ...more -
Innova SPM Veeco Instruments Inc Contact Info Send To Colleague The Innova scanning probe microscope (SPM) delivers high-resolution scanning and a wide range of functionality for physical, materials, and life sciences, all at a much lower price than comparable systems. Innova scans from sub-micron levels up to 90 microns, with proprietary closed-loop scan-linearization that approaches open-loop levels, all with ...more
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Definition: Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu) Used to solve processing and materials problems in a wide range of technologies affecting the electronics, telecommunications, biological, chemical, automotive, aerospace, and energy industries. Used to image surfaces to study phenomena such as abrasion, adhesion, cleaning, corrosion, etching, friction, lubrication, plating, and polishing. The materials being investigating include thin and thick film coatings, ceramics, composites, glasses, synthetic and biological membranes, metals, polymers, and semiconductors. (www.che.utoledo.edu) |
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